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Synchrotron radiation diffraction data have been collected at 200 K on a microscopic single crystal (dimensions 12 × 10 × 2 µm) of the title compound, where BEDT-TTF is bis(ethylenedithio)tetrathiafulvalene, C10H8S8. The quality of the diffraction data allowed a full structure refinement and enabled the determination of structural details such as the conformations of the ethylene groups as well as the occupancy of the triiodide sites. The compound was found to be slightly iodine-deficient and better described as βCO-(BEDT-TTF)2I3−x [x = 0.014 (3)]. One of the ethylene groups of the BEDT-TTF cation is disordered at this temperature and exists in two distinct conformations with occupancies which are identical within the standard uncertainty.

Supporting information

cif

Crystallographic Information File (CIF)
Contains datablock beta

fcf

Structure factor file (CIF format)
Contains datablock beta

CCDC reference: 134772

Computing details top

Cell refinement: DENZO (Otwinoski & Minor, 1993); data reduction: DENZO (Otwinoski & Minor, 1993) & CCP4 (SCALA (Evans, 1997)); program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEP (Johnson, 1976).

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
beta-co-(bis(ethylenedithio)tetrathiafulvalene)2 triiodide top
Crystal data top
C10H8S8·1.5IZ = 2
Mr = 574.99F(000) = 551
Triclinic, P1Dx = 2.276 Mg m3
a = 6.585 ÅSynchrotron radiation, λ = 0.68870 Å
b = 9.038 ÅCell parameters from 896 reflections
c = 15.205 Åθ = 2.8–24.9°
α = 94.90°µ = 3.81 mm1
β = 95.74°T = 200 K
γ = 110.00°Plate, brown
V = 839.1 Å30.01 × 0.01 × 0.002 mm
Data collection top
Princeton CCD (1024x1024 pixels)
diffractometer
2746 reflections with I > 2σ(I)
Radiation source: European Synchrotron Radiation FacilityRint = 0.032
Si(111) monochromatorθmax = 27.3°, θmin = 3.2°
ϕ scansh = 87
13912 measured reflectionsk = 1111
3230 independent reflectionsl = 020
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.037Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.081H atoms treated by a mixture of independent and constrained refinement
S = 1.08 w = 1/[σ2(Fo2) + (0.0097P)2 + 5.7148P]
where P = (Fo2 + 2Fc2)/3
3230 reflections(Δ/σ)max = 0.002
198 parametersΔρmax = 2.28 e Å3
20 restraintsΔρmin = 1.72 e Å3
Crystal data top
C10H8S8·1.5Iγ = 110.00°
Mr = 574.99V = 839.1 Å3
Triclinic, P1Z = 2
