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research papers
Spatial distribution of X-ray diffusion scattering intensity conditioned by additional CuO atomic layers [stacking faults (SF)] in the AB2Cu3O7 -x (123) structure has been studied within a cinematic approach. Natural laws of difffraction-pattern changes caused by increase of SF density and by local changes of interplanar distances of atomic layers in the vicinity of SFs were obtained. The X-ray method for determination of the SF density and local changes of interplanar distances is described.