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Semiquinone (p-benzosemiquinone), a transient organic radical, was detected in the solid state by EPR spectroscopy revealing four symmetrically equivalent protons. A variable-temperature X-ray diffraction analysis (293 and 90 K) and EPR data support a dynamical disorder of the proton. A low-barrier O—H···O hydrogen bond stabilizes the radical. The C—O bond length is 1.297 (4) Å, corresponding to a bond order of ca 1.5. The geometry of the radical implies an electron delocalization throughout the benzenoid ring. Two polymorphs of semiquinone, monoclinic and triclinic, were observed and their structures determined. Their crystal packings were compared with those of quinhydrone polymorphs.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768106038870/ws5041sup1.cif
Contains datablocks global, sqt90k, sqm293k, sqm90k, sqt293k

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768106038870/ws5041sqt90ksup2.hkl
Contains datablock pbf022

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768106038870/ws5041sqm293ksup3.hkl
Contains datablock new

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768106038870/ws5041sqm90ksup4.hkl
Contains datablock new

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768106038870/ws5041sqt293ksup5.hkl
Contains datablock pbf023

CCDC references: 629800; 629801; 629802; 629803

Comment top

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Experimental top

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Refinement top

(type here to add refinement details)

Computing details top

For all compounds, data collection: CAD-4 EXPRESS (Enraf Nonius, 1994); cell refinement: CAD-4 EXPRESS (Enraf Nonius, 1994); data reduction: XCAD4 (Harms & Wocadlo, 1995). Program(s) used to solve structure: SHELXS97 (Sheldrick, 1997) for sqt90k, sqm293k, sqt293k; SHELXS86 (Sheldrick, 1986) for sqm90k. For all compounds, program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997); software used to prepare material for publication: WinGX publication routines (Farrugia, 1999).

