The maximum-entropy method in charge-density studies: aspects of reliability

The maximum-entropy method (MEM) was applied to accurate γ-ray diffraction data from MnF₂ and NiF₂ to explore details of the charge-density distribution. For a fair judgement of the results, Si Pendellōsung data [Saka & Kato (1986). Acta Cryst. A42, 469–478] were also treated. It is shown that conclusions drawn from MEM maps must be accepted with some reserve, particularly in the regions of interest in charge-density studies.