Corrections for Multiple Scattering in Integrated Electron Diffraction Intensities. Application to Determination of Structure Factors in the [001] Projection of Al_mFe

Approximate methods are described for treating dynamical scattering effects in integrated electron diffraction intensities from unknown structures. In the application to Al_mFe, (hk0) structure factors have been determined by combining data from two electron diffraction techniques: energy-filtered convergent-beam electron diffraction (CBED) profiles from the (h00) and (hh0) systematic rows and integrated intensity collected by the precession technique in the [001] projection. The ab initio determination of the (h00) and (hh0) structure factors was based on accurate intensity measurements and n-beam dynamical scattering calculations for the systematic row. The remaining (hk0) structure factors were determined from integrated intensities by means of two-beam-like intensity expressions and the effect of other beams was accounted for by a dynamical potential.