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
[Figure 7]
[Figure 8]
[Figure 9]
[Figure 10]
[Figure 11]
Figure 1. View of (I) (50% probability displacement ellipsoids)
(sqt90k) top
Crystal data top
C6H5O2Z = 1
Mr = 109.1F(000) = 51
Triclinic, P1Dx = 1.532 Mg m3
a = 3.7615 (6) ÅCu Kα radiation, λ = 1.54179 Å
b = 5.6996 (12) ÅCell parameters from 25 reflections
c = 5.9065 (8) Åθ = 8.3–30°
α = 110.800 (15)°µ = 0.97 mm1
β = 91.164 (12)°T = 90 K
γ = 91.443 (15)°Rod, red
V = 118.28 (4) Å30.29 × 0.14 × 0.1 mm
Data collection top
Enraf Nonius CAD4
diffractometer
θmax = 76.4°, θmin = 8.0°
non–profiled ω/2θ scansh = 44
1075 measured reflectionsk = 77
499 independent reflectionsl = 77
422 reflections with I > 2σ(I)3 standard reflections every 120 min
Rint = 0.056 intensity decay: 2%
Refinement top
Refinement on F2All H-atom parameters refined
Least-squares matrix: full w = 1/[σ2(Fo2) + (0.0482P)2 + 0.0384P]
where P = (Fo2 + 2Fc2)/3
R[F2 > 2σ(F2)] = 0.036(Δ/σ)max < 0.001
wR(F2) = 0.106Δρmax = 0.35 e Å3
S = 1.09Δρmin = 0.2 e Å3
499 reflectionsExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
50 parametersExtinction coefficient: 0.054 (15)
0 restraints
Crystal data top
C6H5O2γ = 91.443 (15)°
Mr = 109.1V = 118.28 (4) Å3
Triclinic, P1Z = 1
a = 3.7615 (6) ÅCu Kα radiation
b = 5.6996 (12) ŵ = 0.97 mm1
c = 5.9065 (8) ÅT = 90 K
α = 110.800 (15)°0.29 × 0.14 × 0.1 mm
β = 91.164 (12)°
Data collection top
Enraf Nonius CAD4
diffractometer
Rint = 0.056
1075 measured reflections3 standard reflections every 120 min
499 independent reflections intensity decay: 2%
422 reflections with I > 2σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0360 restraints
wR(F2) = 0.106All H-atom parameters refined
S = 1.09Δρmax = 0.35 e Å3
499 reflectionsΔρmin = 0.2 e Å3
50 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
H10.275 (4)0.076 (3)0.359 (3)0.016 (4)*
H20.641 (4)0.216 (3)0.101 (3)0.018 (4)*
H30.046 (14)0.459 (11)0.931 (8)0.050 (14)*0.5
C10.3718 (3)0.2476 (2)0.4109 (2)0.0136 (4)
O10.0852 (3)0.32797 (18)0.78144 (16)0.0180 (4)
C30.2827 (3)0.4133 (2)0.6480 (2)0.0126 (4)
C20.5838 (3)0.3307 (2)0.2693 (2)0.0133 (4)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
C10.0130 (7)0.0126 (6)0.0150 (7)0.0012 (5)0.0016 (5)0.0050 (5)
O10.0238 (6)0.0169 (6)0.0139 (6)0.0017 (4)0.0038 (4)0.0062 (4)
C30.0113 (7)0.0153 (7)0.0126 (7)0.0010 (5)0.0003 (5)0.0065 (5)
C20.0130 (7)0.0143 (7)0.0115 (7)0.0000 (5)0.0004 (5)0.0031 (5)
Geometric parameters (Å, º) top
C1—C21.3599 (18)O1—H30.95 (5)
C1—C31.4357 (19)C3—C2i1.4378 (17)
C1—H10.972 (18)C2—C3i1.4378 (17)
O1—C31.2988 (16)C2—H21.007 (18)
C2—C1—C3120.45 (11)O1—C3—C2i121.98 (11)
C2—C1—H1122.5 (10)C1—C3—C2i118.78 (12)
C3—C1—H1117.0 (10)C1—C2—C3i120.76 (12)
C3—O1—H3110 (4)C1—C2—H2120.4 (10)
O1—C3—C1119.24 (11)C3i—C2—H2118.8 (10)
Symmetry code: (i) x+1, y+1, z+1.
(sqm293k) top
Crystal data top
C6H5O2F(000) = 114
Mr = 109.1Dx = 1.446 Mg m3
Monoclinic, P21/cCu Kα radiation, λ = 1.54179 Å
a = 3.8362 (2) ÅCell parameters from 25 reflections
b = 5.9980 (3) Åθ = 8.1–28.8°
c = 11.5007 (6) ŵ = 0.92 mm1
β = 108.790 (1)°T = 293 K
V = 250.52 (2) Å3Plate, green
Z = 20.25 × 0.15 × 0.1 mm
Data collection top
Enraf Nonius CAD4
diffractometer
θmax = 76.0°, θmin = 8.1°
non–profiled ω/2θ scansh = 04
601 measured reflectionsk = 07
523 independent reflectionsl = 1413
412 reflections with I > 2σ(I)3 standard reflections every 120 min
Rint = 0.066 intensity decay: 3%
Refinement top
Refinement on F2All H-atom parameters refined
Least-squares matrix: full w = 1/[σ2(Fo2) + (0.0454P)2 + 0.0735P]
