Download citation
Download citation
link to html
Convergent-beam electron diffraction (CBED) is one of the most popular techniques to measure crystal thickness. The traditional measurement involves linear fitting of several fringes across the CBED disc, but for a thin crystal with fewer than three fringes the usefulness of this method will be limited. CBED Tools, a free plugin for the DigitalMicrograph software, provides a fast (∼1–2 min) and accurate algorithm to measure the crystal thickness on the basis of the linear fitting method, but it is also capable of determining the crystal thickness when it is very thin and only one fringe or part of the first fringe is recorded. CBED Tools can also be utilized to handle the severely distorted CBED pattern obtained when the zero-order Laue zone Kikuchi lines overlap with the fringes.

Supporting information

pdf

Portable Document Format (PDF) file https://doi.org/10.1107/S1600576716019476/ks5536sup1.pdf
Thickness measurements of four experimental CBED patterns and the simulated pattern

txt

Text file https://doi.org/10.1107/S1600576716019476/ks5536sup2.txt
Source code of thickness measurement (to run it in DigitalMicrograph, the file extension should be changed to *.s)


Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds