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The structure of CN4H7ZrF5 reported by Bukvetskii et al. [Koord. Khim. (1992). 18, 576–579] has been independently redetermined on the basis of measurements on three different crystals. Assuming all four resulting structures are drawn from a normal distribution, normal probability analysis of the atomic coordinates taken in pairs reveals joint standard uncertainties that are underestimated by factors as large as 16.5 for the x(Zr) coordinate. Unit-cell parameters in the four crystals similarly have joint uncertainties, under the same assumption, that are underestimated by factors as large as 83.0 for the b axis. The variations in axial lengths from crystal to crystal and the declines in standard reflection intensities by 13–15% in at least two of the crystals measured are consistent with the inference that the distribution is not normal. Rather, the differences observed may be assumed to be caused by small but highly significant radiation-induced structural changes. The large underestimations hence reflect physical differences among the four irradiated crystals. The determinations show that the CN4H7+1 cation is exactly planar except for the two H atoms bonded to the terminal N atom; the plane of this NH2 group is normal to that of the cation. The average length of the three independent C—N bonds is 1.318 (11) Å; the N—N bond length is 1.397 (3) Å. Distorted ZrF7 pentagonal bipyramids share edges, forming chains linked by N—H...F bonds to the CN4H7+1 ions.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768102012624/br0112sup1.cif
Contains datablocks 1, 2, 3, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102012624/br01121sup2.hkl
Contains datablock 1

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102012624/br01122sup3.hkl
Contains datablock 2

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S0108768102012624/br01123sup4.hkl
Contains datablock 3

CCDC references: 195803; 195804; 195805

Computing details top

Data collection: Siemens (1993) XSCANS for (1); CAD-4 EXPRESS (Enraf-Nonius, 1989) for (2), (3). Cell refinement: Siemens (1993) XSCANS for (1); CAD-4 EXPRESS (Enraf-Nonius, 1989) for (2), (3). Data reduction: Siemens (1993) XSCANS for (1); XCAD4 (Harms, 1996) for (2), (3). For all compounds, program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997). Molecular graphics: ORTEP-III (Burnett and Johnson, 1996) for (2), (3).

Figures top
[Figure 1]
[Figure 2]
[Figure 3]
[Figure 4]
(1) 'aminoguanidinium pentafluorozirconate' top
Crystal data top
CH7N4+·F5ZrF(000) = 504
Mr = 261.33Dx = 2.340 Mg m3
Dm = 2.305 (5) Mg m3
Dm measured by pycnometric
Orthorhombic, PnmaMo Kα radiation, λ = 0.71065 Å
Hall symbol: -P 2ac 2nCell parameters from 30 reflections
a = 6.6524 (5) Åθ = 29.5–30.0°
b = 6.9466 (4) ŵ = 1.52 mm1
c = 16.0497 (9) ÅT = 295 K
V = 741.68 (8) Å3Blocky, colorless
Z = 40.36 × 0.28 × 0.22 mm
Data collection top
Siemens P4
diffractometer
1600 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.030
Graphite monochromatorθmax = 35.0°, θmin = 3.3°
2θ/ω scansh = 110
Absorption correction: ψ scan
XEMP (Siemens, 1993)
k = 111
Tmin = 0.621, Tmax = 0.716l = 125
2318 measured reflections3 standard reflections every 97 reflections
1731 independent reflections intensity decay: 12.8%
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.028H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.076 w = 1/[σ2(Fo2) + (0.0185P)2 + 0.4487P]
where P = (Fo2 + 2Fc2)/3
S = 1.22(Δ/σ)max = 0.001
1731 reflectionsΔρmax = 1.06 e Å3
79 parametersΔρmin = 0.54 e Å3
0 restraintsExtinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0101 (16)
Crystal data top
CH7N4+·F5ZrV = 741.68 (8) Å3
Mr = 261.33Z = 4
Orthorhombic, PnmaMo Kα radiation
a = 6.6524 (5) ŵ = 1.52 mm1
b = 6.9466 (4) ÅT = 295 K
c = 16.0497 (9) Å0.36 × 0.28 × 0.22 mm
Data collection top
Siemens P4
diffractometer
1600 reflections with I > 2σ(I)
Absorption correction: ψ scan
XEMP (Siemens, 1993)
Rint = 0.030
Tmin = 0.621, Tmax = 0.7163 standard reflections every 97 reflections
2318 measured reflections intensity decay: 12.8%
1731 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0280 restraints
wR(F2) = 0.076H atoms treated by a mixture of independent and constrained refinement
S = 1.22Δρmax = 1.06 e Å3
1731 reflectionsΔρmin = 0.54 e Å3
79 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Zr0.56044 (3)0.25000.208400 (12)0.02012 (9)
F10.8699 (2)0.25000.18310 (9)0.0329 (4)
F20.7472 (2)0.25000.32044 (9)0.0305 (3)
F30.5615 (2)0.25000.08622 (10)0.0398 (5)
F40.5539 (2)0.5323 (2)0.21690 (9)0.0409 (3)
C0.6078 (5)0.25000.55445 (16)0.0320 (5)
N10.8044 (5)0.25000.5580 (2)0.0607 (11)
H1A0.884 (8)0.25000.509 (4)0.070 (8)*
H1B0.854 (9)0.25000.604 (3)0.070 (8)*
N20.5113 (5)0.25000.48224 (15)0.0419 (6)
H2A0.579 (7)0.25000.439 (4)0.070 (8)*
H2B0.384 (8)0.25000.485 (3)0.070 (8)*
N30.5019 (5)0.25000.62461 (15)0.0445 (7)
H30.565 (8)0.25000.668 (4)0.067*
N40.2918 (5)0.25000.62100 (19)0.0455 (7)
H40.244 (5)0.160 (5)0.6494 (19)0.068*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Zr0.01083 (11)0.03497 (14)0.01457 (11)0.0000.00021 (6)0.000
F10.0135 (5)0.0692 (12)0.0160 (5)0.0000.0005 (5)0.000
F20.0120 (5)0.0623 (11)0.0171 (5)0.0000.0009 (4)0.000
F30.0236 (8)0.0796 (15)0.0161 (6)0.0000.0016 (5)0.000
F40.0481 (9)0.0362 (7)0.0385 (7)0.0006 (6)0.0005 (5)0.0003 (5)
C0.0332 (12)0.0440 (14)0.0188 (9)0.0000.0024 (9)0.000
N10.0305 (13)0.121 (4)0.0304 (12)0.0000.0032 (11)0.000
N20.0414 (14)0.0655 (19)0.0188 (9)0.0000.0011 (10)0.000
N30.0343 (12)0.081 (2)0.0182 (9)0.0000.0036 (9)0.000
N40.0319 (13)0.068 (2)0.0370 (13)0.0000.0090 (11)0.000
Geometric parameters (Å, º) top
Zr—F31.9610 (16)C—N31.328 (4)
Zr—F41.9665 (16)N1—H1A0.95 (6)
