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Crystalline 4-isopropylphenol, C9H12O, an optically non-linear material, was studied by X-ray diffraction in order to deter­mine its structure at several temperatures in the 95-300 K range. The thermal expansion coefficients have been calculated from the lattice parameters' dependence on temperature. The rigid-body analysis of the anisotropic displacement parameters including the correlation with the internal motion of large amplitude provided the values of the molecular translation and libration tensors at the temperatures studied and was used to characterize the torsional motion of the isopropyl group. The calculated normal modes and internal torsion frequency were compared with the wave numbers at the maximum of bands in the low-frequency Raman scattering, FTIR and inelastic neutron scattering spectra.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768102004573/ns0008sup1.cif
Contains datablocks ipp95dc, 4ip180, 4ip300, ipp95_6

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102004573/ns0008sup2.hkl
Contains datablock ipp95_6

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102004573/ns0008sup3.hkl
Contains datablock 4ip180

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102004573/ns0008sup4.hkl
Contains datablock 4ip300

CCDC references: 193579; 193580; 193581

Computing details top

For all compounds, data collection: Kuma KM4CCD Software, 1999; cell refinement: Kuma KM4CCD Software, 1999; data reduction: Kuma KM4CCD Software, 1999; program(s) used to solve structure: SHELXS97 (Sheldrick, 1997a); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997b); molecular graphics: ORTEP-3 (Farrugia, 1997); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997b).

