The incommensurate misfit layer structure of (SnS)_1.17NbS₂, `SnNbS₃'. II. A study by means of electron microscopy

Electron diffraction and high-resolution imaging are used to study the remarkable incommensurable misfit layer compound (SnS)_1.17NbS₂, 'SnNbS₃'. Electron diffraction patterns along the zone axis perpendicular to the layer planes are analysed in detail based on the mixed-layer assumption proposed in paper I [Meetsma, Wiegers, Haange & de Boer (1989). Acta Cryst. A45, 285-291]. The relative intensities of the hk0 reflections due to the two types of constituent layers are strongly influenced by the foil thickness. Stacking variants along the c axis are frequently observed and strongly complicate the diffraction patterns. Under particular conditions of thickness and defocus, high-resolution images are shown to reflect the varying degree of coincidence of the atom columns in the misfit layers and thus they directly reveal the incommensurate misfit.