research papers
When the Laue technique is applied to ordinary diffractometer devices and detector systems, problems appear with respect to the Lorentz factor that are unsatisfactorily treated in the literature. A detailed treatment of beam divergence and mosaic spread leads to a derivation of the exact expression for the Lorentz factor for X-ray diffraction with white radiation. This expression differs from the usual formulae if the mosaic spread and beam-divergence angles are of the order of magnitude of the diffraction angle. In addition, the different expressions for the Lorentz factor appearing in the literature are discussed in detail.