Statistical Analysis of X-ray Speckle at the NSLS

Tsui, O.K.C.; Mochrie, S.G.J.; Berman, L.E.

doi:10.1107/S090904959701039X

Statistical Analysis of X-ray Speckle at the NSLS

O. K. C. Tsui, S. G. J. Mochrie and L. E. Berman

Measurements, carried out at beamline X25 at the National Synchrotron Light Source, of X-ray speckle produced by an aerogel sample are presented. A statistical analysis of the speckle intensity is performed and compared with what may be expected based on the X25 source dimensions and the optics employed.

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Statistical Analysis of X-ray Speckle at the NSLS

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