Kinematical multiple diffraction: the width of ψ-scan intensity profiles

It was shown in Rossmanith [Acta Cryst. (1992), A48, 596–610] that the peak width of intensity profiles of multiple diffraction events can be calculated in a simple manner from the divergence δ and the wavelength spread Δλ/λ of the incident beam and from the mosaic spread η and the magnitude r of the ideally perfect crystallites in the sample. In the present paper, an improvement of the concept is given.