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The usual formulation used for determining stresses by X-ray diffraction with a flat specimen is not valid when the sample has a curved surface. In the first paper of this series [François et al. (1995). J. Appl. Cryst. 28, 761–767], a general formulation was presented, showing that two effects arise simultaneously: a translation and a rotation effect. In the present paper, analytical formulae, derived from the general expression and valid under certain assumptions, are given. They exhibit a linear relation between the measured strain and sin2ψ and they can be used in many practical cases. Experimental and numerical examples of the use of the simplified and the general formulation on thick and thin wires, thin layers on wires, convex and concave specimens, and isotropic and textured samples are given. The range in which the classical and the present formulation are valid is also studied.