where P = (Fo2 + 2Fc2)/3
R[F2 > 2σ(F2)] = 0.039(Δ/σ)max < 0.001
wR(F2) = 0.106Δρmax = 0.22 e Å3
S = 1.04Δρmin = 0.15 e Å3
523 reflectionsExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
50 parametersExtinction coefficient: 0.025 (7)
0 restraints
Crystal data top
C6H5O2V = 250.52 (2) Å3
Mr = 109.1Z = 2
Monoclinic, P21/cCu Kα radiation
a = 3.8362 (2) ŵ = 0.92 mm1
b = 5.9980 (3) ÅT = 293 K
c = 11.5007 (6) Å0.25 × 0.15 × 0.1 mm
β = 108.790 (1)°
Data collection top
Enraf Nonius CAD4
diffractometer
Rint = 0.066
601 measured reflections3 standard reflections every 120 min
523 independent reflections intensity decay: 3%
412 reflections with I > 2σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0390 restraints
wR(F2) = 0.106All H-atom parameters refined
S = 1.04Δρmax = 0.22 e Å3
523 reflectionsΔρmin = 0.15 e Å3
50 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
H30.028 (5)0.486 (3)0.2924 (18)0.041 (5)*
H20.305 (6)0.216 (4)0.639 (2)0.052 (5)*
H10.421 (16)0.067 (10)0.474 (6)0.09 (2)*0.5
O10.3177 (4)0.1598 (2)0.41739 (13)0.0512 (5)
C10.1673 (4)0.3216 (3)0.45904 (15)0.0337 (4)
C30.0196 (4)0.4930 (3)0.37616 (15)0.0354 (4)
C20.1830 (4)0.3351 (3)0.58420 (15)0.0354 (5)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0616 (9)0.0377 (8)0.0502 (9)0.0145 (7)0.0124 (6)0.0086 (6)
C10.0360 (8)0.0289 (8)0.0373 (8)0.0034 (7)0.0135 (6)0.0033 (7)
C30.0400 (8)0.0375 (9)0.0296 (8)0.0034 (7)0.0127 (6)0.0012 (7)
C20.0373 (8)0.0306 (8)0.0371 (9)0.0049 (7)0.0105 (6)0.0057 (7)
Geometric parameters (Å, º) top
O1—C11.297 (2)C3—C2i1.359 (2)
O1—H10.85 (6)C3—H30.955 (19)
C1—C21.424 (2)C2—C3i1.359 (2)
C1—C31.428 (2)C2—H20.97 (2)
C1—O1—H1111 (4)C2i—C3—H3120.1 (12)
O1—C1—C2122.51 (16)C1—C3—H3119.3 (12)
O1—C1—C3118.65 (15)C3i—C2—C1120.58 (15)
C2—C1—C3118.83 (14)C3i—C2—H2121.1 (13)
C2i—C3—C1120.58 (14)C1—C2—H2118.2 (13)
Symmetry code: (i) x, y+1, z+1.
(sqm90k) top
Crystal data top
C6H5O2F(000) = 114
Mr = 109.1Dx = 1.492 Mg m3
Monoclinic, P21/cCu Kα radiation, λ = 1.54184 Å
a = 3.770 (3) ÅCell parameters from 16 reflections
b = 5.980 (3) Åθ = 8.2–25.8°
c = 11.458 (14) ŵ = 0.95 mm1
β = 109.99 (8)°T = 90 K
V = 242.8 (4) Å3Plate, red
Z = 20.18 × 0.07 × 0.05 mm
Data collection top
Enraf Nonius CAD4
diffractometer
θmax = 75.8°, θmin = 8.2°
non–profiled ω/2θ scansh = 44
531 measured reflectionsk = 70
507 independent reflectionsl = 414
382 reflections with I > 2σ(I)3 standard reflections every 120 min
Rint = 0.102 intensity decay: 2%
Refinement top
Refinement on F2All H-atom parameters refined
Least-squares matrix: full w = 1/[σ2(Fo2) + (0.0849P)2]
where P = (Fo2 + 2Fc2)/3
R[F2 > 2σ(F2)] = 0.047(Δ/σ)max < 0.001
wR(F2) = 0.131Δρmax = 0.33 e Å3
S = 1.09Δρmin = 0.42 e Å3
507 reflectionsExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
50 parametersExtinction coefficient: 0.053 (13)
0 restraints
Crystal data top
C6H5O2V = 242.8 (4) Å3
Mr = 109.1Z = 2
Monoclinic, P21/cCu Kα radiation
a = 3.770 (3) ŵ = 0.95 mm1
b = 5.980 (3) ÅT = 90 K
c = 11.458 (14) Å0.18 × 0.07 × 0.05 mm
β = 109.99 (8)°
Data collection top
Enraf Nonius CAD4
diffractometer
Rint = 0.102
531 measured reflections3 standard reflections every 120 min
507 independent reflections intensity decay: 2%
382 reflections with I > 2σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0470 restraints
wR(F2) = 0.131All H-atom parameters refined
S = 1.09Δρmax = 0.33 e Å3
507 reflectionsΔρmin = 0.42 e Å3
50 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
O10.5021 (4)0.3395 (2)0.41682 (13)0.0242 (5)
C11.0156 (5)0.1659 (3)0.41428 (16)0.0169 (5)
