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A practical and fast method for the determination of the layer sequence of high-order polytypes is described. Experimentally, the method involves only the determination of the relative order of reflexion intensities and does not employ actual intensity measurements. Auxiliary information, such as the percentage of hexagonality and the cyclicity of the polytype involved, considerably shortens the computer time needed. The method was used to identify a large number of ZnS polytypes and it is applicable to other polytypic material as well.
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