journal menuBuy article online - an online subscription or single-article purchase is required to access this article.
research papers
The powder diffraction profile obtained with a pink-beam synchrotron X-ray source is described as the convolution of a back-to-back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo-Voigt. This new function is employed for the first time in a Rietveld refinement using data collected from a single 100 ps synchrotron X-ray micropulse.
Subscribe to Journal of Applied Crystallography