Zr—F12.0984 (15)N1—H1B0.80 (6)
Zr—F2i2.1348 (14)N2—H2A0.83 (5)
Zr—F1i2.1539 (15)N2—H2B0.85 (6)
Zr—F22.1856 (14)N3—N41.399 (4)
C—N11.309 (4)N3—H30.81 (6)
C—N21.325 (4)N4—H40.84 (3)
F3—Zr—F493.98 (4)Zr—F1—Zriii114.89 (6)
F4—Zr—F4ii171.65 (8)Zriii—F2—Zr112.11 (6)
F3—Zr—F178.64 (6)N1—C—N2121.5 (3)
F4—Zr—F192.00 (4)N1—C—N3119.6 (3)
F3—Zr—F2i77.68 (6)N2—C—N3119.0 (3)
F4—Zr—F2i89.63 (4)C—N1—H1A122 (3)
F1—Zr—F2i156.32 (6)C—N1—H1B117 (4)
F3—Zr—F1i144.15 (6)H1A—N1—H1B122 (5)
F4—Zr—F1i86.04 (4)C—N2—H2A118 (4)
F1—Zr—F1i137.21 (4)C—N2—H2B116 (4)
F2i—Zr—F1i66.47 (6)H2A—N2—H2B126 (5)
F3—Zr—F2145.16 (6)C—N3—N4119.7 (3)
F4—Zr—F287.44 (4)C—N3—H3117 (4)
F1—Zr—F266.52 (5)N4—N3—H3124 (4)
F2i—Zr—F2137.16 (4)N3—N4—H4111 (3)
F1i—Zr—F270.68 (6)
Symmetry codes: (i) x1/2, y, z+1/2; (ii) x, y+1/2, z; (iii) x+1/2, y, z+1/2.
(2) aminoguanidinium pentafluorozirconate top
Crystal data top
CH7N4+·F5ZrF(000) = 504
Mr = 261.33Dx = 2.370 Mg m3
Dm = 2.305 (5) Mg m3
Dm measured by pycnometric
Orthorhombic, PnmaCu Kα radiation, λ = 1.5418 Å
Hall symbol: -P 2ac 2nCell parameters from 24 reflections
a = 6.6404 (6) Åθ = 32.7–44.2°
b = 6.8981 (5) ŵ = 12.88 mm1
c = 15.9872 (9) ÅT = 200 K
V = 732.31 (9) Å3Blocky, colorless
Z = 40.13 × 0.11 × 0.06 mm
Data collection top
Nonius MACH3
diffractometer
751 reflections with I > 2σ(I)
Radiation source: rotating-anodeRint = 0.036
Graphite monochromatorθmax = 69.9°, θmin = 5.5°
ω–2θ scansh = 88
Absorption correction: analytical
ABSPSI, (Alcock and Marks, 1994)
k = 18
Tmin = 0.22, Tmax = 0.48l = 1919
3283 measured reflections5 standard reflections every 60 min
757 independent reflections intensity decay: 15.
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.019All H-atom parameters refined
wR(F2) = 0.046 w = 1/[σ2(Fo2) + (0.019P)2 + 0.2678P]
where P = (Fo2 + 2Fc2)/3
S = 1.34(Δ/σ)max = 0.036
757 reflectionsΔρmax = 0.52 e Å3
84 parametersΔρmin = 0.58 e Å3
0 restraintsExtinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.00379 (19)
Crystal data top
CH7N4+·F5ZrV = 732.31 (9) Å3
Mr = 261.33Z = 4
Orthorhombic, PnmaCu Kα radiation
a = 6.6404 (6) ŵ = 12.88 mm1
b = 6.8981 (5) ÅT = 200 K
c = 15.9872 (9) Å0.13 × 0.11 × 0.06 mm
Data collection top
Nonius MACH3
diffractometer
751 reflections with I > 2σ(I)
Absorption correction: analytical
ABSPSI, (Alcock and Marks, 1994)
Rint = 0.036
Tmin = 0.22, Tmax = 0.485 standard reflections every 60 min
3283 measured reflections intensity decay: 15.
757 independent reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0190 restraints
wR(F2) = 0.046All H-atom parameters refined
S = 1.34Δρmax = 0.52 e Å3
757 reflectionsΔρmin = 0.58 e Å3
84 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Zr0.06210 (3)0.25000.208242 (13)0.01609 (13)
F10.3712 (3)0.25000.18291 (9)0.0253 (4)
F20.2482 (2)0.25000.32066 (9)0.0246 (4)
F30.0636 (2)0.25000.08555 (11)0.0289 (4)
F40.05497 (18)0.0341 (2)0.21687 (8)0.0316 (4)
N10.0015 (5)0.25000.62498 (16)0.0334 (6)
N20.2900 (4)0.25000.87881 (18)0.0338 (7)
N30.3046 (4)0.25000.55830 (19)0.0422 (8)
N40.0115 (5)0.25000.48236 (16)0.0310 (6)
C0.1078 (5)0.25000.55448 (18)0.0251 (6)
H10.064 (7)0.25000.669 (4)0.064 (17)*
H20.242 (5)0.335 (5)0.8516 (18)0.067 (11)*
H30.368 (8)0.25000.602 (3)0.051 (13)*
H40.380 (7)0.25000.514 (3)0.048 (12)*