a = 6.585 ÅSynchrotron radiation, λ = 0.68870 Å
b = 9.038 ŵ = 3.81 mm1
c = 15.205 ÅT = 200 K
α = 94.90°0.01 × 0.01 × 0.002 mm
β = 95.74°
Data collection top
Princeton CCD (1024x1024 pixels)
diffractometer
2746 reflections with I > 2σ(I)
13912 measured reflectionsRint = 0.032
3230 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.03720 restraints
wR(F2) = 0.081H atoms treated by a mixture of independent and constrained refinement
S = 1.08Δρmax = 2.28 e Å3
3230 reflectionsΔρmin = 1.72 e Å3
198 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
I10.00000.00000.00000.03994 (17)0.986 (3)
I20.40573 (8)0.25157 (6)0.01721 (3)0.05150 (16)0.986 (3)
S10.0963 (2)0.14611 (17)0.43081 (8)0.0288 (3)
S20.4627 (2)0.26148 (17)0.44813 (8)0.0263 (3)
S30.2085 (3)0.0071 (2)0.27059 (10)0.0392 (4)
S40.6385 (3)0.1389 (2)0.28793 (10)0.0394 (4)
S50.2814 (2)0.43049 (16)0.61967 (7)0.0249 (3)
S60.0835 (2)0.31358 (17)0.59826 (7)0.0256 (3)
S70.1971 (2)0.54159 (18)0.79329 (8)0.0322 (3)
S80.2374 (2)0.39674 (18)0.76841 (8)0.0322 (3)
C10.2268 (8)0.2543 (6)0.4878 (3)0.0217 (10)
C20.2721 (8)0.1055 (6)0.3496 (3)0.0237 (11)
C30.4092 (8)0.0204 (8)0.1965 (3)0.0376 (14)
H3A0.34780.08340.14720.045*
H3B0.42650.12260.16190.045*
C40.6299 (9)0.0335 (6)0.2389 (4)0.0350 (13)
H4A0.68960.13470.29000.042*
H4B0.73930.05590.18920.042*
C50.4378 (9)0.1576 (6)0.3580 (3)0.0251 (11)
C60.1496 (8)0.3259 (6)0.5590 (3)0.0214 (10)
C70.1177 (8)0.4523 (6)0.7054 (3)0.0205 (10)
C8A0.0351 (15)0.5828 (13)0.8529 (8)0.030 (3)0.490 (17)
H8A0.16890.68170.81600.036*0.49
H8B0.00570.61680.91690.036*0.49
C9A0.106 (2)0.4432 (14)0.8670 (5)0.031 (3)0.490 (17)
H9A0.03570.34050.89420.037*0.49
H9B0.21680.46490.91610.037*0.49
C8B0.0429 (15)0.4891 (17)0.8747 (5)0.038 (4)0.510 (17)
H8C0.05940.54810.93240.046*0.51
H8D0.11460.36280.89560.046*0.51
C9B0.1946 (15)0.5298 (13)0.8437 (8)0.032 (3)0.510 (17)
H9C0.27850.52280.90060.039*0.51
H9D0.26230.65020.81060.039*0.51
C100.0491 (8)0.3979 (6)0.6958 (3)0.0210 (10)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
I10.0487 (4)0.0416 (3)0.0244 (2)0.0114 (3)0.0044 (2)0.0068 (2)
I20.0598 (3)0.0495 (3)0.0365 (2)0.0067 (2)0.00794 (19)0.01076 (18)
S10.0301 (9)0.0439 (8)0.0255 (6)0.0239 (6)0.0136 (5)0.0174 (5)
S20.0231 (8)0.0416 (8)0.0224 (5)0.0181 (6)0.0075 (4)0.0144 (5)
S30.0381 (10)0.0571 (10)0.0433 (8)0.0318 (8)0.0224 (6)0.0355 (7)
S40.0401 (10)0.0586 (10)0.0416 (7)0.0337 (8)0.0273 (7)0.0305 (7)
