Buy article online - an online subscription or single-article purchase is required to access this article.
Determination of the crystal structures of low-temperature tridymite and cristobalite using single-crystal XRD has been challenging because they generally occur as metastable fine-grained crystals in the geological environment. Therefore, using powder diffraction and scattering techniques is critical to study the low-temperature crystals. Synchrotron powder X-ray diffraction (XRD), pair distribution function (PDF) and transmission electron microscopy were used to investigate the structure of orthorhombic tridymite with C2221 symmetry and tetragonal cristobalite with P41212 symmetry, including their anisotropic atomic displacement parameters (ADPs). Rietveld refinement was used to determine the unit-cell parameters, fractional coordinates and isotropic atomic displacement parameters (Uiso) of the tridymite and cristobalite. The PDF method was used to determine ADPs for each atom. The results suggest that the crystal structure with high quality ADP values can be obtained using the combined methods of XRD and PDF analyses. The method can be used for characterizing crystals that are not suitable for single-crystal XRD.
Supporting information
CCDC references: 1891873; 1891874
Crystal data top
SiO2 | b = 5.0335 (3) Å |
Orthorhombic, C2221 | c = 8.2118 (4) Å |
a = 8.7549 (5) Å | T = 550 K |
Data collection top
Radiation source: Synchrotron | k = → |
θmax = 14.1°, θmin = 0.8° | l = → |
h = → | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Uiso*/Ueq | |
O1 | 0.3315 (5) | 0.000000 | 0.500000 | 0.039000* | |
O2 | 0.000000 | 0.5587 (7) | 0.250000 | 0.027667* | |
O3 | 0.2522 (3) | 0.3139 (4) | 0.2729 (3) | 0.018667* | |
Si1 | 0.1672 (2) | 0.5459 (2) | 0.1877 (1) | 0.029333* | |
Atomic displacement parameters (Å2) top | U11 | U22 | U33 | U12 | U13 | U23 |
O1 | 0.049 (6) | 0.043 (5) | 0.025 (2) | 0.00000 | 0.00000 | 0.003 (1) |
O2 | 0.022 (3) | 0.026 (4) | 0.035 (4) | 0.00000 | 0.006 (2) | 0.00000 |
O3 | 0.019 (2) | 0.015 (2) | 0.022 (3) | 0.002 (1) | −0.006 (2) | 0.001 (1) |
Si1 | 0.033 (3) | 0.031 (3) | 0.024 (2) | 0.003 (1) | 0.004 (1) | 0.007 (2) |
Crystal data top
SiO2 | c = 6.9257 (5) Å |
Tetragonal, P41212 | T = 298 K |
a = 4.9727 (6) Å | |
Data collection top
Radiation source: Synchrotron | k = → |
θmax = 14.1°, θmin = 0.8° | l = → |
h = → | |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top | x | y | z | Biso*/Beq | |
O | 0.2390 (5) | 0.1041 (2) | 0.1787 (4) | 1.476493* | |
Si | 0.3007 (3) | 0.3007 (3) | 0.000000 | 2.729275* | |
Atomic displacement parameters (Å2) top | U11 | U22 | U33 | U12 | U13 | U23 |
O | 0.0289 (6) | 0.0094 (3) | 0.0178 (4) | −0.002 (1) | 0.006 (2) | 0.001 (1) |
Si | 0.0089 (2) | 0.0086 (2) | 0.0088 (2) | −0.001 (1) | 0.002 (1) | −0.002 (1) |
Subscribe to Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials
The full text of this article is available to subscribers to the journal.
If you have already registered and are using a computer listed in your registration details, please email
support@iucr.org for assistance.