H50.080 (5)0.25000.432 (3)0.029 (10)*
H60.111 (6)0.25000.487 (2)0.020 (9)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Zr0.00818 (17)0.02989 (18)0.01020 (17)0.0000.00006 (6)0.000
F10.0110 (8)0.0543 (11)0.0106 (8)0.0000.0000 (6)0.000
F20.0101 (7)0.0527 (10)0.0110 (7)0.0000.0012 (6)0.000
F30.0176 (9)0.0570 (12)0.0122 (8)0.0000.0009 (6)0.000
F40.0387 (9)0.0299 (7)0.0262 (7)0.0000 (6)0.0001 (4)0.0004 (5)
N10.0226 (13)0.0645 (18)0.0132 (12)0.0000.0011 (12)0.000
N20.0233 (15)0.0523 (17)0.0259 (13)0.0000.0065 (12)0.000
N30.0233 (14)0.085 (2)0.0180 (13)0.0000.0020 (12)0.000
N40.0260 (14)0.0525 (16)0.0146 (13)0.0000.0011 (12)0.000
C0.0266 (14)0.0323 (15)0.0163 (13)0.0000.0011 (12)0.000
Geometric parameters (Å, º) top
Zr—F31.9615 (18)N1—C1.330 (4)
Zr—F41.9649 (15)N1—N2v1.406 (4)
Zr—F4i1.9649 (15)N1—H10.81 (6)
Zr—F12.0921 (17)N2—N1vi1.406 (4)
Zr—F2ii2.1350 (16)N2—H20.80 (3)
Zr—F1iii2.1530 (16)N3—C1.308 (4)
Zr—F22.1812 (15)N3—H30.81 (5)
Zr—Zriv3.5786 (3)N3—H40.86 (5)
Zr—Zrii3.5786 (3)N4—C1.318 (4)
F1—Zriv2.1530 (16)N4—H50.92 (4)
F2—Zriv2.1350 (16)N4—H60.81 (4)
F3—Zr—F494.03 (4)F1iii—Zr—Zriv104.16 (4)
F3—Zr—F4i94.03 (4)F2—Zr—Zriv33.58 (4)
F4—Zr—F4i171.49 (7)F3—Zr—Zrii112.20 (4)
F3—Zr—F178.54 (6)F4—Zr—Zrii87.22 (4)
F4—Zr—F192.13 (4)F4i—Zr—Zrii87.22 (4)
F4i—Zr—F192.13 (4)F1—Zr—Zrii169.25 (4)
F3—Zr—F2ii77.79 (6)F2ii—Zr—Zrii34.41 (4)
F4—Zr—F2ii89.52 (4)F1iii—Zr—Zrii32.02 (4)
F4i—Zr—F2ii89.52 (4)F2—Zr—Zrii102.60 (4)
F1—Zr—F2ii156.34 (6)Zriv—Zr—Zrii136.185 (13)
F3—Zr—F1iii144.22 (6)Zr—F1—Zriv114.91 (7)
F4—Zr—F1iii85.93 (4)Zriv—F2—Zr112.01 (6)
F4i—Zr—F1iii85.93 (4)C—N1—N2v119.6 (3)
F1—Zr—F1iii137.23 (5)C—N1—H1117 (4)
F2ii—Zr—F1iii66.43 (6)N2v—N1—H1123 (4)
F3—Zr—F2145.19 (6)N1vi—N2—H2112 (3)
F4—Zr—F287.47 (4)C—N3—H3124 (3)
F4i—Zr—F287.47 (4)C—N3—H4123 (3)
F1—Zr—F266.65 (6)H3—N3—H4113 (4)
F2ii—Zr—F2137.01 (5)C—N4—H5121 (2)
F1iii—Zr—F270.58 (6)C—N4—H6114 (2)
F3—Zr—Zriv111.61 (4)H5—N4—H6125 (3)
F4—Zr—Zriv89.78 (4)N3—C—N4121.7 (3)
F4i—Zr—Zriv89.78 (4)N3—C—N1119.4 (3)
F1—Zr—Zriv33.07 (4)N4—C—N1118.9 (3)
F2ii—Zr—Zriv170.59 (4)
Symmetry codes: (i) x, y+1/2, z; (ii) x1/2, y+1/2, z+1/2; (iii) x1/2, y, z+1/2; (iv) x+1/2, y+1/2, z+1/2; (v) x1/2, y+1/2, z+3/2; (vi) x+1/2, y+1/2, z+3/2.
(3) 'aminoguanidinium pentafluorozirconate' top
Crystal data top
CH7N4+·F5ZrF(000) = 504
Mr = 261.33Dx = 2.348 Mg m3
Dm = 2.305 (5) Mg m3
Dm measured by pycnometric
Orthorhombic, PnmaMo Kα radiation, λ = 0.71065 Å
Hall symbol: -P 2ac 2nCell parameters from 25 reflections
a = 6.6485 (4) Åθ = 20.1–23.9°
b = 6.9340 (4) ŵ = 1.53 mm1
c = 16.0344 (4) ÅT = 283 K
V = 739.20 (6) Å3Blocky, colorless
Z = 40.27 × 0.11 × 0.09 mm
Data collection top
Nonius MACH3
diffractometer
Rint = 0.010
Radiation source: fine-focus sealed tubeθmax = 30.0°, θmin = 2.5°
Graphite monochromatorh = 19
ω–2θ scansk = 19
3001 measured reflectionsl = 2222
1159 independent reflections5 standard reflections every 60 min
1076 reflections with I > 2σ(I) intensity decay: 1.8%
Refinement top
Refinement on F2Hydrogen site location: inferred from neighbouring sites
Least-squares matrix: fullH atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.041 w = 1/[σ2(Fo2) + (0.0087P)2 + 0.149P]
where P = (Fo2 + 2Fc2)/3
S = 1.20(Δ/σ)max = 0.011
1159 reflectionsΔρmax = 0.40 e Å3
79 parametersΔρmin = 0.29 e Å3