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
(ipp95dc) '4-Isopropyl-phenol' top
Crystal data top
C9H12ODx = 1.140 Mg m3
Mr = 136.19Mo Kα radiation, λ = 0.71073 Å
Tetragonal, P41Cell parameters from 887 reflections
a = 9.848 (3) ŵ = 0.07 mm1
c = 8.166 (2) ÅT = 95 K
V = 793.3 (4) Å3Prism, colourless
Z = 40.72 × 0.44 × 0.29 mm
F(000) = 296
Data collection top
Kuma Diffraction KM4CCD
diffractometer
2018 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.064
Graphite monochromatorθmax = 31.2°, θmin = 3.8°
ω scansh = 1311
5936 measured reflectionsk = 1414
2162 independent reflectionsl = 1110
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.060H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.150Calculated w = 1/[σ2(Fo2) + (0.0686P)2 + 0.4966P]
where P = (Fo2 + 2Fc2)/3
S = 1.09(Δ/σ)max = 0.001
2162 reflectionsΔρmax = 0.29 e Å3
92 parametersΔρmin = 0.45 e Å3
1 restraintAbsolute structure: Flack H D (1983), Acta Cryst. A39, 876-881
Primary atom site location: structure-invariant direct methodsAbsolute structure parameter: 2.1 (18)
Crystal data top
C9H12OZ = 4
Mr = 136.19Mo Kα radiation
Tetragonal, P41µ = 0.07 mm1
a = 9.848 (3) ÅT = 95 K
c = 8.166 (2) Å0.72 × 0.44 × 0.29 mm
V = 793.3 (4) Å3
Data collection top
Kuma Diffraction KM4CCD
diffractometer
2018 reflections with I > 2σ(I)
5936 measured reflectionsRint = 0.064
2162 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.060H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.150Δρmax = 0.29 e Å3
S = 1.09Δρmin = 0.45 e Å3
2162 reflectionsAbsolute structure: Flack H D (1983), Acta Cryst. A39, 876-881
92 parametersAbsolute structure parameter: 2.1 (18)
1 restraint
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O10.13173 (13)0.98851 (13)0.13042 (19)0.0180 (3)
H10.09270.95410.04900.027*
C10.26012 (16)0.93315 (17)0.1462 (2)0.0143 (3)
C20.34146 (18)0.98130 (17)0.2727 (2)0.0169 (3)
H20.30911.05110.34280.020*
C30.47024 (17)0.92696 (18)0.2962 (3)0.0180 (3)
H30.52480.95940.38380.022*
C40.52115 (18)0.82520 (18)0.1932 (2)0.0162 (3)
C50.43876 (18)0.78005 (18)0.0664 (2)0.0164 (3)
H50.47150.71150.00510.020*
C60.30853 (18)0.83324 (17)0.0413 (2)0.0161 (3)
H60.25390.80140.04650.019*
C70.66042 (19)0.7643 (2)0.2225 (3)0.0206 (4)
H70.68380.70700.12550.025*
C80.6596 (2)0.6730 (3)0.3736 (3)0.0334 (5)
H8A0.75020.63420.38970.050*
H8B0.59360.59980.35810.050*
H8C0.63440.72650.47010.050*
C90.7698 (2)0.8749 (2)0.2386 (3)0.0298 (5)
H9A0.85840.83240.25700.045*
H9B0.74770.93410.33120.045*
H9C0.77280.92860.13770.045*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0144 (6)0.0188 (6)0.0209 (7)0.0019 (4)0.0022 (5)0.0053 (5)
C10.0122 (7)0.0143 (7)0.0163 (8)0.0001 (5)0.0008 (6)0.0003 (6)
C20.0162 (7)0.0160 (7)0.0186 (9)0.0010 (6)0.0015 (6)0.0047 (6)
C30.0156 (7)0.0187 (8)0.0196 (9)0.0007 (6)0.0022 (7)0.0055 (7)
C40.0151 (7)0.0175 (7)0.0159 (8)0.0003 (6)0.0008 (6)0.0020 (6)
C50.0161 (7)0.0175 (7)0.0157 (8)0.0007 (5)0.0000 (6)0.0038 (6)
C60.0162 (7)0.0166 (7)0.0156 (8)0.0011 (5)0.0013 (6)0.0028 (6)
C70.0162 (8)0.0249 (9)0.0208 (10)0.0045 (6)0.0019 (7)0.0058 (7)
C80.0331 (11)0.0397 (12)0.0274 (12)0.0151 (9)0.0029 (10)0.0052 (10)
C90.0151 (8)0.0389 (12)0.0353 (12)0.0006 (7)0.0015 (8)0.0141 (10)
Geometric parameters (Å, º) top
O1—C11.383 (2)C4—C51.389 (3)
C1—C61.390 (2)C4—C71.516 (2)
C1—C21.391 (2)C5—C61.401 (2)
C2—C31.390 (2)C7—C81.528 (3)
C3—C41.402 (3)C7—C91.538 (3)
O1—C1—C6122.39 (16)C3—C4—C7120.82 (16)
O1—C1—C2117.45 (15)C4—C5—C6121.57 (16)
C6—C1—C2120.15 (15)C1—C6—C5119.31 (16)
C3—C2—C1119.76 (16)C4—C7—C8110.84 (17)
C2—C3—C4121.28 (17)C4—C7—C9111.46 (16)
C5—C4—C3117.91 (16)C8—C7—C9110.66 (19)
C5—C4—C7121.26 (16)
O1—C1—C2—C3178.58 (17)O1—C1—C6—C5178.87 (16)
C6—C1—C2—C31.5 (3)C2—C1—C6—C51.2 (3)
C1—C2—C3—C40.9 (3)C4—C5—C6—C10.3 (3)
C2—C3—C4—C50.0 (3)C5—C4—C7—C8106.4 (2)
C2—C3—C4—C7178.53 (18)C3—C4—C7—C872.1 (2)
C3—C4—C5—C60.3 (3)C5—C4—C7—C9129.9 (2)
C7—C4—C5—C6178.23 (18)C3—C4—C7—C951.7 (3)
(4ip180) '4-Isopropyl-phenol' top
Crystal data top
C9H12ODx = 1.131 Mg m3
