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Refraction-enhanced imaging is now widely used for imaging low-absorption-contrast specimens in the hard X-ray region. However, the interpretation of the details of a refraction-enhanced image is not always clear. In this paper the theoretical treatment of refraction-enhanced imaging and a method for phase retrieval from refraction-contrast images are discussed in comparison with angular-deflection mapping of the transmitting beam. The problems of thick and complicated objects are also discussed.

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