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In the crystal structure of the title compound, C9H7NOSe, a potential anti-oxidizing agent, the whole mol­ecule lies in the (0,y,z) plane except for two methyl H atoms, whose positions are symmetry-related across that plane. A close Se...Se contact [3.359 (2) Å] is observed. There are no hydrogen bonds.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536802003422/dn6021sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536802003422/dn6021Isup2.hkl
Contains datablock I

CCDC reference: 182643

Key indicators

  • Single-crystal X-ray study
  • T = 293 K
  • Mean [sigma](C-C) = 0.008 Å
  • R factor = 0.041
  • wR factor = 0.111
  • Data-to-parameter ratio = 11.5

checkCIF results

No syntax errors found

ADDSYM reports no extra symmetry


Yellow Alert Alert Level C:
PLAT_371 Alert C Long C(sp2)-C(sp1) Bond C(8) - C(9) = 1.49 Ang. General Notes
ABSTM_02 When printed, the submitted absorption T values will be replaced by the scaled T values. Since the ratio of scaled T's is identical to the ratio of reported T values, the scaling does not imply a change to the absorption corrections used in the study. Ratio of Tmax expected/reported 0.787 Tmax scaled 0.295 Tmin scaled 0.110
0 Alert Level A = Potentially serious problem
0 Alert Level B = Potential problem
1 Alert Level C = Please check

Comment top

Some modifications of the molecular structure of Ebselen (Natterman/RP, 1981; Dupont et al., 1990), an anti-inflammatory compound, have been attempted in order to obtain a more soluble derivative which retains the pharmacological properties. The crystal structure of the title compound, (I), was determined in order to identify without ambiguity a potential antioxidant derivative. All the atomic positions, except for two H atoms of the methyl group, were refined in the plane (0,y,z) of the unit cell. All the atoms have an occupation factor of 0.5. The crystal packing is governed by van der Waals interactions. There is an Se···Sei close contact [symmetry code: (i) x, -y, 1 - z) of 3.359 (2) Å, rather less than the sum of Se atom radii (3.8 Å; Bondi, 1964). The distance is nevertheless larger than that of a covalent Se—Se bond [2.3229 (6) Å; Kumar & Nangia, 2000].

Experimental top

The synthesis of the title compound was carried out in two steps. o-Methylselenobenzoic acid was treated with α,α-dichloromethyl ether and then with KCN (Messali, 2001). A yellow single-crystal was obtained by slow evaporation of a toluene solution.

Refinement top

All H atoms were included in the refinement in the-riding model approximation, with isotropic displacement parameters fixed at 1.2Ueq of the parent atom (1.5 Ueq for methyl H atoms).

Computing details top

Data collection: DIF4 (Stoe & Cie, 1987); cell refinement: DIF4; data reduction: REDU4 (Stoe & Cie, 1987); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEPIII (Burnett & Johnson, 1996); software used to prepare material for publication: SHELXL97.