Mr = 136.19Mo Kα radiation, λ = 0.71073 Å
Tetragonal, P41Cell parameters from 1091 reflections
a = 9.859 (2) ŵ = 0.07 mm1
c = 8.221 (1) ÅT = 180 K
V = 799.6 (2) Å3Prism, colourless
Z = 41.02 × 0.51 × 0.36 mm
F(000) = 296
Data collection top
Kuma Diffraction KM4CCD
diffractometer
1281 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.042
Graphite monochromatorθmax = 31.3°, θmin = 3.2°
ω scansh = 1414
4181 measured reflectionsk = 1314
1453 independent reflectionsl = 127
Refinement top
Refinement on F2Hydrogen site location: inferred from neighbouring sites
Least-squares matrix: fullH atoms treated by a mixture of independent and constrained refinement
R[F2 > 2σ(F2)] = 0.059Calculated w = 1/[σ2(Fo2) + (0.0956P)2 + 0.1106P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.168(Δ/σ)max < 0.001
S = 1.20Δρmax = 0.34 e Å3
1453 reflectionsΔρmin = 0.40 e Å3
93 parametersExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
1 restraintExtinction coefficient: 0.32 (5)
Primary atom site location: structure-invariant direct methodsAbsolute structure: Flack H D (1983), Acta Cryst. A39, 876-881
Secondary atom site location: difference Fourier mapAbsolute structure parameter: 0 (2)
Crystal data top
C9H12OZ = 4
Mr = 136.19Mo Kα radiation
Tetragonal, P41µ = 0.07 mm1
a = 9.859 (2) ÅT = 180 K
c = 8.221 (1) Å1.02 × 0.51 × 0.36 mm
V = 799.6 (2) Å3
Data collection top
Kuma Diffraction KM4CCD
diffractometer
1281 reflections with I > 2σ(I)
4181 measured reflectionsRint = 0.042
1453 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.059H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.168Δρmax = 0.34 e Å3
S = 1.20Δρmin = 0.40 e Å3
1453 reflectionsAbsolute structure: Flack H D (1983), Acta Cryst. A39, 876-881
93 parametersAbsolute structure parameter: 0 (2)
1 restraint
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O10.98848 (16)0.86720 (16)0.1941 (2)0.0319 (4)
H10.95190.90670.11800.048*
C10.9332 (2)0.7397 (2)0.2102 (3)0.0257 (4)
C20.9812 (2)0.6588 (2)0.3354 (3)0.0299 (5)
H21.04960.69040.40340.036*
C30.9271 (2)0.5306 (2)0.3592 (3)0.0317 (5)
H30.95880.47790.44490.038*
C40.8262 (2)0.4790 (2)0.2577 (3)0.0282 (4)
C50.7810 (2)0.5611 (2)0.1318 (3)0.0293 (4)
H50.71420.52890.06200.035*
C60.8335 (2)0.6909 (2)0.1073 (3)0.0277 (4)
H60.80160.74430.02230.033*
C70.7662 (3)0.3407 (2)0.2866 (3)0.0353 (5)
H70.70990.31810.19220.042*
C80.6747 (4)0.3401 (4)0.4365 (5)0.0608 (10)
H8A0.63710.25120.45130.091*
H8B0.60260.40440.42190.091*
H8C0.72690.36450.53070.091*
C90.8769 (4)0.2316 (3)0.3009 (5)0.0513 (8)
H9A0.83540.14490.31870.077*
H9B0.93540.25280.39060.077*
H9C0.92890.22910.20220.077*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0350 (8)0.0277 (8)0.0331 (9)0.0026 (6)0.0078 (7)0.0036 (6)
C10.0263 (9)0.0237 (9)0.0270 (9)0.0018 (6)0.0015 (7)0.0008 (7)
C20.0289 (10)0.0319 (10)0.0288 (10)0.0022 (7)0.0088 (8)0.0015 (8)
C30.0358 (11)0.0298 (9)0.0293 (10)0.0007 (7)0.0099 (8)0.0042 (8)
C40.0309 (10)0.0274 (9)0.0263 (10)0.0018 (7)0.0031 (8)0.0006 (7)
C50.0297 (9)0.0319 (10)0.0262 (10)0.0012 (7)0.0060 (8)0.0005 (8)
C60.0290 (9)0.0303 (10)0.0238 (9)0.0007 (7)0.0043 (7)0.0021 (7)
C70.0440 (12)0.0281 (10)0.0338 (12)0.0072 (8)0.0107 (10)0.0034 (8)
C80.075 (2)0.0587 (19)0.0485 (19)0.0286 (17)0.0107 (16)0.0022 (16)
C90.0654 (18)0.0296 (11)0.0590 (18)0.0010 (11)0.0229 (15)0.0012 (12)
Geometric parameters (Å, º) top
O1—C11.377 (2)C4—C51.388 (3)
C1—C61.383 (3)C4—C71.505 (3)
C1—C21.386 (3)C5—C61.395 (3)
C2—C31.386 (3)C7—C81.528 (5)
C3—C41.395 (3)C7—C91.537 (4)
O1—C1—C6122.68 (19)C3—C4—C7121.1 (2)
O1—C1—C2117.56 (18)C4—C5—C6121.64 (19)
C6—C1—C2119.76 (18)C1—C6—C5119.63 (19)
C1—C2—C3119.94 (18)C4—C7—C8111.3 (2)
C2—C3—C4121.5 (2)C4—C7—C9111.6 (2)
C5—C4—C3117.47 (19)C8—C7—C9110.8 (3)
C5—C4—C7121.39 (19)
O1—C1—C2—C3178.7 (2)O1—C1—C6—C5179.3 (2)
C6—C1—C2—C31.4 (3)C2—C1—C6—C50.7 (3)
C1—C2—C3—C41.2 (4)C4—C5—C6—C10.2 (3)
C2—C3—C4—C50.4 (4)C5—C4—C7—C8106.5 (3)
C2—C3—C4—C7178.8 (2)C3—C4—C7—C871.9 (3)
C3—C4—C5—C60.3 (3)C5—C4—C7—C9129.2 (3)
C7—C4—C5—C6178.1 (2)C3—C4—C7—C952.4 (3)