C20.7654 (5)0.0050 (3)0.37502 (17)0.0166 (5)
C30.7420 (5)0.1783 (3)0.45841 (17)0.0162 (5)
H20.610 (6)0.015 (4)0.294 (2)0.019 (5)*
H11.025 (7)0.283 (5)0.357 (3)0.029 (6)*
H30.498 (14)0.429 (7)0.478 (4)0.018 (12)*0.5
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0334 (9)0.0161 (8)0.0254 (8)0.0090 (6)0.0132 (6)0.0041 (6)
C10.0185 (9)0.0141 (9)0.0197 (9)0.0012 (7)0.0086 (7)0.0015 (7)
C20.0158 (8)0.0175 (9)0.0161 (8)0.0014 (7)0.0051 (6)0.0021 (8)
C30.0144 (8)0.0136 (8)0.0206 (9)0.0009 (7)0.0061 (6)0.0013 (7)
Geometric parameters (Å, º) top
O1—C31.296 (2)C1—H10.97 (3)
O1—H30.88 (4)C2—C31.433 (3)
C1—C21.359 (3)C2—H20.92 (2)
C1—C3i1.434 (3)C3—C1i1.434 (3)
C3—O1—H3111 (3)C1—C2—H2121.1 (15)
C2—C1—C3i120.29 (17)C3—C2—H2117.8 (16)
C2—C1—H1120.1 (16)O1—C3—C2119.16 (18)
C3i—C1—H1119.6 (16)O1—C3—C1i122.30 (18)
C1—C2—C3121.15 (18)C2—C3—C1i118.54 (18)
Symmetry code: (i) x+2, y, z+1.
(sqt293k) top
Crystal data top
C6H5O2Z = 1
Mr = 109.1F(000) = 51
Triclinic, P1Dx = 1.476 Mg m3
a = 3.8291 (2) ÅCu Kα radiation, λ = 1.54179 Å
b = 5.7546 (3) ÅCell parameters from 25 reflections
c = 5.9771 (2) Åθ = 11.6–27.4°
α = 111.121 (3)°µ = 0.94 mm1
β = 89.936 (4)°T = 293 K
γ = 92.453 (4)°Rod, red
V = 122.73 (1) Å30.28 × 0.14 × 0.1 mm
Data collection top
Enraf Nonius CAD4
diffractometer
θmax = 76.2°, θmin = 8.0°
non–profiled ω/2θ scansh = 44
654 measured reflectionsk = 67
513 independent reflectionsl = 70
409 reflections with I > 2σ(I)3 standard reflections every 120 min
Rint = 0.062 intensity decay: 10%
Refinement top
Refinement on F2All H-atom parameters refined
Least-squares matrix: full w = 1/[σ2(Fo2) + (0.0702P)2 + 0.0343P]
where P = (Fo2 + 2Fc2)/3
R[F2 > 2σ(F2)] = 0.043(Δ/σ)max < 0.001
wR(F2) = 0.124Δρmax = 0.24 e Å3
S = 1.04Δρmin = 0.25 e Å3
513 reflectionsExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
50 parametersExtinction coefficient: 0.06 (2)
0 restraints
Crystal data top
C6H5O2γ = 92.453 (4)°
Mr = 109.1V = 122.73 (1) Å3
Triclinic, P1Z = 1
a = 3.8291 (2) ÅCu Kα radiation
b = 5.7546 (3) ŵ = 0.94 mm1
c = 5.9771 (2) ÅT = 293 K
α = 111.121 (3)°0.28 × 0.14 × 0.1 mm
β = 89.936 (4)°
Data collection top
Enraf Nonius CAD4
diffractometer
Rint = 0.062
654 measured reflections3 standard reflections every 120 min
513 independent reflections intensity decay: 10%
409 reflections with I > 2σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0430 restraints
wR(F2) = 0.124All H-atom parameters refined
S = 1.04Δρmax = 0.24 e Å3
513 reflectionsΔρmin = 0.25 e Å3
50 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
H20.283 (5)0.081 (4)0.367 (4)0.039 (5)*
H30.636 (6)0.221 (4)0.104 (4)0.047 (6)*
H10.057 (13)0.458 (10)0.926 (8)0.051 (13)*0.5
C20.3722 (4)0.2500 (3)0.4123 (3)0.0326 (5)
O10.0890 (4)0.3286 (2)0.7807 (2)0.0443 (5)
C10.2853 (4)0.4142 (3)0.6475 (3)0.0303 (5)
C30.5823 (4)0.3332 (3)0.2716 (3)0.0332 (5)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
C20.0360 (9)0.0285 (8)0.0311 (9)0.0050 (6)0.0030 (6)0.0089 (7)
O10.0562 (9)0.0428 (8)0.0340 (8)0.0080 (6)0.0146 (6)0.0153 (6)
C10.0306 (8)0.0337 (9)0.0279 (8)0.0023 (6)0.0061 (6)0.0129 (7)
C30.0368 (9)0.0335 (9)0.0266 (8)0.0016 (7)0.0069 (7)0.0078 (7)
Geometric parameters (Å, º) top
C2—C31.356 (2)O1—H10.93 (5)
C2—C11.431 (2)C1—C3i1.426 (2)
C2—H20.96 (2)C3—C1i1.426 (2)
O1—C11.3004 (19)C3—H31.00 (2)
C3—C2—C1120.25 (15)O1—C1—C2119.06 (14)
C3—C2—H2123.6 (13)C3i—C1—C2118.84 (14)
C1—C2—H2116.0 (13)C2—C3—C1i120.90 (14)
C1—O1—H1108 (3)C2—C3—H3120.8 (13)
O1—C1—C3i122.10 (14)C1i—C3—H3118.2 (12)
Symmetry code: (i) x+1, y+1, z+1.