S50.0244 (8)0.0399 (8)0.0181 (5)0.0188 (6)0.0060 (4)0.0105 (5)
S60.0246 (8)0.0415 (8)0.0195 (5)0.0197 (6)0.0070 (4)0.0118 (5)
S70.0349 (9)0.0502 (9)0.0230 (6)0.0250 (7)0.0089 (5)0.0182 (5)
S80.0327 (9)0.0481 (9)0.0293 (6)0.0240 (7)0.0180 (5)0.0198 (6)
C10.023 (3)0.030 (3)0.0167 (19)0.014 (2)0.0044 (17)0.0073 (17)
C20.021 (3)0.036 (3)0.021 (2)0.014 (2)0.0085 (18)0.0151 (19)
C30.037 (4)0.054 (4)0.032 (3)0.023 (3)0.014 (2)0.020 (3)
C40.029 (4)0.039 (3)0.039 (3)0.010 (3)0.013 (2)0.018 (2)
C50.025 (3)0.035 (3)0.022 (2)0.014 (2)0.0095 (18)0.0120 (19)
C60.020 (3)0.034 (3)0.0171 (19)0.016 (2)0.0044 (17)0.0073 (18)
C70.020 (3)0.027 (3)0.0148 (19)0.008 (2)0.0015 (16)0.0081 (17)
C8A0.027 (8)0.036 (7)0.031 (6)0.011 (6)0.010 (5)0.021 (5)
C9A0.044 (10)0.031 (8)0.025 (5)0.017 (7)0.014 (5)0.015 (5)
C8B0.031 (7)0.065 (12)0.021 (5)0.018 (7)0.008 (4)0.014 (5)
C9B0.031 (6)0.022 (7)0.043 (6)0.002 (5)0.016 (5)0.018 (5)
C100.022 (3)0.027 (3)0.0155 (19)0.008 (2)0.0067 (17)0.0074 (17)
Geometric parameters (Å, º) top
I1—I2i2.9089 (8)S8—C9A1.808 (5)
I1—I22.9089 (8)C1—C61.361 (6)
S1—C11.737 (5)C2—C51.327 (7)
S1—C21.753 (5)C3—C41.491 (7)
S2—C11.741 (5)C3—H3A1.0800
S2—C51.752 (5)C3—H3B1.0800
S3—C21.747 (5)C4—H4A1.0800
S3—C31.800 (4)C4—H4B1.0800
S4—C51.752 (5)C7—C101.349 (7)
S4—C41.799 (4)C8A—C9A1.494 (7)
S5—C61.746 (5)C8A—H8A1.0800
S5—C71.755 (5)C8A—H8B1.0800
S6—C61.736 (5)C9A—H9A1.0800
S6—C101.754 (4)C9A—H9B1.0800
S7—C71.744 (4)C8B—C9B1.495 (7)
S7—C8A1.801 (5)C8B—H8C1.0800
S7—C8B1.808 (5)C8B—H8D1.0800
S8—C101.743 (5)C9B—H9C1.0800
S8—C9B1.800 (5)C9B—H9D1.0800
I2i—I1—I2180.0C1—C6—S6122.0 (4)
C1—S1—C295.3 (2)C1—C6—S5122.8 (4)
C1—S2—C594.8 (2)S6—C6—S5115.1 (2)
C2—S3—C3102.8 (2)C10—C7—S7128.6 (3)
C5—S4—C499.6 (2)C10—C7—S5117.0 (3)
C6—S5—C795.1 (2)S7—C7—S5114.4 (3)
C6—S6—C1095.3 (2)C9A—C8A—S7112.3 (7)
C7—S7—C8A101.4 (4)C9A—C8A—H8A109.2
C7—S7—C8B98.7 (4)S7—C8A—H8A109.2
C8A—S7—C8B27.0 (5)C9A—C8A—H8B109.1
C10—S8—C9B101.3 (4)S7—C8A—H8B109.1
C10—S8—C9A99.6 (4)H8A—C8A—H8B107.9
C9B—S8—C9A26.4 (4)C8A—C9A—S8115.3 (7)
C6—C1—S1121.7 (4)C8A—C9A—H9A108.4
C6—C1—S2123.1 (4)S8—C9A—H9A108.4
S1—C1—S2115.2 (2)C8A—C9A—H9B108.4
C5—C2—S3129.0 (4)S8—C9A—H9B108.4
C5—C2—S1116.8 (3)H9A—C9A—H9B107.5
S3—C2—S1114.2 (3)C9B—C8B—S7115.5 (7)
C4—C3—S3116.1 (3)C9B—C8B—H8C108.4
C4—C3—H3A108.3S7—C8B—H8C108.4
S3—C3—H3A108.3C9B—C8B—H8D108.4
C4—C3—H3B108.3S7—C8B—H8D108.4
S3—C3—H3B108.3H8C—C8B—H8D107.5
