Journal of Applied Crystallography
Journal of Applied
Crystallography
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J. Appl. Cryst.
(2001).
34
,
785
https://doi.org/10.1107/S0021889801013437
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xd_red
-1.0: synchrotron and in-house X-ray diffraction data reduction and analysis program
R. H. Mathiesen
A program system to analyse, correct and merge single-crystal synchrotron or in-house X-ray diffraction data is described.
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