Download citation
Download citation
link to html
Recent studies have confirmed the usefulness of the Hooft and Parsons methodologies for determination of the absolute crystal structures of enantiopure light-atom compounds using Cu Kα radiation. While many single-crystal diffractometers used for small-molecule structure determination are equipped with molybdenum anodes, use of data from such instruments for the absolute structure determination of light-atom crystal structures is rarely documented and has often been found to be unsuccessful. The Hooft and Parsons methodologies have been applied to 44 data sets obtained from single crystals containing light-atom molecules of known chirality using Mo  radiation. Several factors influencing the calculation of accurate and precise values for the Hooft and Parsons parameters obtained from these data sets have been identified, the inclusion of high-resolution diffraction data being particularly important. The correct absolute structure was obtained in all cases, with the standard uncertainties of the final absolute structure parameters below 0.1 for the great majority.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S2052520614014498/ps5035sup1.cif
Contains datablock I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S2052520614014498/ps5035Isup2.hkl
Contains datablock I

txt

Text file https://doi.org/10.1107/S2052520614014498/ps5035sup3.txt
CIF as a text file

zip

Zip compressed file https://doi.org/10.1107/S2052520614014498/ps5035sup4.zip
FCF files a compressed zip file

pdf

Portable Document Format (PDF) file https://doi.org/10.1107/S2052520614014498/ps5035sup5.pdf
Extra tables and figures

CCDC reference: 1009312

Computing details top

Data collection: Bruker APEX2 v2011.4-0; cell refinement: Bruker APEX2 v2011.4-0; data reduction: Bruker SAINT V7.60A; program(s) used to solve structure: Sir2011; program(s) used to refine structure: SHELXL2012 (Sheldrick, 2012); molecular graphics: Bruker SHELXTL; software used to prepare material for publication: Bruker SHELXTL.

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
[Figure 7]
[Figure 8]
(I) top
Crystal data top
C3H7NO2Dx = 1.405 Mg m3
Mr = 89.10Mo Kα radiation, λ = 0.71073 Å
Orthorhombic, P212121Cell parameters from 7420 reflections
a = 5.7890 (8) Åθ = 7.5–62.4°
b = 5.9387 (7) ŵ = 0.12 mm1
c = 12.2516 (14) ÅT = 100 K
V = 421.20 (9) Å3Block, colourless
Z = 40.4 × 0.4 × 0.3 mm
F(000) = 192
Data collection top
Kappa 4-axis goniometer bruker-nonius
diffractometer
6425 independent reflections
Radiation source: Rotating anode X-ray tube, Bruker-Nonius FR 5916209 reflections with I > 2σ(I)
Multilayer Montel 200 mirrors monochromatorRint = 0.026
Detector resolution: 512 pixels mm-1θmax = 62.7°, θmin = 7.5°
Fullsphere data collection, phi and ω scansh = 1312
Absorption correction: empirical (using intensity measurements)
SADABS Version 2008/1 Bruker-Nonius Blessing, Acta Cryst. (1995) A51 33-38
k = 1414
Tmin = 0.743, Tmax = 0.966l = 3030
31341 measured reflections
Refinement top
Refinement on F2Hydrogen site location: difference Fourier map
Least-squares matrix: fullH-atom parameters not refined
R[F2 > 2σ(F2)] = 0.025 w = 1/[σ2(Fo2) + (0.040P)2 + 0.0029P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.066(Δ/σ)max = 0.002
S = 1.18Δρmax = 0.49 e Å3
6425 reflectionsΔρmin = 0.23 e Å3
55 parametersAbsolute structure: Flack x determined using 2644 quotients [(I+)-(I-)]/[(I+)+(I-)] (Parsons and Flack (2004), Acta Cryst. A60, s61).
0 restraintsAbsolute structure parameter: 0.05 (8)
Crystal data top
C3H7NO2V = 421.20 (9) Å3
Mr = 89.10Z = 4
Orthorhombic, P212121Mo Kα radiation
a = 5.7890 (8) ŵ = 0.12 mm1
b = 5.9387 (7) ÅT = 100 K
c = 12.2516 (14) Å0.4 × 0.4 × 0.3 mm
Data collection top
Kappa 4-axis goniometer bruker-nonius
diffractometer
6425 independent reflections
Absorption correction: empirical (using intensity measurements)
SADABS Version 2008/1 Bruker-Nonius Blessing, Acta Cryst. (1995) A51 33-38
6209 reflections with I > 2σ(I)
Tmin = 0.743, Tmax = 0.966Rint = 0.026
31341 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.025H-atom parameters not refined
wR(F2) = 0.066Δρmax = 0.49 e Å3
S = 1.18Δρmin = 0.23 e Å3
6425 reflectionsAbsolute structure: Flack x determined using 2644 quotients [(I+)-(I-)]/[(I+)+(I-)] (Parsons and Flack (2004), Acta Cryst. A60, s61).
55 parametersAbsolute structure parameter: 0.05 (8)
0 restraints
Special details top