H3A—C3—H3B107.4C8B—C9B—S8111.0 (7)
C3—C4—S4114.6 (4)C8B—C9B—H9C109.4
C3—C4—H4A108.6S8—C9B—H9C109.4
S4—C4—H4A108.6C8B—C9B—H9D109.4
C3—C4—H4B108.6S8—C9B—H9D109.4
S4—C4—H4B108.6H9C—C9B—H9D108.0
H4A—C4—H4B107.6C7—C10—S8128.9 (3)
C2—C5—S2117.9 (3)C7—C10—S6116.9 (3)
C2—C5—S4128.0 (4)S8—C10—S6114.2 (3)
S2—C5—S4114.2 (3)
C2—S1—C1—C6176.7 (5)C8A—S7—C7—C1012.7 (7)
C2—S1—C1—S24.2 (3)C8B—S7—C7—C1014.6 (7)
C5—S2—C1—C6176.8 (5)C8A—S7—C7—S5167.9 (5)
C5—S2—C1—S14.0 (3)C8B—S7—C7—S5164.8 (5)
C3—S3—C2—C55.1 (6)C6—S5—C7—C104.1 (5)
C3—S3—C2—S1177.9 (3)C6—S5—C7—S7175.4 (3)
C1—S1—C2—C52.7 (5)C7—S7—C8A—C9A47.3 (9)
C1—S1—C2—S3179.9 (3)C8B—S7—C8A—C9A39.6 (8)
C2—S3—C3—C435.9 (5)S7—C8A—C9A—S872.0 (13)
S3—C3—C4—S465.6 (6)C10—S8—C9A—C8A49.5 (10)
C5—S4—C4—C354.2 (4)C9B—S8—C9A—C8A46.7 (9)
S3—C2—C5—S2177.3 (3)C7—S7—C8B—C9B51.7 (10)
S1—C2—C5—S20.3 (6)C8A—S7—C8B—C9B46.3 (8)
S3—C2—C5—S43.9 (9)S7—C8B—C9B—S873.9 (13)
S1—C2—C5—S4179.1 (3)C10—S8—C9B—C8B47.9 (9)
C1—S2—C5—C22.2 (5)C9A—S8—C9B—C8B40.8 (8)
C1—S2—C5—S4176.7 (3)S7—C7—C10—S80.9 (8)
C4—S4—C5—C224.3 (6)S5—C7—C10—S8178.5 (3)
C4—S4—C5—S2156.8 (3)S7—C7—C10—S6179.9 (3)
S1—C1—C6—S60.3 (7)S5—C7—C10—S60.5 (6)
S2—C1—C6—S6178.8 (3)C9B—S8—C10—C713.9 (7)
S1—C1—C6—S5178.1 (3)C9A—S8—C10—C712.8 (7)
S2—C1—C6—S51.0 (7)C9B—S8—C10—S6167.0 (5)
C10—S6—C6—C1170.3 (5)C9A—S8—C10—S6166.2 (5)
C10—S6—C6—S57.6 (3)C6—S6—C10—C74.9 (5)
C7—S5—C6—C1170.5 (5)C6—S6—C10—S8174.3 (3)
C7—S5—C6—S67.4 (3)
Symmetry code: (i) x, y, z.

Experimental details

Crystal data
Chemical formulaC10H8S8·1.5I
Mr574.99
Crystal system, space groupTriclinic, P1
Temperature (K)200
a, b, c (Å)6.585, 9.038, 15.205
α, β, γ (°)94.90, 95.74, 110.00
V3)839.1
Z2
Radiation typeSynchrotron, λ = 0.68870 Å
µ (mm1)3.81
Crystal size (mm)0.01 × 0.01 × 0.002
Data collection
DiffractometerPrinceton CCD (1024x1024 pixels)
diffractometer
Absorption correction
No. of measured, independent and
observed [I > 2σ(I)] reflections
13912, 3230, 2746
Rint0.032
(sin θ/λ)max1)0.667
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.037, 0.081, 1.08
No. of reflections3230
No. of parameters198
No. of restraints20
H-atom treatmentH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)2.28, 1.72

Computer programs: , DENZO (Otwinoski & Minor, 1993) & CCP4 (SCALA (Evans, 1997)), SHELXS97 (Sheldrick, 1990), SHELXL97 (Sheldrick, 1997), ORTEP (Johnson, 1976).

 
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