R. P. Joosten,
J. Salzemann,
V. Bloch,
H. Stockinger,
A.-C. Berglund,
C. Blanchet,
E. Bongcam-Rudloff,
C. Combet,
A. L. Da Costa,
G. Deleage,
M. Diarena,
R. Fabbretti,
G. Fettahi,
V. Flegel,
A. Gisel,
V. Kasam,
T. Kervinen,
E. Korpelainen,
K. Mattila,
M. Pagni,
M. Reichstadt,
V. Breton,
I. J. Tickle and
G. Vriend The majority of previously deposited X-ray structures can be improved by applying current refinement methods.