Download citation
Download citation
link to html
The title compound, C22H22Si, is a benzosilacyclo­pentene in which the silacyclo­pentene ring assumes an envelope conformation. The Si atom is displaced by 0.722 (4) Å from the mean plane of the four C atoms, and is bonded to two methyl groups and to two Csp3 atoms in the silacyclo­pentene ring. One phenyl ring is attached to each of these two C atoms in a cis configuration. The Si atom and the two methyl groups lie on a crystallographic mirror plane which relates the two halves of the molecule. The average Si-Cmeth­yl bond distance is 1.852 (3) Å. The Si-Csp3 bond distance is 1.886 (2) Å, and the corresponding Csp3-Si-Csp3 angle is 93.0 (1)°. The displacement ellipsoids for the atoms in the fused benzene ring suggest a probable disorder, but no satisfactory disorder model could be found.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807030620/fj2035sup1.cif
Contains datablocks global, 3

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807030620/fj20353sup2.hkl
Contains datablock 3

CCDC reference: 655063

Key indicators

  • Single-crystal X-ray study
  • T = 295 K
  • Mean [sigma](C-C) = 0.004 Å
  • R factor = 0.045
  • wR factor = 0.142
  • Data-to-parameter ratio = 15.6

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT128_ALERT_4_C Non-standard setting of Space group Pnma .... Pcmn PLAT230_ALERT_2_C Hirshfeld Test Diff for C3 - C4 .. 5.12 su PLAT242_ALERT_2_C Check Low Ueq as Compared to Neighbors for Si
Alert level G PLAT793_ALERT_1_G Check the Absolute Configuration of C1 = ... S
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 3 ALERT level C = Check and explain 1 ALERT level G = General alerts; check 1 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 2 ALERT type 2 Indicator that the structure model may be wrong or deficient 0 ALERT type 3 Indicator that the structure quality may be low 1 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check

Comment top

The Si atom is bonded to two methyl groups and to two Csp3 atoms in the silacyclopentene ring; one phenyl ring is attached to each of these two Csp3 atoms in the cis configuration. The Si atom and the carbon atoms of the two methyl groups lie in a crystallographic mirror plane which relates the two halves of the structure. The average Si-methyl bond distance is 1.852 (3) Å. The Si— Csp3 bond distance is 1.886 (2) Å, and the corresponding Csp3—Si—Csp3 angle is 93.0 (1) °. The silacyclopentene ring assumes an envelope conformation, with the Si atom displaced 0.722 (4) Å from the mean plane of the four carbon atoms.

This structure can be compared to one structure in the Cambridge Structural Database (Version 5.28, CONQUEST Version 1.9; Allen, 2002) having the same fused ring system, 2,2-Diphenyl-2-sila-indan (Vidal & Falgueirettes, 1973) and to one recently published structure from this laboratory,cis-1,2,2,3-tetraphenyl-2,3-dihydro-1H-benzo[c]silole (Duong et al., 2006).

The 2,2-diphenyl-2-sila-indan has hydrogen atoms on the silacyclopentene ring where the title structure has phenyl rings, and has phenyl rings on the Si where the title structure has methyl groups. The average Si— Csp3 distance is 1.886 Å, and the corresponding Csp3 —Si—Csp3 angle is 93.59°. The silacyclopentene ring assumes an envelope conformation, with the Si atom displaced 0.636 Å from the mean plane of the four carbon atoms.

The cis-1,2,2,3-tetraphenyl-2,3-dihydro-1H-benzo[c]silole has phenyl rings on the Si atom, where the title structure has methyl groups. The average Si—Csp3 distance is 1.902 (2) Å, and the corresponding Csp3—Si—Csp3 angle is 90.68 (7) Å. The silacyclopentene ring assumes an envelope conformation, with the Si atom displaced 0.953 (2) Å from the mean plane of the four carbon atoms.

