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J. Appl. Cryst.
(2012).
45
,
1098-1108
,
https://doi.org/10.1107/S0021889812039519
Three-dimensional plastic response in polycrystalline copper
via
near-field high-energy X-ray diffraction microscopy
S. F. Li
,
J. Lind
,
C. M. Hefferan
,
R. Pokharel
,
U. Lienert
,
A. D. Rollett
and
R. M. Suter
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