Download citation
Download citation
link to html
In the title compound, C7H5IO, the intra­molecular bond lengths and angles are normal. Non-crystallographic Cs symmetry is broken by a 10.4 (2)° inter­planar angle between the formyl group and the aromatic plane. The shortest inter­molecular contact [I...O = 3.124 (3) Å; 0.38 Å shorter than the sum of the respective van der Waals radii] reveals the presence of a dispersive I...O attraction.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807061272/cv2365sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807061272/cv2365Isup2.hkl
Contains datablock I

CCDC reference: 673068

Key indicators

  • Single-crystal X-ray study
  • T = 200 K
  • Mean [sigma](C-C) = 0.006 Å
  • R factor = 0.025
  • wR factor = 0.049
  • Data-to-parameter ratio = 19.4

checkCIF/PLATON results

No syntax errors found



Alert level B PLAT431_ALERT_2_B Short Inter HL..A Contact I .. O .. 3.12 Ang.
Author Response: discussed as an attractive dispersive interaction between I and O.

Alert level C PLAT194_ALERT_1_C Missing _cell_measurement_reflns_used datum .... ? PLAT850_ALERT_2_C Check Flack Parameter Exact Value 0.00 and su .. 0.05
Alert level G REFLT03_ALERT_4_G Please check that the estimate of the number of Friedel pairs is correct. If it is not, please give the correct count in the _publ_section_exptl_refinement section of the submitted CIF. From the CIF: _diffrn_reflns_theta_max 27.53 From the CIF: _reflns_number_total 1614 Count of symmetry unique reflns 979 Completeness (_total/calc) 164.86% TEST3: Check Friedels for noncentro structure Estimate of Friedel pairs measured 635 Fraction of Friedel pairs measured 0.649 Are heavy atom types Z>Si present yes
0 ALERT level A = In general: serious problem 1 ALERT level B = Potentially serious problem 2 ALERT level C = Check and explain 1 ALERT level G = General alerts; check 1 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 2 ALERT type 2 Indicator that the structure model may be wrong or deficient 0 ALERT type 3 Indicator that the structure quality may be low 1 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check

Comment top

The title compound (I) was prepared as an intermediate in the synthesis of ortho-iodomandelic acid.

In the molecule, the formyl group is almost coplanar to the aromatic system but is tilted by about 10° with respect to the aromatic ring. This value is markedly smaller than the same angle in the sterically overloaded di-iodo derivative described by Matos Beja et al. (2002). The H atom of the formyl group is oriented to the I atom (Fig. 1). Bond lengths and angles are normal (Matos Beja et al., 2002).

In terms of van-der-Waals radii, the shortest intermolecular contact stems from an obviously dispersive attraction between iodine and oxygen atoms (0.38 Å less than the sum of vdW radii). Other intermolecular contacts are outside the van-der-Waals surface of the individual atoms.

Related literature top

For the synthesis of the title compound, see Angyal et al. (1949). For the crystal structure of a related compound in whi iodine atoms are present in close proximity to the formyl group, see Matos Beja et al. (2002).

Experimental top

The title compound was obtained as an intermediate in the synthesis of ortho-iodomandelic acid according to a published procedure (Angyal et al., 1949) upon decomposition of the hexamine salt of 2-iodobenzyl bromide under aqueous acidic conditions. Crystals suitable for X-ray analysis were obtained by recrystallization of the compound from boiling n-pentane.

Refinement top

All H atoms were located in a difference map and refined as riding on their parent atoms. One common isotropic displacement parameter for all H atoms was refined to 0.048 (6).

Computing details top

Data collection: CrysAlis CCD (Oxford Diffraction, 2005); cell refinement: CrysAlis RED (Oxford Diffraction, 2005); data reduction: CrysAlis RED (Oxford Diffraction, 2005); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEPIII (Burnett & Johnson, 1996); software used to prepare material for publication: PLATON (Spek, 2003).