Figures top
[Figure 1] Fig. 1. The molecular structure of (I) with the atom-labelling scheme. Displacement ellipsoids are shown at the 50% probability level.
o-Methylselenobenzoyl cyanide top
Crystal data top
C9H7NOSeF(000) = 880
Mr = 224.12Dx = 1.677 Mg m3
Orthorhombic, CmcaCu Kα radiation, λ = 1.54180 Å
Hall symbol: -C 2bc 2Cell parameters from 32 reflections
a = 6.8433 (19) Åθ = 31.5–36.3°
b = 15.585 (9) ŵ = 5.31 mm1
c = 16.6460 (12) ÅT = 293 K
V = 1775.4 (12) Å3Prism, yellow
Z = 80.61 × 0.38 × 0.23 mm
Data collection top
Stoe–Siemens AED four-circle
diffractometer
624 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.000
Graphite monochromatorθmax = 67.9°, θmin = 5.3°
ω scansh = 08
Absorption correction: ψ scan
(EMPIR; Stoe & Cie, 1987)
k = 018
Tmin = 0.140, Tmax = 0.375l = 020
848 measured reflections2 standard reflections every 60 min
848 independent reflections intensity decay: 5%
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.042H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.111 w = 1/[σ2(Fo2) + (0.0712P)2 + 0.7549P]
where P = (Fo2 + 2Fc2)/3
S = 1.01(Δ/σ)max < 0.001
848 reflectionsΔρmax = 0.41 e Å3
74 parametersΔρmin = 0.34 e Å3
0 restraintsExtinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0078 (6)
Crystal data top
C9H7NOSeV = 1775.4 (12) Å3
Mr = 224.12Z = 8
Orthorhombic, CmcaCu Kα radiation
a = 6.8433 (19) ŵ = 5.31 mm1
b = 15.585 (9) ÅT = 293 K
c = 16.6460 (12) Å0.61 × 0.38 × 0.23 mm
Data collection top
Stoe–Siemens AED four-circle
diffractometer
624 reflections with I > 2σ(I)
Absorption correction: ψ scan
(EMPIR; Stoe & Cie, 1987)
Rint = 0.000
Tmin = 0.140, Tmax = 0.3752 standard reflections every 60 min
848 measured reflections intensity decay: 5%
848 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0420 restraints
wR(F2) = 0.111H atoms treated by a mixture of independent and constrained refinement
S = 1.01Δρmax = 0.41 e Å3
848 reflectionsΔρmin = 0.34 e Å3
74 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
Se10.00000.09438 (4)0.45132 (3)0.0814 (4)
O10.00000.1952 (2)0.5863 (2)0.0840 (11)
N10.00000.3958 (3)0.6510 (3)0.0974 (16)
C10.00000.2081 (3)0.4125 (3)0.0691 (12)
C20.00000.2265 (4)0.3304 (3)0.0767 (14)
H20.00000.18160.29360.092*
C30.00000.3098 (4)0.3028 (3)0.0869 (17)
H30.00000.32050.24790.104*
C40.00000.3766 (4)0.3554 (4)0.0887 (16)
H40.00000.43270.33610.106*
C50.00000.3620 (4)0.4361 (3)0.0808 (15)
H50.00000.40820.47140.097*
C60.00000.2779 (3)0.4665 (3)0.0700 (13)
C70.00000.0321 (4)0.3510 (3)0.0968 (19)
H7A0.00000.02840.36170.145*
H7B0.11450.04690.32070.145*0.50
H7C0.11450.04690.32070.145*0.50
C80.00000.2641 (4)0.5529 (3)0.0748 (14)
C90.00000.3414 (4)0.6056 (3)0.0804 (14)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Se10.1192 (6)0.0709 (5)0.0542 (4)0.0000.0000.0010 (2)
O10.111 (3)0.084 (2)0.0572 (19)0.0000.0000.0011 (17)
N10.134 (5)0.093 (3)0.066 (3)0.0000.0000.014 (2)
C10.081 (3)0.072 (3)0.055 (2)0.0000.0000.003 (2)
C20.100 (4)0.078 (3)0.052 (2)0.0000.0000.000 (2)
C30.119 (5)0.087 (3)0.054 (3)0.0000.0000.007 (2)
C40.113 (5)0.082 (3)0.071 (3)0.0000.0000.009 (3)
C50.109 (4)0.067 (3)0.066 (3)0.0000.0000.002 (2)
C60.081 (3)0.074 (3)0.055 (3)0.0000.0000.000 (2)
C70.150 (6)0.079 (3)0.062 (3)0.0000.0000.007 (3)
C80.092 (4)0.080 (4)0.052 (2)0.0000.0000.005 (2)
C90.097 (4)0.089 (3)0.056 (2)0.0000.0000.001 (3)
Geometric parameters (Å, º) top
Se1—C11.887 (5)C4—C51.362 (7)
Se1—C71.932 (5)C4—H40.9300
O1—C81.210 (7)C5—C61.405 (8)
N1—C91.135 (7)C5—H50.9300
C1—C21.398 (6)C6—C81.454 (5)
C1—C61.410 (7)C7—H7A0.9600
C2—C31.377 (8)C7—H7B0.9600
C2—H20.9300C7—H7C0.9600
C3—C41.360 (8)C8—C91.491 (8)
C3—H30.9300
C1—Se1—C7100.2 (2)C6—C5—H5119.6
C2—C1—C6117.8 (5)C5—C6—C1119.3 (4)
C2—C1—Se1121.8 (4)C5—C6—C8119.6 (5)
C6—C1—Se1120.5 (4)C1—C6—C8121.1 (5)
C3—C2—C1121.2 (5)Se1—C7—H7A109.5
C3—C2—H2119.4Se1—C7—H7B109.5
C1—C2—H2119.4H7A—C7—H7B109.5
C4—C3—C2120.6 (5)Se1—C7—H7C109.5
C4—C3—H3119.7H7A—C7—H7C109.5
C2—C3—H3119.7H7B—C7—H7C109.5
C3—C4—C5120.4 (5)O1—C8—C6125.9 (5)
C3—C4—H4119.8O1—C8—C9116.5 (4)
C5—C4—H4119.8C6—C8—C9117.6 (5)
C4—C5—C6120.8 (5)N1—C9—C8174.4 (6)
C4—C5—H5119.6

Experimental details

Crystal data
Chemical formulaC9H7NOSe
Mr224.12
Crystal system, space groupOrthorhombic, Cmca
Temperature (K)293
a, b, c (Å)6.8433 (19), 15.585 (9), 16.6460 (12)
V3)1775.4 (12)
Z8
Radiation typeCu Kα
µ (mm1)5.31
Crystal size (mm)0.61 × 0.38 × 0.23
Data collection
DiffractometerStoe–Siemens AED four-circle
diffractometer
Absorption correctionψ scan
(EMPIR; Stoe & Cie, 1987)
Tmin, Tmax0.140, 0.375
No. of measured, independent and
observed [I > 2σ(I)] reflections
848, 848, 624
Rint0.000
(sin θ/λ)max1)0.601
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.042, 0.111, 1.01
No. of reflections848
No. of parameters74
H-atom treatmentH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)0.41, 0.34

Computer programs: DIF4 (Stoe & Cie, 1987), DIF4, REDU4 (Stoe & Cie, 1987), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEPIII (Burnett & Johnson, 1996), SHELXL97.

Selected geometric parameters (Å, º) top
Se1—C11.887 (5)N1—C91.135 (7)
Se1—C71.932 (5)C6—C81.454 (5)
O1—C81.210 (7)
C1—Se1—C7100.2 (2)C6—C8—C9117.6 (5)
O1—C8—C6125.9 (5)N1—C9—C8174.4 (6)
O1—C8—C9116.5 (4)
 

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