Related literature top

This structure can be compared to one structure in the Cambridge Structural Database (Version 5.28, CONQUEST Version 1.9; Allen, 2002) having the same fused ring system, 2,2-diphenyl-2-silaindane (Vidal & Falgueirettes, 1973) and to one recently published structure from this laboratory, cis-1,2,2,3-tetraphenyl-2,3-dihydro-1H-2-benzosilole (Duong et al., 2006). See also Bates et al., 1981; Mataka et al., 1981; and Sato et al., 2001.

Experimental top

Compound (3) was prepared in a model reaction for the preparation of new phosphine ligands of similar structure via dicarbanions (Bates et al., 1981). The two-step synthesis is outlined below.

The first step prepares the carbon diacid, (1), by Friedel–Crafts alkylation of benzene with α,α'-dichloro-o-xylene (Mataka et al.,1981). The carbon acid is bislithiated using two equivalents of n-butyl lithium and tetramethylethylenediamine (TMEDA) to give the deep-red dicarbanion, (2) (Sato et al., 2001), which, upon reaction with diphenyldichlorosilane, gives the title compound, (3). The major isomer is the crystalline cis-isomer. The compound has been also characterized by both 1H and 13C NMR spectroscopy.

Compound (1), the precursor to the title compound, was prepared by charging a dry 250 ml two-necked round-bottomed flask, equipped with a stirrer bar, a reflux condenser and a gas inlet adapter, with α,α'-dichloro-o-xylene (50 mmol, 8.75 g), dry benzene (100 ml) and nitromethane (10 ml) under N2. Subsequently, AlCl3 (20.0 g, 150 mmol) was added to the flask. The nitrogen line was removed and replaced with a drying tube, and the mixture was allowed to react for 30 min without external heating. External heat was then applied and the mixture was refluxed overnight. The reaction was then quenched with water and the phases separated. The organic layer was dried with Na2SO4. After solvent removal under a vacuum, the residue was purified by bulb–bulb distillation (393 K, 1 Pa) Further purification was accomplished by recrystallization from isooctane (11.2 g, 87% yield; m.p. 346–347 K).

For the preparation of (3), compound (1) (0.52 g, 2.0 mmol) was placed in an oven-dried vial equipped with a stirrer bar. After purging with N2, a septum was attached. Dry degassed Et2O (15 ml) was introduced viaa syringe. A positive pressure of N2 gas was maintained as the vial was cooled to 273 K, and TMEDA (0.51 g, 4.4 mmol) followed by n-BuLi (1.61 ml, 2.74 M, solvent = hexanes, 4.4 mmol) were introduced via syringe. A deep-red color was observed almost immediately upon addition of the n-BuLi. The reaction was quenched after 30 min with dichlorodimethylsilane (0.28 g, 2.2 mmol). Saturated aqueous NH4Cl was added 30 min later. The organic layer was separated and dried with Na2SO4. It was then reduced under vacuum and purified by bulb–bulb distillation (433 K, 1 Pa) to give 0.82 g of (3) (94% yield; m.p. 375–376 K). X-ray quality crystals of (3) were obtained by recrystallization from iso-octane.

Refinement top

H atoms were constrained using a riding model. The aromatic C—H bond lengths were fixed at 0.93 Å, the methine C—H bond lengths at 0.98 Å, and the methyl C—H bond lengths at 0.96 Å, with Uiso(H) = 1.5 Ueq. (C). The orientation of the methyl groups was fixed by the location of the methyl carbons on a crystallographic mirror plane. The thermal ellipsoids for the atoms in the fused aromatic ring suggest a probable disorder, but no satisfactory disorder model could be found. Attempts to refine the structure in the equivalent non-centrosymmetric space group Pc21n gave results that were neither chemically nor crystallographically reasonable.

Structure description top

The Si atom is bonded to two methyl groups and to two Csp3 atoms in the silacyclopentene ring; one phenyl ring is attached to each of these two Csp3 atoms in the cis configuration. The Si atom and the carbon atoms of the two methyl groups lie in a crystallographic mirror plane which relates the two halves of the structure. The average Si-methyl bond distance is 1.852 (3) Å. The Si— Csp3 bond distance is 1.886 (2) Å, and the corresponding Csp3—Si—Csp3 angle is 93.0 (1) °. The silacyclopentene ring assumes an envelope conformation, with the Si atom displaced 0.722 (4) Å from the mean plane of the four carbon atoms.

This structure can be compared to one structure in the Cambridge Structural Database (Version 5.28, CONQUEST Version 1.9; Allen, 2002) having the same fused ring system, 2,2-Diphenyl-2-sila-indan (Vidal & Falgueirettes, 1973) and to one recently published structure from this laboratory,cis-1,2,2,3-tetraphenyl-2,3-dihydro-1H-benzo[c]silole (Duong et al., 2006).

The 2,2-diphenyl-2-sila-indan has hydrogen atoms on the silacyclopentene ring where the title structure has phenyl rings, and has phenyl rings on the Si where the title structure has methyl groups. The average Si— Csp3 distance is 1.886 Å, and the corresponding Csp3 —Si—Csp3 angle is 93.59°. The silacyclopentene ring assumes an envelope conformation, with the Si atom displaced 0.636 Å from the mean plane of the four carbon atoms.

The cis-1,2,2,3-tetraphenyl-2,3-dihydro-1H-benzo[c]silole has phenyl rings on the Si atom, where the title structure has methyl groups. The average Si—Csp3 distance is 1.902 (2) Å, and the corresponding Csp3—Si—Csp3 angle is 90.68 (7) Å. The silacyclopentene ring assumes an envelope conformation, with the Si atom displaced 0.953 (2) Å from the mean plane of the four carbon atoms.

This structure can be compared to one structure in the Cambridge Structural Database (Version 5.28, CONQUEST Version 1.9; Allen, 2002) having the same fused ring system, 2,2-diphenyl-2-silaindane (Vidal & Falgueirettes, 1973) and to one recently published structure from this laboratory, cis-1,2,2,3-tetraphenyl-2,3-dihydro-1H-2-benzosilole (Duong et al., 2006). See also Bates et al., 1981; Mataka et al., 1981; and Sato et al., 2001.

Computing details top

Data collection: CAD-4 EXPRESS (Enraf–Nonius, 1994); cell refinement: CAD-4 EXPRESS; data reduction: XCAD4 (Harms & Wocadlo, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997); software used to prepare material for publication: WinGX (Farrugia, 1999).

Figures top
[Figure 1] Fig. 1. View of (3) (30% probability displacement ellipsoids)
[Figure 2] Fig. 2. The reaction scheme for the formation of (3)
cis-2,2-Dimethyl-1,3-diphenyl-2,3-dihydro-1H-benzo[c]silole top
Crystal data top
C22H22SiF(000) = 672
Mr = 314.49Dx = 1.137 Mg m3
Orthorhombic, PcmnCu Kα radiation, λ = 1.54184 Å
Hall symbol: -P 2n 2acCell parameters from 20 reflections
a = 6.6298 (7) Åθ = 11.5–18.5°
b = 14.6001 (18) ŵ = 1.08 mm1
c = 18.984 (3) ÅT = 295 K
V = 1837.6 (4) Å3Prism, colorless
Z = 40.44 × 0.37 × 0.12 mm
Data collection top
Enraf–Nonius CAD-4
diffractometer
Rint = 0
non–profiled ω/2θ scansθmax = 67.4°, θmin = 4.7°
Absorption correction: analytical
(Alcock, 1970)
h = 70
Tmin = 0.667, Tmax = 0.875k = 170
1720 measured reflectionsl = 220
1720 independent reflections3 standard reflections every 60 min
1310 reflections with I > 2σ(I) intensity decay: none
Refinement top
Refinement on F2H-atom parameters constrained
Least-squares matrix: full w = 1/[σ2(Fo2) + (0.0863P)2 + 0.3313P]
where P = (Fo2 + 2Fc2)/3
R[F2 > 2σ(F2)] = 0.045(Δ/σ)max < 0.001
wR(F2) = 0.142Δρmax = 0.29 e Å3
S = 1.05Δρmin = 0.18 e Å3
1720 reflectionsExtinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
110 parametersExtinction coefficient: 0.0026 (6)
0 restraints
Crystal data top
C22H22SiV = 1837.6 (4) Å3
Mr = 314.49Z = 4
Orthorhombic, PcmnCu Kα radiation
a = 6.6298 (7) ŵ = 1.08 mm1
b = 14.6001 (18) ÅT = 295 K
c = 18.984 (3) Å0.44 × 0.37 × 0.12 mm
Data collection top
Enraf–Nonius CAD-4
diffractometer
1310 reflections with I > 2σ(I)
Absorption correction: analytical
(Alcock, 1970)
Rint = 0
Tmin = 0.667, Tmax = 0.8753 standard reflections every 60 min
1720 measured reflections intensity decay: none
1720 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0450 restraints
wR(F2) = 0.142H-atom parameters constrained
S = 1.05Δρmax = 0.29 e Å3
1720 reflectionsΔρmin = 0.18 e Å3
110 parameters
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Si1.00957 (10)0.250.13620 (4)0.0515 (3)
C50.8661 (4)0.250.21997 (15)0.0645 (8)
H5A0.72410.250.210.097*
H5B0.89990.30370.24670.097*0.5
H5C0.89990.19630.24670.097*0.5
C20.7492 (3)0.20189 (16)0.03756 (10)0.0672 (6)
C30.5952 (4)0.1549 (3)0.00241 (12)0.1027 (11)
H30.59360.09120.00220.123*
C111.0430 (5)0.00202 (19)0.10173 (13)0.0865 (8)
H111.15730.01010.07490.104*
C10.9257 (3)0.15629 (15)0.07440 (10)0.0622 (5)
H11.03250.14930.03910.075*
C61.2841 (4)0.250.15403 (18)0.0797 (10)
H6A1.35650.250.11020.12*
H6B1.31910.19630.18060.12*0.5
H6C1.31910.30370.18060.12*0.5
C120.8956 (4)0.06378 (16)0.10762 (11)0.0712 (6)
C80.7113 (7)0.0404 (2)0.18266 (18)0.1241 (14)
H80.59940.05290.21060.149*
C90.8601 (8)0.1040 (2)0.17542 (16)0.1250 (15)
H90.84910.16020.19830.15*
C70.7269 (5)0.04360 (18)0.14819 (16)0.0995 (10)
H70.62370.08640.15240.119*
C101.0243 (6)0.0860 (2)0.13505 (16)0.1103 (12)
H101.12440.130.12980.132*
C40.4468 (4)0.2028 (3)0.03172 (13)0.145 (2)
H40.3450.17120.05510.174*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Si0.0357 (4)0.0655 (5)0.0534 (4)00.0025 (3)0
C50.0529 (16)0.0787 (19)0.0620 (16)00.0082 (13)0
C20.0436 (10)0.1097 (15)0.0484 (9)0.0059 (10)0.0059 (8)0.0133 (10)
C30.0616 (14)0.178 (3)0.0687 (14)0.0240 (18)0.0050 (12)0.0470 (17)
C110.100 (2)0.0879 (17)0.0718 (15)0.0113 (15)0.0050 (13)0.0105 (13)
C10.0487 (10)0.0772 (13)0.0607 (11)0.0013 (10)0.0120 (8)0.0116 (10)
C60.0421 (15)0.129 (3)0.0677 (18)00.0002 (13)0
C120.0781 (14)0.0706 (13)0.0648 (12)0.0078 (11)0.0143 (11)0.0193 (10)
C80.175 (4)0.0878 (19)0.109 (2)0.052 (2)0.050 (2)0.0214 (17)
C90.224 (5)0.0742 (17)0.0771 (17)0.025 (2)0.005 (2)0.0094 (15)
C70.110 (2)0.0760 (15)0.113 (2)0.0233 (15)0.0435 (18)0.0219 (15)
C100.165 (4)0.0845 (19)0.0815 (18)0.020 (2)0.008 (2)0.0071 (15)
C40.0609 (14)0.314 (8)0.0594 (13)0.028 (2)0.0092 (10)0.036 (2)
Geometric parameters (Å, º) top
Si—C61.851 (3)C1—C121.504 (3)
Si—C51.853 (3)C1—H10.98
Si—C11.886 (2)C6—H6A0.96
Si—C1i1.886 (2)C6—H6B0.96
C5—H5A0.96C6—H6C0.96
C5—H5B0.96C12—C71.390 (3)
C5—H5C0.96C8—C91.362 (5)
C2—C31.400 (3)C8—C71.394 (4)
C2—C2i1.405 (5)C8—H80.93
C2—C11.517 (3)C9—C101.357 (5)
C3—C41.370 (5)C9—H90.93
C3—H30.93C7—H70.93
C11—C121.375 (3)C10—H100.93
C11—C101.385 (4)C4—C4i1.380 (9)
C11—H110.93C4—H40.93
C6—Si—C5110.35 (15)Si—C1—H1106.7
C6—Si—C1113.80 (9)Si—C6—H6A109.5
C5—Si—C1112.48 (9)Si—C6—H6B109.5
C6—Si—C1i113.80 (9)H6A—C6—H6B109.5
C5—Si—C1i112.48 (9)Si—C6—H6C109.5
C1—Si—C1i93.00 (14)H6A—C6—H6C109.5
Si—C5—H5A109.5H6B—C6—H6C109.5
Si—C5—H5B109.5C11—C12—C7118.0 (2)
H5A—C5—H5B109.5C11—C12—C1120.0 (2)
Si—C5—H5C109.5C7—C12—C1122.0 (2)
H5A—C5—H5C109.5C9—C8—C7119.9 (3)
H5B—C5—H5C109.5C9—C8—H8120
C3—C2—C2i119.36 (19)C7—C8—H8120
C3—C2—C1124.6 (3)C10—C9—C8120.3 (3)
C2i—C2—C1116.03 (12)C10—C9—H9119.8
C4—C3—C2120.0 (4)C8—C9—H9119.8
C4—C3—H3120C12—C7—C8120.4 (3)
C2—C3—H3120C12—C7—H7119.8
C12—C11—C10121.2 (3)C8—C7—H7119.8
C12—C11—H11119.4C9—C10—C11120.1 (3)
C10—C11—H11119.4C9—C10—H10119.9
C12—C1—C2119.02 (18)C11—C10—H10119.9
C12—C1—Si115.46 (14)C3—C4—C4i120.7 (2)
C2—C1—Si101.29 (14)C3—C4—H4119.7
C12—C1—H1106.7C4i—C4—H4119.7
C2—C1—H1106.7
Symmetry code: (i) x, y+1/2, z.

Experimental details

Crystal data
Chemical formulaC22H22Si
Mr314.49
Crystal system, space groupOrthorhombic, Pcmn
Temperature (K)295
a, b, c (Å)6.6298 (7), 14.6001 (18), 18.984 (3)
V3)1837.6 (4)
Z4
Radiation typeCu Kα
µ (mm1)1.08
Crystal size (mm)0.44 × 0.37 × 0.12
Data collection
DiffractometerEnraf–Nonius CAD-4
Absorption correctionAnalytical
(Alcock, 1970)
Tmin, Tmax0.667, 0.875
No. of measured, independent and
observed [I > 2σ(I)] reflections
1720, 1720, 1310
Rint0
(sin θ/λ)max1)0.599
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.045, 0.142, 1.05
No. of reflections1720
No. of parameters110
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.29, 0.18

Computer programs: CAD-4 EXPRESS (Enraf–Nonius, 1994), CAD-4 EXPRESS, XCAD4 (Harms & Wocadlo, 1995), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEP-3 for Windows (Farrugia, 1997), WinGX (Farrugia, 1999).

 

Follow Acta Cryst. E
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds