Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction

Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe₂ thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe₂ grains were determined to be of the order of 10⁻⁴. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe₂ layer by electron backscatter diffraction and Raman microspectroscopy.