(4ip300) '4-Isopropyl-phenol' top
Crystal data top
C9H12OF(000) = 296
Mr = 136.19Dx = 1.103 Mg m3
Tetragonal, P41Mo Kα radiation, λ = 0.71073 Å
a = 9.928 (1) ŵ = 0.07 mm1
c = 8.316 (1) ÅT = 293 K
V = 820.16 (15) Å3Prism, colourless
Z = 41.02 × 0.51 × 0.36 mm
Data collection top
Radiation source: fine-focus sealed tubeRint = 0.045
Graphite monochromatorθmax = 31.3°, θmin = 3.8°
ω scansh = 1414
4448 measured reflectionsk = 1414
1519 independent reflectionsl = 128
1049 reflections with I > 2σ(I)
Refinement top
Refinement on F2Hydrogen site location: inferred from neighbouring sites
Least-squares matrix: fullH atoms treated by a mixture of independent and constrained refinement
R[F2 > 2σ(F2)] = 0.060Calculated w = 1/[σ2(Fo2) + (0.105P)2 + 0.0244P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.184(Δ/σ)max = 0.001
S = 1.10Δρmax = 0.22 e Å3
1519 reflectionsΔρmin = 0.19 e Å3
90 parametersExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
1 restraintExtinction coefficient: 0.34 (5)
Primary atom site location: structure-invariant direct methodsAbsolute structure: Flack H D (1983), Acta Cryst. A39, 876-881
Secondary atom site location: difference Fourier mapAbsolute structure parameter: 2 (2)
Crystal data top
C9H12OZ = 4
Mr = 136.19Mo Kα radiation
Tetragonal, P41µ = 0.07 mm1
a = 9.928 (1) ÅT = 293 K
c = 8.316 (1) Å1.02 × 0.51 × 0.36 mm
V = 820.16 (15) Å3
Data collection top
4448 measured reflections1049 reflections with I > 2σ(I)
1519 independent reflectionsRint = 0.045
Refinement top
R[F2 > 2σ(F2)] = 0.060H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.184Δρmax = 0.22 e Å3
S = 1.10Δρmin = 0.19 e Å3
1519 reflectionsAbsolute structure: Flack H D (1983), Acta Cryst. A39, 876-881
90 parametersAbsolute structure parameter: 2 (2)
1 restraint
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O10.86515 (18)0.01214 (18)0.0786 (2)0.0575 (5)
H10.90210.04470.00050.086*
C10.7387 (2)0.0668 (2)0.0953 (3)0.0478 (5)
C20.6590 (3)0.0192 (3)0.2194 (3)0.0557 (6)
H20.69080.04870.28640.067*
C30.5325 (3)0.0726 (3)0.2436 (3)0.0586 (7)
H30.48070.04150.32900.070*
C40.4805 (3)0.1717 (3)0.1435 (3)0.0533 (6)
C50.5615 (3)0.2172 (3)0.0196 (3)0.0546 (6)
H50.52930.28390.04890.066*
C60.6898 (3)0.1657 (2)0.0047 (3)0.0518 (6)
H60.74270.19800.08850.062*
C70.3422 (3)0.2295 (3)0.1716 (4)0.0668 (8)
H70.32030.28690.07950.080*
C80.3406 (3)0.3181 (4)0.3223 (5)0.1138 (17)
H8A0.25190.35430.33770.171*
H8B0.40380.39050.30960.171*
H8C0.36520.26500.41430.171*
C90.2355 (3)0.1205 (4)0.1817 (5)0.0939 (12)
H9A0.14890.16110.19900.141*
H9B0.25590.06110.26950.141*
H9C0.23410.07030.08310.141*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0513 (10)0.0594 (10)0.0619 (11)0.0041 (7)0.0054 (8)0.0110 (8)
C10.0499 (12)0.0472 (11)0.0462 (11)0.0018 (9)0.0008 (9)0.0011 (9)
C20.0562 (13)0.0546 (13)0.0564 (13)0.0018 (10)0.0014 (11)0.0138 (11)
C30.0563 (13)0.0664 (16)0.0533 (13)0.0009 (11)0.0079 (11)0.0169 (12)
C40.0516 (12)0.0564 (13)0.0519 (13)0.0033 (10)0.0002 (10)0.0050 (11)
C50.0575 (14)0.0562 (13)0.0501 (12)0.0020 (10)0.0016 (10)0.0123 (10)
C60.0548 (13)0.0550 (13)0.0455 (11)0.0027 (9)0.0039 (10)0.0081 (10)
C70.0576 (14)0.0823 (19)0.0603 (15)0.0151 (13)0.0055 (12)0.0165 (14)
C80.108 (3)0.135 (4)0.098 (3)0.050 (3)0.004 (3)0.024 (3)
C90.0555 (17)0.122 (3)0.104 (3)0.0084 (19)0.0066 (18)0.037 (2)
Geometric parameters (Å, º) top
O1—C11.375 (3)C4—C51.383 (4)
C1—C61.375 (3)C4—C71.506 (4)
C1—C21.384 (3)C5—C61.387 (4)
C2—C31.378 (4)C7—C91.517 (5)
C3—C41.388 (3)C7—C81.532 (5)
O1—C1—C6122.9 (2)C3—C4—C7121.1 (2)
O1—C1—C2117.5 (2)C4—C5—C6121.4 (2)
C6—C1—C2119.5 (2)C1—C6—C5120.0 (2)
C3—C2—C1119.9 (2)C4—C7—C9111.9 (3)
C2—C3—C4121.6 (2)C4—C7—C8110.8 (3)
C5—C4—C3117.5 (2)C9—C7—C8111.0 (3)
C5—C4—C7121.4 (2)
O1—C1—C2—C3178.6 (3)O1—C1—C6—C5179.5 (2)
C6—C1—C2—C31.1 (4)C2—C1—C6—C50.2 (4)
C1—C2—C3—C41.6 (5)C4—C5—C6—C10.2 (4)
C2—C3—C4—C51.2 (4)C5—C4—C7—C9127.9 (3)
C2—C3—C4—C7179.8 (3)C3—C4—C7—C953.6 (4)
C3—C4—C5—C60.3 (4)C5—C4—C7—C8107.7 (3)
C7—C4—C5—C6178.9 (3)C3—C4—C7—C870.9 (4)

