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When an X-ray area detector based on a single-crystalline material, for instance a state-of-the-art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the detected image. These lines are easily seen in scattering experiments with smooth patterns, such as small-angle X-ray scattering. The origin of this effect is Bragg reflection within the sensor layer of the detector. Experimental images are presented over a photon energy range from 3.4 to 10 keV, together with a theoretical analysis. The intensity of the detected signal is decreased by up to 20% on this pattern, which can affect the evaluation of scattering and diffraction experiments. The patterns can be exploited to check the alignment of the detector surface with the direct beam, and the alignment of individual detector modules with each other in the case of modular detectors, as well as for energy calibration of the radiation.

Supporting information

mp4

Moving Picture Experts Group (MP4) video file https://doi.org/10.1107/S1600576713031981/rg5052sup1.mp4
This movie displays the experimental images and numerical simulations over a photon energy range from 7500 to 9200 eV in steps of 5 eV with a rate of 75 eV/s

mp4

Moving Picture Experts Group (MP4) video file https://doi.org/10.1107/S1600576713031981/rg5052sup2.mp4
This movie displays the experimental images and numerical simulations around the characteristic energy E_004 in steps of 0.1 eV with a rate of with a rate of 1 eV/s

mp4

Moving Picture Experts Group (MP4) video file https://doi.org/10.1107/S1600576713031981/rg5052sup3.mp4
This movie displays the experimental images and numerical simulations around the characteristic energy E_008 in steps of 0.2 eV with a rate of with a rate of 2 eV/s

zip

Zip compressed file https://doi.org/10.1107/S1600576713031981/rg5052sup4.zip
Experimental images at the characteristic energies E_hkl from Table 1


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