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Anomalous-scattering tensors for V measured with linearly polarized synchrotron radiation in VOSO4.5H2O near the K-absorption edge exhibit anisotropy as much as 4 units in f'' and ± 2 units in f'. This polarized dispersion causes the diffraction intensity to change when a crystal is turned around a diffraction vector and is the basis of a new way to obtain phases of structure factors.
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