0 restraintsExtinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0073 (5)
Secondary atom site location: difference Fourier map
Crystal data top
CH7N4+·F5ZrV = 739.20 (6) Å3
Mr = 261.33Z = 4
Orthorhombic, PnmaMo Kα radiation
a = 6.6485 (4) ŵ = 1.53 mm1
b = 6.9340 (4) ÅT = 283 K
c = 16.0344 (4) Å0.27 × 0.11 × 0.09 mm
Data collection top
Nonius MACH3
diffractometer
Rint = 0.010
3001 measured reflections5 standard reflections every 60 min
1159 independent reflections intensity decay: 1.8%
1076 reflections with I > 2σ(I)
Refinement top
wR(F2) = 0.0410 restraints
S = 1.20H atoms treated by a mixture of independent and constrained refinement
1159 reflectionsΔρmax = 0.40 e Å3
79 parametersΔρmin = 0.29 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Zr0.06087 (2)0.25000.208348 (8)0.02069 (7)
F10.37020 (15)0.25000.18304 (6)0.0328 (3)
F20.24709 (15)0.25000.32051 (5)0.0313 (2)
F30.06197 (14)0.25000.08617 (6)0.0381 (3)
F40.05457 (13)0.53240 (15)0.21687 (5)0.0400 (2)
C0.1072 (3)0.25000.55408 (10)0.0317 (3)
N10.0017 (3)0.25000.62458 (10)0.0433 (5)
H10.065 (5)0.25000.670 (2)0.065*
N20.2918 (3)0.25000.87913 (11)0.0451 (4)
H20.243 (3)0.341 (3)0.8524 (11)0.068*
N30.3045 (3)0.25000.55818 (12)0.0560 (6)
H30.370 (5)0.25000.6024 (18)0.053 (4)*
H40.386 (4)0.25000.5156 (18)0.053 (4)*
N40.0121 (3)0.25000.48250 (10)0.0405 (4)
H50.082 (4)0.25000.4339 (19)0.053 (4)*
H60.103 (4)0.25000.4856 (18)0.053 (4)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Zr0.01134 (9)0.03592 (10)0.01482 (9)0.0000.00024 (4)0.000
F10.0131 (4)0.0690 (8)0.0163 (4)0.0000.0007 (3)0.000
F20.0130 (4)0.0643 (7)0.0166 (4)0.0000.0013 (3)0.000
F30.0233 (5)0.0737 (9)0.0173 (4)0.0000.0012 (3)0.000
F40.0462 (6)0.0379 (5)0.0360 (4)0.0005 (4)0.0010 (3)0.0001 (3)
C0.0338 (8)0.0412 (9)0.0201 (7)0.0000.0020 (7)0.000
N10.0319 (8)0.0799 (14)0.0181 (6)0.0000.0020 (7)0.000
N20.0334 (9)0.0660 (12)0.0359 (8)0.0000.0085 (7)0.000
N30.0301 (8)0.1093 (19)0.0287 (8)0.0000.0024 (7)0.000
N40.0380 (8)0.0641 (12)0.0195 (6)0.0000.0002 (7)0.000
Geometric parameters (Å, º) top
Zr—F31.9590 (10)C—N31.313 (3)
Zr—F41.9634 (10)C—N11.330 (2)
Zr—F12.0962 (10)N1—N2iii1.397 (3)
Zr—F2i2.1369 (10)N1—H10.84 (3)
Zr—F1i2.1541 (9)N2—H20.831 (19)
Zr—F22.1834 (9)N3—H30.83 (3)
Zr—Zri3.5826 (2)N3—H40.87 (3)
F1—Zrii2.1540 (9)N4—H50.91 (3)
F2—Zrii2.1368 (10)N4—H60.76 (3)
C—N41.310 (2)
F3—Zr—F494.00 (2)F3—Zr—Zri112.10 (3)
F4—Zr—F4iv171.65 (5)F4—Zr—Zri87.38 (3)
F3—Zr—F178.62 (4)F1—Zr—Zri169.27 (3)
F4—Zr—F191.97 (3)F2i—Zr—Zri34.40 (2)
F3—Zr—F2i77.71 (4)F1i—Zr—Zri32.06 (3)
F4—Zr—F2i89.67 (3)F2—Zr—Zri102.66 (3)
F1—Zr—F2i156.33 (4)Zrii—Zr—Zri136.221 (8)
F3—Zr—F1i144.16 (4)Zr—F1—Zrii114.89 (4)
F4—Zr—F1i86.05 (2)Zrii—F2—Zr112.04 (4)
F1—Zr—F1i137.21 (3)N4—C—N3121.72 (18)
F2i—Zr—F1i66.46 (4)N4—C—N1119.32 (19)
F3—Zr—F2145.24 (4)N3—C—N1118.96 (18)
F4—Zr—F287.41 (2)C—N1—N2iii119.39 (17)
F1—Zr—F266.62 (4)C—N1—H1118 (2)
F2i—Zr—F2137.05 (3)N2iii—N1—H1122 (2)
F1i—Zr—F270.60 (4)N1v—N2—H2111.6 (16)
F3—Zr—Zrii111.68 (3)C—N3—H3124 (2)
F4—Zr—Zrii89.65 (3)C—N3—H4125.6 (19)
F1—Zr—Zrii33.05 (2)H3—N3—H4110 (3)
F2i—Zr—Zrii170.62 (2)C—N4—H5120.2 (18)
F1i—Zr—Zrii104.16 (3)C—N4—H6115 (2)
F2—Zr—Zrii33.57 (2)H5—N4—H6125 (3)
Symmetry codes: (i) x1/2, y, z+1/2; (ii) x+1/2, y, z+1/2; (iii) x1/2, y, z+3/2; (iv) x, y+1/2, z; (v) x+1/2, y, z+3/2.

