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The structure of CaTaOAlO4 (CTAO) has been determined using X-ray powder diffraction and density functional methods in combination with 27Al MAS NMR spectroscopy. A structural phase transition occurs near room temperature in CTAO as indicated by heat-capacity measurements, lattice strain data and infrared spectroscopy. Rietveld analysis of the powder diffraction data does not indicate deviation from monoclinic symmetry C2/c. But the observed quadrupolar coupling of the Al atom is reproduced by the electronic structure calculations only in a structure with space-group symmetry P21/n, distinguished by two different Ta coordination environments. The atomic coordinates of this low-temperature structure of CTAO are obtained by computational force relaxation within the experimental unit cell determined at 170 K.
Supporting information
Crystal data top
CaTaAlO5 | V = 399.14 (2) Å3 |
Mr = 328.01 | Z = 4 |
Monoclinic, P21/n | ? radiation, λ = ? Å |
a = 6.6298 (2) Å | θ = 11.5–59.1° |
b = 8.9515 (2) Å | T = 170 K |
c = 7.3502 (1) Å | × × mm |
β = 113.792 (1)° | |
Crystal data top
CaTaAlO5 | β = 113.792 (1)° |
Mr = 328.01 | V = 399.14 (2) Å3 |
Monoclinic, P21/n | Z = 4 |
a = 6.6298 (2) Å | ? radiation, λ = ? Å |
b = 8.9515 (2) Å | T = 170 K |
c = 7.3502 (1) Å | × × mm |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Biso*/Beq | |
Ca | 0.00635 | 0.33695 | 0.70829 | | |
Al | 0.01053 | 0.31462 | 0.2493 | | |
Ta1 | 0 | 0 | 0 | | |
Ta2 | 0 | 0 | 0.5 | | |
O1 | 0.98863 | 0.07911 | 0.7462 | | |
O2 | 0.19148 | 0.43423 | 0.43596 | | |
O3 | 0.81411 | 0.44241 | 0.09542 | | |
O4 | 0.12217 | 0.19782 | 0.12117 | | |
O5 | 0.89633 | 0.2026 | 0.38334 | | |
Experimental details
Crystal data |
Chemical formula | CaTaAlO5 |
Mr | 328.01 |
Crystal system, space group | Monoclinic, P21/n |
Temperature (K) | 170 |
a, b, c (Å) | 6.6298 (2), 8.9515 (2), 7.3502 (1) |
β (°) | 113.792 (1) |
V (Å3) | 399.14 (2) |
Z | 4 |
Radiation type | ?, λ = ? Å |
µ (mm−1) | ? |
Crystal size (mm) | × × |
|
Data collection |
Diffractometer | ? |
Absorption correction | ? |
No. of measured, independent and observed (?) reflections | ?, ?, ? |
Rint | ? |
|
Refinement |
R[F2 > 2σ(F2)], wR(F2), S | ?, ?, ? |
No. of reflections | ? |
No. of parameters | ? |
No. of restraints | ? |
Δρmax, Δρmin (e Å−3) | ?, ? |
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