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Accurate structure factors for small crystals of the rutile-type structures CoF2, cobalt difluoride, and ZnF2, zinc difluoride, have been measured with focused λ = 0.8400 (2) Å synchrotron X-radiation at room temperature. Phenomenological structural trends across the full series of rutile-type transition metal difluorides are analysed, showing the importance of the metal atom in the degree of distortion of the metal–F6 octahedra in these structures. Multipole models reveal strong asphericities in the electron density surrounding the transition metals, which are consistent with expectations from crystal field theory and the structural trends in these compounds. Transition metal 3d-orbital populations were computed from the multipole refinement parameters, showing significant repopulation of orbitals compared with the free atom, particularly for CoF2.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768100017353/os0063sup1.cif
Contains datablocks cof2, znf2, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768100017353/os0063cof2sup2.hkl
Contains datablock CoF2

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768100017353/os0063znf2sup3.hkl
Contains datablock ZnF2

Computing details top

For both compounds, data reduction: Xtal DIFDAT ADDREF SORTRF ABSORB; program(s) used to solve structure: Xtal; program(s) used to refine structure: Xtal CRYLSQ; molecular graphics: Xtal; software used to prepare material for publication: Xtal CIFIO.

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
(cof2) top
Crystal data top
CoF2Dx = 4.592 Mg m3
Mr = 12.12Synchrotron radiation, λ = 0.84 Å
Tetragonal, P42/mnmCell parameters from 6 reflections
Hall symbol: -P 4n 2nθ = 45.7–52.4°
a = 4.6956 (5) ŵ = 18.22 mm1
c = 3.1793 (3) ÅT = 293 K
V = 70.10 (2) Å3Rectangular, pink
Z = 16 × × mm
F(000) = 90
Data collection top
BL14A Four circle
diffractometer
2502 reflections with I > 2σ(I)
Radiation source: Photon Factory BL14ARint = 0.039
Si(111) monochromatorθmax = 67.4°, θmin = 7.3°
ω–2θ scansh = 1010
Absorption correction: analytical
?
k = 1010
Tmin = 0.801, Tmax = 0.864l = 66
2883 measured reflections6 standard reflections every 94 reflections
2883 independent reflections intensity decay: 3%
Refinement top
Refinement on F0 constraints
Least-squares matrix: fullw = 1/σ2(F)
R[F2 > 2σ(F2)] = 0.019(Δ/σ)max = 0.00005
wR(F2) = 0.015Δρmax = 1.17 e Å3
S = 2.42Δρmin = 1.07 e Å3
235 reflectionsExtinction correction: Zachariasen, Eq22 p292 "Cryst. Comp." Munksgaard 1970
9 parametersExtinction coefficient: 9132 (847)
0 restraints
Crystal data top
CoF2Z = 16
Mr = 12.12Synchrotron radiation, λ = 0.84 Å
Tetragonal, P42/mnmµ = 18.22 mm1
a = 4.6956 (5) ÅT = 293 K
c = 3.1793 (3) Å × × mm
V = 70.10 (2) Å3
Data collection top
BL14A Four circle
diffractometer
2502 reflections with I > 2σ(I)
Absorption correction: analytical
?
Rint = 0.039
Tmin = 0.801, Tmax = 0.8646 standard reflections every 94 reflections
2883 measured reflections intensity decay: 3%
2883 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0199 parameters
wR(F2) = 0.0150 restraints
S = 2.42Δρmax = 1.17 e Å3
235 reflectionsΔρmin = 1.07 e Å3
Special details top