Figures top
[Figure 1] Fig. 1. The molecular structure of (I), with atom labels and anisotropic displacement ellipsoids drawn at the 50% probability level for non-H atoms.
[Figure 2] Fig. 2. The packing of (I), viewed along [-1 0 0]. Dotted green lines denote short iodine···oxygen contacts.
2-Iodobenzaldehyde top
Crystal data top
C7H5IOF(000) = 432
Mr = 232.01Dx = 2.193 Mg m3
Orthorhombic, P212121Mo Kα radiation, λ = 0.71073 Å
Hall symbol: P 2ac 2abθ = 3.8–27.5°
a = 4.1213 (5) ŵ = 4.47 mm1
b = 11.4948 (12) ÅT = 200 K
c = 14.8310 (14) ÅPlatelet, colourless
V = 702.60 (13) Å30.29 × 0.11 × 0.04 mm
Z = 4
Data collection top
Nonius KappaCCD
diffractometer
1614 independent reflections
Radiation source: fine-focus sealed tube1486 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.050
ω–scansθmax = 27.5°, θmin = 3.8°
Absorption correction: analytical
(de Meulenaer & Tompa, 1965)
h = 52
Tmin = 0.597, Tmax = 0.866k = 1414
4122 measured reflectionsl = 1918
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.025H-atom parameters constrained
wR(F2) = 0.049 w = 1/[σ2(Fo2) + (0.0187P)2]
where P = (Fo2 + 2Fc2)/3
S = 0.98(Δ/σ)max < 0.001
1614 reflectionsΔρmax = 0.39 e Å3
83 parametersΔρmin = 0.87 e Å3
0 restraintsAbsolute structure: Flack (1983); 635 Friedel pairs
Primary atom site location: structure-invariant direct methodsAbsolute structure parameter: 0.003 (45)
Crystal data top
C7H5IOV = 702.60 (13) Å3
Mr = 232.01Z = 4
Orthorhombic, P212121Mo Kα radiation
a = 4.1213 (5) ŵ = 4.47 mm1
b = 11.4948 (12) ÅT = 200 K
c = 14.8310 (14) Å0.29 × 0.11 × 0.04 mm
Data collection top
Nonius KappaCCD
diffractometer
1614 independent reflections
Absorption correction: analytical
(de Meulenaer & Tompa, 1965)
1486 reflections with I > 2σ(I)
Tmin = 0.597, Tmax = 0.866Rint = 0.050
4122 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.025H-atom parameters constrained
wR(F2) = 0.049Δρmax = 0.39 e Å3
S = 0.98Δρmin = 0.87 e Å3
1614 reflectionsAbsolute structure: Flack (1983); 635 Friedel pairs
83 parametersAbsolute structure parameter: 0.003 (45)
0 restraints
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
I0.20356 (6)0.15824 (2)0.674261 (19)0.02777 (8)
O0.4098 (8)0.1724 (3)0.6713 (2)0.0490 (9)
C10.2202 (11)0.0923 (3)0.6618 (3)0.0324 (9)
H10.12750.05860.71430.048 (6)*
C20.1259 (10)0.0447 (4)0.5732 (3)0.0241 (9)
C30.0529 (10)0.0579 (3)0.5630 (3)0.0241 (9)
C40.1329 (10)0.0984 (4)0.4781 (3)0.0295 (10)
H40.25120.16880.47170.048 (6)*
C50.0413 (11)0.0367 (4)0.4026 (3)0.0353 (11)
H50.09730.06480.34450.048 (6)*
C60.1309 (11)0.0655 (4)0.4108 (3)0.0328 (11)
H60.18900.10860.35860.048 (6)*
C70.2193 (11)0.1051 (3)0.4958 (3)0.0298 (9)
H70.34460.17410.50140.048 (6)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
I0.02795 (13)0.02990 (12)0.02547 (12)0.00281 (11)0.00231 (11)0.00323 (13)
O0.064 (2)0.0406 (18)0.0419 (19)0.0213 (16)0.0052 (19)0.0156 (19)
C10.041 (2)0.0304 (19)0.025 (2)0.001 (2)0.001 (2)0.0025 (18)
C20.027 (2)0.0211 (18)0.024 (2)0.0036 (17)0.0032 (17)0.0006 (16)
C30.024 (2)0.026 (2)0.022 (2)0.0040 (17)0.0006 (18)0.0033 (18)
C40.030 (2)0.034 (2)0.025 (2)0.0001 (19)0.0025 (18)0.002 (2)
C50.037 (3)0.049 (3)0.020 (2)0.014 (2)0.0025 (19)0.004 (2)
C60.038 (3)0.036 (2)0.025 (2)0.011 (2)0.0051 (19)0.012 (2)
C70.033 (2)0.0251 (17)0.031 (2)0.005 (2)0.006 (2)0.0002 (18)
Geometric parameters (Å, º) top
I—C32.108 (4)C4—C51.377 (6)
O—C11.215 (5)C4—H40.9500
C1—C21.476 (6)C5—C61.377 (7)
C1—H10.9500C5—H50.9500
C2—C71.395 (6)C6—C71.389 (6)
C2—C31.398 (6)C6—H60.9500
C3—C41.382 (6)C7—H70.9500
I···Oi3.124 (3)
O—C1—C2123.6 (4)C3—C4—H4120.0
O—C1—H1118.2C6—C5—C4120.6 (4)
C2—C1—H1118.2C6—C5—H5119.7
C7—C2—C3118.4 (4)C4—C5—H5119.7
C7—C2—C1118.3 (4)C5—C6—C7119.6 (4)
C3—C2—C1123.2 (4)C5—C6—H6120.2
C4—C3—C2120.5 (4)C7—C6—H6120.2
C4—C3—I117.3 (3)C6—C7—C2120.7 (4)
C2—C3—I122.1 (3)C6—C7—H7119.7
C5—C4—C3120.1 (4)C2—C7—H7119.7
C5—C4—H4120.0
O—C1—C2—C710.1 (6)I—C3—C4—C5180.0 (3)
O—C1—C2—C3170.0 (4)C3—C4—C5—C60.1 (6)
C7—C2—C3—C40.4 (6)C4—C5—C6—C71.5 (6)
C1—C2—C3—C4179.8 (4)C5—C6—C7—C22.2 (7)
C7—C2—C3—I179.2 (3)C3—C2—C7—C61.3 (6)
C1—C2—C3—I0.9 (6)C1—C2—C7—C6178.6 (4)
C2—C3—C4—C51.1 (6)
Symmetry code: (i) x, y1/2, z+3/2.

Experimental details

Crystal data
Chemical formulaC7H5IO
Mr232.01
Crystal system, space groupOrthorhombic, P212121
Temperature (K)200
a, b, c (Å)4.1213 (5), 11.4948 (12), 14.8310 (14)
V3)702.60 (13)
Z4
Radiation typeMo Kα
µ (mm1)4.47
Crystal size (mm)0.29 × 0.11 × 0.04
Data collection
DiffractometerNonius KappaCCD
diffractometer
Absorption correctionAnalytical
(de Meulenaer & Tompa, 1965)
Tmin, Tmax0.597, 0.866
No. of measured, independent and
observed [I > 2σ(I)] reflections
4122, 1614, 1486
Rint0.050
(sin θ/λ)max1)0.650
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.025, 0.049, 0.98
No. of reflections1614
No. of parameters83
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.39, 0.87
Absolute structureFlack (1983); 635 Friedel pairs
Absolute structure parameter0.003 (45)

Computer programs: CrysAlis CCD (Oxford Diffraction, 2005), CrysAlis RED (Oxford Diffraction, 2005), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEPIII (Burnett & Johnson, 1996), PLATON (Spek, 2003).

Selected interatomic distances (Å) top
I···Oi3.124 (3)
Symmetry code: (i) x, y1/2, z+3/2.
 

Follow Acta Cryst. E
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds