Characterization of Static Disorder by Cumulant Analysis of EXAFS: an Investigation on a Two-Gaussian Distribution

The EXAFS of a two-Gaussian distribution is simulated. It is shown that the cumulant analysis of an EXAFS signal in the case of static disorder allows the reconstruction of the corresponding asymmetric interatomic distance distribution by the splice method. In addition, the relationships between the parameters of two Gaussians and the leading cumulants of their superposition are derived. The possibility of determining the parameters of the two Gaussians by analytical means is investigated.