Experimental details

(ipp95dc)(4ip180)(4ip300)
Crystal data
Chemical formulaC9H12OC9H12OC9H12O
Mr136.19136.19136.19
Crystal system, space groupTetragonal, P41Tetragonal, P41Tetragonal, P41
Temperature (K)95180293
a, c (Å)9.848 (3), 8.166 (2)9.859 (2), 8.221 (1)9.928 (1), 8.316 (1)
V3)793.3 (4)799.6 (2)820.16 (15)
Z444
Radiation typeMo KαMo KαMo Kα
µ (mm1)0.070.070.07
Crystal size (mm)0.72 × 0.44 × 0.291.02 × 0.51 × 0.361.02 × 0.51 × 0.36
Data collection
DiffractometerKuma Diffraction KM4CCD
diffractometer
Kuma Diffraction KM4CCD
diffractometer
?
Absorption correction
No. of measured, independent and
observed [I > 2σ(I)] reflections
5936, 2162, 2018 4181, 1453, 1281 4448, 1519, 1049
Rint0.0640.0420.045
(sin θ/λ)max1)0.7280.7320.731
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.060, 0.150, 1.09 0.059, 0.168, 1.20 0.060, 0.184, 1.10
No. of reflections216214531519
No. of parameters929390
No. of restraints111
H-atom treatmentH atoms treated by a mixture of independent and constrained refinementH atoms treated by a mixture of independent and constrained refinementH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)0.29, 0.450.34, 0.400.22, 0.19
Absolute structureFlack H D (1983), Acta Cryst. A39, 876-881Flack H D (1983), Acta Cryst. A39, 876-881Flack H D (1983), Acta Cryst. A39, 876-881
Absolute structure parameter2.1 (18)0 (2)2 (2)

Computer programs: Kuma KM4CCD Software, 1999, SHELXS97 (Sheldrick, 1997a), SHELXL97 (Sheldrick, 1997b), ORTEP-3 (Farrugia, 1997).

 

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