Experimental details

(1)(2)(3)
Crystal data
Chemical formulaCH7N4+·F5ZrCH7N4+·F5ZrCH7N4+·F5Zr
Mr261.33261.33261.33
Crystal system, space groupOrthorhombic, PnmaOrthorhombic, PnmaOrthorhombic, Pnma
Temperature (K)295200283
a, b, c (Å)6.6524 (5), 6.9466 (4), 16.0497 (9)6.6404 (6), 6.8981 (5), 15.9872 (9)6.6485 (4), 6.9340 (4), 16.0344 (4)
V3)741.68 (8)732.31 (9)739.20 (6)
Z444
Radiation typeMo KαCu KαMo Kα
µ (mm1)1.5212.881.53
Crystal size (mm)0.36 × 0.28 × 0.220.13 × 0.11 × 0.060.27 × 0.11 × 0.09
Data collection
DiffractometerSiemens P4
diffractometer
Nonius MACH3
diffractometer
Nonius MACH3
diffractometer
Absorption correctionψ scan
XEMP (Siemens, 1993)
Analytical
ABSPSI, (Alcock and Marks, 1994)
Tmin, Tmax0.621, 0.7160.22, 0.48
No. of measured, independent and
observed [I > 2σ(I)] reflections
2318, 1731, 1600 3283, 757, 751 3001, 1159, 1076
Rint0.0300.0360.010
(sin θ/λ)max1)0.8070.6090.703
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.028, 0.076, 1.22 0.019, 0.046, 1.34 ?, 0.041, 1.20
No. of reflections17317571159
No. of parameters798479
H-atom treatmentH atoms treated by a mixture of independent and constrained refinementAll H-atom parameters refinedH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)1.06, 0.540.52, 0.580.40, 0.29

Computer programs: Siemens (1993) XSCANS, CAD-4 EXPRESS (Enraf-Nonius, 1989), XCAD4 (Harms, 1996), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEP-III (Burnett and Johnson, 1996).

 

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