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The retrieval of a unique crystal potential from the scattering matrix 
in high-energy transmission electron diffraction is discussed. It is shown that, in general, data taken at a single orientation are not sufficient to determine all the elements of . Additional measurements with tilted incident beam are required for the determination of the whole matrix. An algorithm for the extraction of the crystal potential from the matrix measured at a single energy and thickness is presented. The limiting case of thin crystals is discussed. Several examples with simulated data are considered.
in high-energy transmission electron diffraction is discussed. It is shown that, in general, data taken at a single orientation are not sufficient to determine all the elements of . Additional measurements with tilted incident beam are required for the determination of the whole matrix. An algorithm for the extraction of the crystal potential from the matrix measured at a single energy and thickness is presented. The limiting case of thin crystals is discussed. Several examples with simulated data are considered.
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