In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation

In situ tensile tests have been carried out under synchrotron radiation on supported gold (Au) thin films exhibiting a pronounced crystallographic texture. The 2θ shift of X-ray diffraction lines has been recorded for different specimen orientations and several loading levels in the elastic domain. The data obtained demonstrate the large strain heterogeneities generated within the specimen because of the intergranular interactions associated with the large elastic anisotropy of Au grains. To interpret these results, the use of a multi-scale micromechanical approach is unavoidable. The theoretical background of such methods is described, and the points where exact results can be obtained and where approximations have to be introduced are highlighted. It is shown that the Vook–Witt model, for which a general formulation is provided, is the exact solution for polycrystals exhibiting a laminate microstructure, which is a significant departure from the standard thin-film microstructures. Among several standard models used in the field, the self-consistent model is the only one that reproduces the experimental data correctly. This is achieved by accounting for the actual crystallographic texture of the specimen, and assuming pancake-shaped two-point statistics for the morphological texture. A discussion of the limitations of this approach, originally developed for bulk materials, is given for the specific case of thin films.