X-ray Diffraction Structural Investigations of a Bicrystalline System by Section Topography under Conditions of Anomalous Borrmann Absorption

The problem of spherical X-ray diffraction by a bicrystalline system with a thin surface layer is theoretically considered for a Laue set-up in the case μt >> 1 under the condition of the existence of a crystal-lattice mismatch. The intensity distribution, contrast and period of the interference pattern are calculated. A method to determine the thickness and the lattice mismatch of the epitaxic or distorted surface layer of a bicrystal is suggested.