Experimental. It should be noted that the e.s.d.'s of the cell dimensions are probably too low; they should be multiplied by a factor of 2 to 10

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O10.26127 (4)0.94249 (4)0.81575 (2)0.01282 (3)
O20.12499 (4)1.22736 (4)0.91615 (2)0.01287 (3)
N10.31650 (4)1.14850 (3)0.86234 (2)0.01033 (3)
C10.10016 (4)1.05514 (4)0.85909 (2)0.00919 (3)
C20.14545 (4)0.96797 (4)0.83885 (2)0.00930 (3)
C30.19665 (5)0.76231 (5)0.90917 (2)0.01349 (4)
H20.16240.93090.76170.021*
H110.30671.19530.93410.022*
H120.45271.09200.85410.028*
H130.29451.25910.82210.021*
H310.19570.80050.98810.026*
H320.08480.64420.89520.023*
H330.34910.70200.89360.022*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.00792 (6)0.01600 (6)0.01453 (6)0.00075 (5)0.00098 (4)0.00346 (5)
O20.01146 (7)0.01409 (6)0.01306 (5)0.00160 (5)0.00097 (4)0.00414 (4)
N10.00808 (6)0.01183 (5)0.01107 (5)0.00043 (4)0.00003 (4)0.00042 (4)
C10.00762 (6)0.01138 (6)0.00858 (5)0.00061 (4)0.00000 (4)0.00038 (4)
C20.00765 (6)0.01098 (6)0.00928 (5)0.00046 (4)0.00003 (4)0.00090 (4)
C30.01147 (8)0.01255 (7)0.01646 (8)0.00113 (6)0.00050 (6)0.00241 (6)
Geometric parameters (Å, º) top
O1—C11.2647 (3)C1—C21.5333 (4)
O2—C11.2472 (3)C2—C31.5238 (4)
N1—C21.4876 (3)
O2—C1—O1125.75 (2)N1—C2—C3109.81 (2)
O2—C1—C2118.32 (2)N1—C2—C1110.04 (2)
O1—C1—C2115.93 (2)C3—C2—C1111.07 (2)
O2—C1—C2—N118.27 (3)O2—C1—C2—C3103.54 (3)
O1—C1—C2—N1162.01 (2)O1—C1—C2—C376.19 (3)

Experimental details

Crystal data
Chemical formulaC3H7NO2
Mr89.10
Crystal system, space groupOrthorhombic, P212121
Temperature (K)100
a, b, c (Å)5.7890 (8), 5.9387 (7), 12.2516 (14)
V3)421.20 (9)
Z4
Radiation typeMo Kα
µ (mm1)0.12
Crystal size (mm)0.4 × 0.4 × 0.3
Data collection
DiffractometerKappa 4-axis goniometer bruker-nonius
diffractometer
Absorption correctionEmpirical (using intensity measurements)
SADABS Version 2008/1 Bruker-Nonius Blessing, Acta Cryst. (1995) A51 33-38
Tmin, Tmax0.743, 0.966
No. of measured, independent and
observed [I > 2σ(I)] reflections
31341, 6425, 6209
Rint0.026
(sin θ/λ)max1)1.250
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.025, 0.066, 1.18
No. of reflections6425
No. of parameters55
H-atom treatmentH-atom parameters not refined
Δρmax, Δρmin (e Å3)0.49, 0.23
Absolute structureFlack x determined using 2644 quotients [(I+)-(I-)]/[(I+)+(I-)] (Parsons and Flack (2004), Acta Cryst. A60, s61).
Absolute structure parameter0.05 (8)

Computer programs: Bruker APEX2 v2011.4-0, Bruker SAINT V7.60A, Sir2011, SHELXL2012 (Sheldrick, 2012), Bruker SHELXTL.

 

Follow Acta Cryst. B
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds