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There are very obvious common features in the electron diffraction patterns of the λ and τ(μ) phases in the Al–Cr–Si system. The positions of the strong reflections and their intensity distributions are similar for the two structures. The relation of the reciprocal lattices of the λ and τ(μ) phases is studied. By applying the strong-reflections approach, the structure factors of τ(μ) are deduced from the corresponding structure factors of the known λ phase. Rules for selecting reflections for the strong-reflections approach are described. Similar to that of λ, the structure of τ(μ) contains six layers stacked along the c axis in each unit cell. There are 752 atoms in each unit cell, 53 of them are unique. The corresponding composition of the τ(μ) model is Al3.82 − xCrSix. Simulated electron diffraction patterns from the structure model are in good agreement with the experimental ones. The arrangement of interpenetrated icosahedral clusters in the τ(μ) phase is discussed.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768105035779/dr5007sup1.cif
Contains datablock tau-mu

fcf

Structure factor file (CIF format) https://doi.org/10.1107/S0108768105035779/dr5007sup2.fcf
Contains datablock tau-mu

Computing details top

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
[Figure 5]
[Figure 6]
[Figure 7]
(tau-mu) top
Crystal data top
Cr156Al596Z = 24
Mr = 24192.35Dx = 2.363 Mg m3
Hexagonal, P63/mmcElectrons radiation, λ = 0.0370 Å
Hall symbol: -P_6c_2cT = 293 K
a = 32.3000 ÅNeedle, black
c = 12.4000 Å0.001 × 0.0001 × 0.000005 mm
V = 11203.6 Å3
Data collection top
Philips CM12 TEM
diffractometer
k = ??
Radiation source: LaB6l = ??
h = ??
Refinement top
Crystal data top
Cr156Al596V = 11203.6 Å3
Mr = 24192.35Z = 24
Hexagonal, P63/mmcElectrons radiation, λ = 0.0370 Å
a = 32.3000 ÅT = 293 K
c = 12.4000 Å0.001 × 0.0001 × 0.000005 mm
Data collection top
Philips CM12 TEM
diffractometer
Refinement top
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Cr10.41190.20600.07240.5*
Cr20.30520.45910.25000.5*
Cr30.15510.31020.25000.5*
Cr40.15510.07750.25000.5*
Cr50.41250.58750.07240.5*
Cr60.30520.22580.25000.5*
Cr70.53850.31020.25000.5*
Cr80.53910.46090.25000.5*
Cr90.17620.20470.07240.5*
Cr100.15510.22700.25000.5*
Cr110.38400.61600.25000.5*
Cr120.23450.23330.25000.5*
Cr130.38210.23200.25000.5*
Al140.61720.38280.25000.5*
Al150.17560.35110.06910.5*
Al160.46400.23200.25000.5*
Al170.22460.30150.13490.5*
Cr180.38460.38340.25000.5*
Al190.39080.31140.25000.5*
Al200.30400.60790.25000.5*
Al210.23570.38090.25000.5*
Al220.38960.46030.25000.5*
Al230.50990.25500.06250.5*
Al240.60790.30400.13490.5*
Al250.41190.44170.06910.5*
Al260.38460.53600.25000.5*
Al270.12720.25430.06250.5*
Al280.14760.14640.25000.5*
Al290.00000.00000.25000.5*
Al300.36230.25310.05920.5*
Al310.45910.29900.13490.5*
Al320.55710.34990.06910.5*
Al330.31640.53970.13490.5*
Al340.07880.15760.13490.5*
Al350.31510.39080.13490.5*
Al360.31760.15880.13490.5*
Al370.36350.63650.05590.5*
Al380.36230.48880.06250.5*
Al390.26550.44040.07240.5*
Al400.23700.47390.25000.5*
Al410.45970.54030.13160.5*
Al420.52610.37970.25000.5*
Al430.27540.25430.05590.5*
Al440.56020.43980.07570.5*
Al450.46280.46530.25000.5*
Al470.22580.15630.13490.5*
Al480.46030.39080.13490.5*
Al490.12660.10670.05920.5*
Al500.03230.06450.06580.5*
Al510.07070.07940.25000.5*0.500
Al520.30220.30840.25000.5*
Al530.51090.48910.06900.5*
Al540.36000.33800.05900.5*

Experimental details

Crystal data
Chemical formulaCr156Al596
Mr24192.35
Crystal system, space groupHexagonal, P63/mmc
Temperature (K)293
a, c (Å)32.3000, 12.4000
V3)11203.6
Z24
Radiation typeElectrons, λ = 0.0370 Å
µ (mm1)?
Crystal size (mm)0.001 × 0.0001 × 0.000005
Data collection
DiffractometerPhilips CM12 TEM
diffractometer
Absorption correction?
No. of measured, independent and
observed (?) reflections
?, ?, ?
Rint?
Refinement
R[F2 > 2σ(F2)], wR(F2), S ?, ?, ?
No. of reflections?
No. of parameters?
No. of restraints?
Δρmax, Δρmin (e Å3)?, ?

 

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