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The application of a new technique for zeolite framework structure solution is described that exhaustively enumerates every possible topology consistent with known unit-cell dimensions and space-group symmetry. It is shown that computer-generated on-line databases of hypothetical crystal structures can radically augment structure building in the pre-refinement stage.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0021889805026038/zm5033sup1.cif
Contains datablock 191_6_558937s_gulpmin.cif

Computing details top

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
(191_6_558937s_gulpmin.cif) top
Crystal data top
?β = 90°
Mr = ?γ = 120°
?, P6/mmmV = ? Å3
a = 30.960745 ÅZ = ?
b = 30.960745 Å? radiation, λ = ? Å
c = 7.519782 Å × × mm
α = 90°
Data collection top
h = ??l = ??
k = ??
Refinement top
Crystal data top
?β = 90°
Mr = ?γ = 120°
?, P6/mmmV = ? Å3
a = 30.960745 ÅZ = ?
b = 30.960745 Å? radiation, λ = ? Å
c = 7.519782 Å × × mm
α = 90°
Data collection top
Refinement top
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzBiso*/Beq
Si10.2887670.0949910.297243
Si20.3879900.0955210.296462
Si30.4872020.1940510.296484
Si40.2096690.0554240.000000
Si50.4265760.0553800.000000
Si60.5263900.1543440.000000
O_11_10.2728290.0777530.500000
O_11_20.3057530.1528770.271933
O_12_10.3349980.0885140.239751
O_14_10.2419230.0609600.174245
O_22_10.3873850.0793430.500000
O_23_10.4293710.1532180.266997
O_25_10.3997550.0605260.174827
O_33_10.5033450.1943690.500000
O_33_20.4943890.2471940.240381
O_36_10.5219190.1815900.174854
O_44_10.1617070.0000000.000000
O_44_20.1906080.0953030.000000
O_55_10.4193710.0000000.000000
O_56_10.4850340.0958100.000000
O_66_10.5800500.1601000.000000

Experimental details

Crystal data
Chemical formula?
Mr?
Crystal system, space group?, P6/mmm
Temperature (K)?
a, b, c (Å)30.960745, 30.960745, 7.519782
α, β, γ (°)90, 90, 120
V3)?
Z?
Radiation type?, λ = ? Å
µ (mm1)?
Crystal size (mm) × ×
Data collection
Diffractometer?
Absorption correction?
No. of measured, independent and
observed (?) reflections
?, ?, ?
Rint?
Refinement
R[F2 > 2σ(F2)], wR(F2), S ?, ?, ?
No. of reflections?
No. of parameters?
No. of restraints?
Δρmax, Δρmin (e Å3)?, ?

 

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