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The electronic structure of a material plays an important role in its functionality for different applications which can be probed using synchrotron-based spectroscopy techniques. Here, various cobalt-based compounds, differing in crystal structure, ligands surrounding the central metal ion and morphology, have been studied by soft X-ray absorption spectroscopy (XAS) at the Co L-edge in order to measure the effect of these parameters on the electronic structure. A careful qualitative analysis of the spectral branching ratio and relative intensities of the L3 and L2 peaks provide useful insight into the electronic properties of compounds such as CoO/Co(OH)2, CoCl2.6H2O/CoF2.4H2O, CoCl2/CoF2, Co3O4 (bulk/nano/micro). For further detailed analysis of the XAS spectra, quantitative analysis has been performed by fitting the spectral profile with simulated spectra for a number of cobalt compounds using crystal field atomic multiplet calculations.

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Portable Document Format (PDF) file https://doi.org/10.1107/S1600577515017178/rv5036sup1.pdf
Figure S1: Co 2p XAS comparison between CoO and CoCl2; and magnification of L3 edge of both compounds; Table S1: Variation in the relative peak intensity ratio and branching ratio calculation for spectra of CoO and CoCl2.


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