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In the title compound, HoClSeO3, the Ho3+ ion is coordinated by three monodentate SeO32- ions, one chelating selenite group, and two chloride ligands. The [HoO5Cl2] polyhedra are pentagonal bipyramids which are connected to form a three-dimensional network via edges and vertices. The SeO32- ion shows the typical pyramidal shape due to the lone electron pair of the selenium atom.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536803003301/bt6237sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536803003301/bt6237Isup2.hkl
Contains datablock I

Key indicators

  • Single-crystal X-ray study
  • T = 293 K
  • Mean [sigma](Se-O) = 0.004 Å
  • R factor = 0.023
  • wR factor = 0.053
  • Data-to-parameter ratio = 19.7

checkCIF results

No syntax errors found

ADDSYM reports no extra symmetry








Computing details top

Data collection: X-AREA (Stoe & Cie, 2001); cell refinement: X-AREA; data reduction: X-RED (Stoe & Cie, 2001); program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: DIAMOND (Brandenburg, 2001); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997).

(I) top
Crystal data top
ClHoO3SeDx = 4.966 Mg m3
Mr = 327.34Melting point: not measured K
Orthorhombic, PnmaMo Kα radiation, λ = 0.71073 Å
Hall symbol: -p_2ac_2nCell parameters from 2000 reflections
a = 7.2093 (15) Åθ = 3.0–28.0°
b = 6.9259 (10) ŵ = 26.85 mm1
c = 8.7689 (15) ÅT = 293 K
V = 437.84 (13) Å3Column, yellow
Z = 40.15 × 0.13 × 0.12 mm
F(000) = 568
Data collection top
IPDS I
diffractometer
688 independent reflections
Radiation source: fine-focus sealed tube626 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.061
Detector resolution: not measured pixels mm-1θmax = 30.0°, θmin = 3.7°
w? f? oscillation scansh = 1010
Absorption correction: numerical
crystal shape optimization (X-SHAPE; Stoe & Cie, 1999)
k = 99
Tmin = 0.023, Tmax = 0.039l = 1212
4891 measured reflections
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.023 w = 1/[σ2(Fo2) + (0.0338P)2]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.053(Δ/σ)max < 0.001
S = 1.04Δρmax = 1.21 e Å3
688 reflectionsΔρmin = 1.79 e Å3
35 parametersExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
0 restraintsExtinction coefficient: 0.0412 (15)
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Ho0.10634 (4)0.25000.03988 (3)0.01370 (14)
Se0.71023 (8)0.25000.86659 (7)0.01506 (16)
Cl0.4421 (3)0.25000.18300 (19)0.0271 (4)
O10.8575 (5)0.0729 (5)0.9313 (4)0.0207 (6)
O20.7532 (8)0.25000.6802 (6)0.0238 (10)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Ho0.01865 (18)0.00919 (18)0.01326 (17)0.0000.00076 (9)0.000
Se0.0176 (3)0.0119 (3)0.0156 (3)0.0000.0018 (2)0.000
Cl0.0239 (7)0.0365 (10)0.0207 (7)0.0000.0066 (6)0.000
O10.0249 (15)0.0120 (15)0.0252 (14)0.0002 (13)0.0068 (13)0.0028 (13)
O20.028 (2)0.026 (3)0.018 (2)0.0000.0015 (18)0.000
Geometric parameters (Å, º) top
Ho—O2i2.201 (5)Ho—Hovii3.8513 (5)
Ho—O1ii2.266 (3)Se—O21.664 (5)
Ho—O1iii2.266 (3)Se—O1viii1.718 (3)
Ho—O1iv2.373 (4)Se—O11.718 (3)
Ho—O1v2.373 (4)Se—Hoix3.2348 (9)
Ho—Cli2.7033 (17)Cl—Hox2.7033 (17)
Ho—Cl2.7264 (18)O1—Hoii2.266 (3)
Ho—Seiv3.2348 (9)O1—Hoix2.373 (4)
Ho—Hovi3.8513 (5)O2—Hox2.201 (5)
O2i—Ho—O1ii92.42 (10)O2i—Ho—Hovi91.85 (6)
O2i—Ho—O1iii92.42 (10)O1ii—Ho—Hovi34.77 (9)
O1ii—Ho—O1iii161.56 (18)O1iii—Ho—Hovi162.48 (9)
O2i—Ho—O1iv90.69 (15)O1iv—Ho—Hovi33.00 (8)
O1ii—Ho—O1iv67.76 (14)O1v—Ho—Hovi95.21 (8)
O1iii—Ho—O1iv129.94 (10)Cli—Ho—Hovi89.36 (2)
O2i—Ho—O1v90.69 (15)Cl—Ho—Hovi115.915 (9)
O1ii—Ho—O1v129.94 (10)Seiv—Ho—Hovi64.101 (9)
O1iii—Ho—O1v67.76 (14)O2i—Ho—Hovii91.85 (6)
O1iv—Ho—O1v62.24 (16)O1ii—Ho—Hovii162.48 (9)
O2i—Ho—Cli177.24 (15)O1iii—Ho—Hovii34.77 (9)
O1ii—Ho—Cli87.16 (9)O1iv—Ho—Hovii95.21 (8)
O1iii—Ho—Cli87.16 (10)O1v—Ho—Hovii33.00 (8)
O1iv—Ho—Cli91.68 (10)Cli—Ho—Hovii89.36 (2)
O1v—Ho—Cli91.68 (10)Cl—Ho—Hovii115.915 (9)
O2i—Ho—Cl88.66 (15)Seiv—Ho—Hovii64.101 (9)
O1ii—Ho—Cl81.17 (9)Hovi—Ho—Hovii128.099 (17)
O1iii—Ho—Cl81.17 (9)O2—Se—O1viii102.11 (19)
O1iv—Ho—Cl148.87 (8)O2—Se—O1102.11 (18)
O1v—Ho—Cl148.87 (8)O1viii—Se—O191.1 (2)
Cli—Ho—Cl88.58 (3)O2—Se—Hoix107.3 (2)
O2i—Ho—Seiv90.73 (14)O1viii—Se—Hoix45.53 (12)
O1ii—Ho—Seiv98.86 (9)O1—Se—Hoix45.53 (12)
O1iii—Ho—Seiv98.86 (9)Hox—Cl—Ho143.39 (8)
O1iv—Ho—Seiv31.12 (8)Se—O1—Hoii144.3 (2)
O1v—Ho—Seiv31.12 (8)Se—O1—Hoix103.35 (16)
Cli—Ho—Seiv92.04 (4)Hoii—O1—Hoix112.24 (14)
Cl—Ho—Seiv179.39 (4)Se—O2—Hox140.5 (3)
Symmetry codes: (i) x1/2, y, z+1/2; (ii) x+1, y, z+1; (iii) x+1, y+1/2, z+1; (iv) x1, y, z1; (v) x1, y+1/2, z1; (vi) x, y, z; (vii) x, y+1, z; (viii) x, y+1/2, z; (ix) x+1, y, z+1; (x) x+1/2, y, z+1/2.
 

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