Experimental details

(sqt90k)(sqm293k)(sqm90k)(sqt293k)
Crystal data
Chemical formulaC6H5O2C6H5O2C6H5O2C6H5O2
Mr109.1109.1109.1109.1
Crystal system, space groupTriclinic, P1Monoclinic, P21/cMonoclinic, P21/cTriclinic, P1
Temperature (K)9029390293
a, b, c (Å)3.7615 (6), 5.6996 (12), 5.9065 (8)3.8362 (2), 5.9980 (3), 11.5007 (6)3.770 (3), 5.980 (3), 11.458 (14)3.8291 (2), 5.7546 (3), 5.9771 (2)
α, β, γ (°)110.800 (15), 91.164 (12), 91.443 (15)90, 108.790 (1), 9090, 109.99 (8), 90111.121 (3), 89.936 (4), 92.453 (4)
V3)118.28 (4)250.52 (2)242.8 (4)122.73 (1)
Z1221
Radiation typeCu KαCu KαCu KαCu Kα
µ (mm1)0.970.920.950.94
Crystal size (mm)0.29 × 0.14 × 0.10.25 × 0.15 × 0.10.18 × 0.07 × 0.050.28 × 0.14 × 0.1
Data collection
DiffractometerEnraf Nonius CAD4
diffractometer
Enraf Nonius CAD4
diffractometer
Enraf Nonius CAD4
diffractometer
Enraf Nonius CAD4
diffractometer
Absorption correction
No. of measured, independent and
observed [I > 2σ(I)] reflections
1075, 499, 422 601, 523, 412 531, 507, 382 654, 513, 409
Rint0.0560.0660.1020.062
(sin θ/λ)max1)0.6300.6290.6290.630
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.036, 0.106, 1.09 0.039, 0.106, 1.04 0.047, 0.131, 1.09 0.043, 0.124, 1.04
No. of reflections499523507513
No. of parameters50505050
H-atom treatmentAll H-atom parameters refinedAll H-atom parameters refinedAll H-atom parameters refinedAll H-atom parameters refined
Δρmax, Δρmin (e Å3)0.35, 0.20.22, 0.150.33, 0.420.24, 0.25

Computer programs: CAD-4 EXPRESS (Enraf Nonius, 1994), XCAD4 (Harms & Wocadlo, 1995), SHELXS97 (Sheldrick, 1997), SHELXS86 (Sheldrick, 1986), SHELXL97 (Sheldrick, 1997), ORTEP-3 for Windows (Farrugia, 1997), WinGX publication routines (Farrugia, 1999).

 

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