Refinement. Sfls F σ weight full matrix

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Co0.000000.000000.000000.00634 (4)
F0.30341 (11)0.30341 (11)0.000000.01063 (17)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Co0.00685 (3)0.00685 (3)0.00533 (5)0.00073 (5)0.000000.00000
F0.01194 (15)0.01194 (15)0.0080 (2)0.0053 (2)0.000000.00000
(znf2) top
Crystal data top
ZnF2Dx = 4.952 Mg m3
Mr = 12.92Synchrotron radiation, λ = 0.84 Å
Tetragonal, P42/mnmCell parameters from 6 reflections
Hall symbol: -P 4n 2nθ = 45.6–53.5°
a = 4.7038 (15) ŵ = 26.55 mm1
c = 3.1336 (7) ÅT = 293 K
V = 69.33 (5) Å3Rectangular, clear
Z = 16 × × mm
F(000) = 96
Data collection top
BL14A Four circle
diffractometer
2460 reflections with I > 2σ(I)
Radiation source: Photon Factory BL14ARint = 0.04
Si(111) monochromatorθmax = 67.5°, θmin = 7.3°
ω–2θ scansh = 1010
Absorption correction: analytical
?
k = 1010
Tmin = 0.527, Tmax = 0.754l = 66
2727 measured reflections6 standard reflections every 94 reflections
2727 independent reflections intensity decay: 3%
Refinement top
Refinement on F0 constraints
Least-squares matrix: fullw = 1/σ2(F)
R[F2 > 2σ(F2)] = 0.014(Δ/σ)max = 0.00013
wR(F2) = 0.016Δρmax = 0.72 e Å3
S = 2.39Δρmin = 0.68 e Å3
237 reflectionsExtinction correction: Zachariasen, Eq22 p292 "Cryst. Comp." Munksgaard 1970
9 parametersExtinction coefficient: 3273 (120)
0 restraints
Crystal data top
ZnF2Z = 16
Mr = 12.92Synchrotron radiation, λ = 0.84 Å
Tetragonal, P42/mnmµ = 26.55 mm1
a = 4.7038 (15) ÅT = 293 K
c = 3.1336 (7) Å × × mm
V = 69.33 (5) Å3
Data collection top
BL14A Four circle
diffractometer
2460 reflections with I > 2σ(I)
Absorption correction: analytical
?
Rint = 0.04
Tmin = 0.527, Tmax = 0.7546 standard reflections every 94 reflections
2727 measured reflections intensity decay: 3%
2727 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0149 parameters
wR(F2) = 0.0160 restraints
S = 2.39Δρmax = 0.72 e Å3
237 reflectionsΔρmin = 0.68 e Å3
Special details top

Refinement. Sfls F σ weight full matrix

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Zn0.000000.000000.000000.00876 (5)
F0.30350 (9)0.30350 (9)0.000000.01231 (12)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Zn0.00917 (4)0.00917 (4)0.00793 (7)0.00111 (3)0.000000.00000
F0.01307 (10)0.01307 (10)0.01080 (17)0.00515 (17)0.000000.00000

Experimental details

(cof2)(znf2)
Crystal data
Chemical formulaCoF2ZnF2
Mr12.1212.92
Crystal system, space groupTetragonal, P42/mnmTetragonal, P42/mnm
Temperature (K)293293
a, c (Å)4.6956 (5), 3.1793 (3)4.7038 (15), 3.1336 (7)
V3)70.10 (2)69.33 (5)
Z1616
Radiation typeSynchrotron, λ = 0.84 ÅSynchrotron, λ = 0.84 Å
µ (mm1)18.2226.55
Crystal size (mm) × × × ×
Data collection
DiffractometerBL14A Four circle
diffractometer
BL14A Four circle
diffractometer
Absorption correctionAnalyticalAnalytical
Tmin, Tmax0.801, 0.8640.527, 0.754
No. of measured, independent and
observed [I > 2σ(I)] reflections
2883, 2883, 2502 2727, 2727, 2460
Rint0.0390.04
(sin θ/λ)max1)1.0991.100
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.019, 0.015, 2.42 0.014, 0.016, 2.39
No. of reflections235237
No. of parameters99
Δρmax, Δρmin (e Å3)1.17, 1.070.72, 0.68

Computer programs: Xtal DIFDAT ADDREF SORTRF ABSORB, Xtal CRYLSQ, Xtal CIFIO.

 

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