Buy article online - an online subscription or single-article purchase is required to access this article.
Download citation
Download citation
link to html
Described here are image reconstruction optimizations for ptychographic coherent X-ray scattering data and X-ray fluorescence, which have been developed for the new fourth-generation synchrotron light source, Sirius, at the Brazilian Synchrotron Light Laboratory. The optimization strategy has been applied to the standard experimental strategy for ptychographic and fluorescence experiments on the Carnaúba beamline which involves the use of high-speed continuous scans (fly scans) for a fast acquisition time over large areas through the use of a newly proposed trajectory named the alternating linear trajectory. The scientific computing developments presented here target an efficient use of graphical processing units (GPUs) to the point where large fly-scan acquisitions can be processed in real time on a local high-performance computer. Some optimizations involving a custom fast Fourier transform implementation and use of mixed precision can be applied to other algorithms and phase-retrieval techniques, and therefore this work provides a general optimization scheme. Finally, the optimization strategy presented here has improved performance by a factor of ∼2.5 times faster when compared with non-optimized GPU implementations.

Subscribe to Journal of Applied Crystallography

The full text of this article is available to subscribers to the journal.

If you have already registered and are using a computer listed in your registration details, please email support@iucr.org for assistance.

Buy online

You may purchase this article in PDF and/or HTML formats. For purchasers in the European Community who do not have a VAT number, VAT will be added at the local rate. Payments to the IUCr are handled by WorldPay, who will accept payment by credit card in several currencies. To purchase the article, please complete the form below (fields marked * are required), and then click on `Continue'.
E-mail address* 
Repeat e-mail address* 
(for error checking) 

Format*   PDF (US $40)
   HTML (US $40)
   PDF+HTML (US $50)
In order for VAT to be shown for your country javascript needs to be enabled.

VAT number 
(non-UK EC countries only) 
Country* 
 

Terms and conditions of use
Contact us

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds