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The perfection of two commercial top-grade quartz crystal wafers has been investigated using Bragg reflection at θB = 89.77° of a 2.0 meV bandwidth beam of 9.979 keV X-rays by the (7\bar4\bar34) lattice planes. Topographic images show small defect concentrations (≤5 cm−2). Energy scan widths are below 3 meV over 8 mm × 8 mm areas and 4 meV over the whole wafer (∼11 cm2). This suggests that quartz can be a useful optical material.

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