Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768102012624/br0112sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768102012624/br01121sup2.hkl | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768102012624/br01122sup3.hkl | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768102012624/br01123sup4.hkl |
CCDC references: 195803; 195804; 195805
Data collection: Siemens (1993) XSCANS for (1); CAD-4 EXPRESS (Enraf-Nonius, 1989) for (2), (3). Cell refinement: Siemens (1993) XSCANS for (1); CAD-4 EXPRESS (Enraf-Nonius, 1989) for (2), (3). Data reduction: Siemens (1993) XSCANS for (1); XCAD4 (Harms, 1996) for (2), (3). For all compounds, program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997). Molecular graphics: ORTEP-III (Burnett and Johnson, 1996) for (2), (3).
CH7N4+·F5Zr− | F(000) = 504 |
Mr = 261.33 | Dx = 2.340 Mg m−3 Dm = 2.305 (5) Mg m−3 Dm measured by pycnometric |
Orthorhombic, Pnma | Mo Kα radiation, λ = 0.71065 Å |
Hall symbol: -P 2ac 2n | Cell parameters from 30 reflections |
a = 6.6524 (5) Å | θ = 29.5–30.0° |
b = 6.9466 (4) Å | µ = 1.52 mm−1 |
c = 16.0497 (9) Å | T = 295 K |
V = 741.68 (8) Å3 | Blocky, colorless |
Z = 4 | 0.36 × 0.28 × 0.22 mm |
Siemens P4 diffractometer | 1600 reflections with I > 2σ(I) |
Radiation source: fine-focus sealed tube | Rint = 0.030 |
Graphite monochromator | θmax = 35.0°, θmin = 3.3° |
2θ/ω scans | h = −1→10 |
Absorption correction: ψ scan XEMP (Siemens, 1993) | k = −1→11 |
Tmin = 0.621, Tmax = 0.716 | l = −1→25 |
2318 measured reflections | 3 standard reflections every 97 reflections |
1731 independent reflections | intensity decay: 12.8% |
Refinement on F2 | Secondary atom site location: difference Fourier map |
Least-squares matrix: full | Hydrogen site location: inferred from neighbouring sites |
R[F2 > 2σ(F2)] = 0.028 | H atoms treated by a mixture of independent and constrained refinement |
wR(F2) = 0.076 | w = 1/[σ2(Fo2) + (0.0185P)2 + 0.4487P] where P = (Fo2 + 2Fc2)/3 |
S = 1.22 | (Δ/σ)max = 0.001 |
1731 reflections | Δρmax = 1.06 e Å−3 |
79 parameters | Δρmin = −0.54 e Å−3 |
0 restraints | Extinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4 |
Primary atom site location: structure-invariant direct methods | Extinction coefficient: 0.0101 (16) |
CH7N4+·F5Zr− | V = 741.68 (8) Å3 |
Mr = 261.33 | Z = 4 |
Orthorhombic, Pnma | Mo Kα radiation |
a = 6.6524 (5) Å | µ = 1.52 mm−1 |
b = 6.9466 (4) Å | T = 295 K |
c = 16.0497 (9) Å | 0.36 × 0.28 × 0.22 mm |
Siemens P4 diffractometer | 1600 reflections with I > 2σ(I) |
Absorption correction: ψ scan XEMP (Siemens, 1993) | Rint = 0.030 |
Tmin = 0.621, Tmax = 0.716 | 3 standard reflections every 97 reflections |
2318 measured reflections | intensity decay: 12.8% |
1731 independent reflections |
R[F2 > 2σ(F2)] = 0.028 | 0 restraints |
wR(F2) = 0.076 | H atoms treated by a mixture of independent and constrained refinement |
S = 1.22 | Δρmax = 1.06 e Å−3 |
1731 reflections | Δρmin = −0.54 e Å−3 |
79 parameters |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
Zr | 0.56044 (3) | 0.2500 | 0.208400 (12) | 0.02012 (9) | |
F1 | 0.8699 (2) | 0.2500 | 0.18310 (9) | 0.0329 (4) | |
F2 | 0.7472 (2) | 0.2500 | 0.32044 (9) | 0.0305 (3) | |
F3 | 0.5615 (2) | 0.2500 | 0.08622 (10) | 0.0398 (5) | |
F4 | 0.5539 (2) | 0.5323 (2) | 0.21690 (9) | 0.0409 (3) | |
C | 0.6078 (5) | 0.2500 | 0.55445 (16) | 0.0320 (5) | |
N1 | 0.8044 (5) | 0.2500 | 0.5580 (2) | 0.0607 (11) | |
H1A | 0.884 (8) | 0.2500 | 0.509 (4) | 0.070 (8)* | |
H1B | 0.854 (9) | 0.2500 | 0.604 (3) | 0.070 (8)* | |
N2 | 0.5113 (5) | 0.2500 | 0.48224 (15) | 0.0419 (6) | |
H2A | 0.579 (7) | 0.2500 | 0.439 (4) | 0.070 (8)* | |
H2B | 0.384 (8) | 0.2500 | 0.485 (3) | 0.070 (8)* | |
N3 | 0.5019 (5) | 0.2500 | 0.62461 (15) | 0.0445 (7) | |
H3 | 0.565 (8) | 0.2500 | 0.668 (4) | 0.067* | |
N4 | 0.2918 (5) | 0.2500 | 0.62100 (19) | 0.0455 (7) | |
H4 | 0.244 (5) | 0.160 (5) | 0.6494 (19) | 0.068* |
U11 | U22 | U33 | U12 | U13 | U23 | |
Zr | 0.01083 (11) | 0.03497 (14) | 0.01457 (11) | 0.000 | −0.00021 (6) | 0.000 |
F1 | 0.0135 (5) | 0.0692 (12) | 0.0160 (5) | 0.000 | 0.0005 (5) | 0.000 |
F2 | 0.0120 (5) | 0.0623 (11) | 0.0171 (5) | 0.000 | 0.0009 (4) | 0.000 |
F3 | 0.0236 (8) | 0.0796 (15) | 0.0161 (6) | 0.000 | −0.0016 (5) | 0.000 |
F4 | 0.0481 (9) | 0.0362 (7) | 0.0385 (7) | 0.0006 (6) | −0.0005 (5) | 0.0003 (5) |
C | 0.0332 (12) | 0.0440 (14) | 0.0188 (9) | 0.000 | 0.0024 (9) | 0.000 |
N1 | 0.0305 (13) | 0.121 (4) | 0.0304 (12) | 0.000 | 0.0032 (11) | 0.000 |
N2 | 0.0414 (14) | 0.0655 (19) | 0.0188 (9) | 0.000 | −0.0011 (10) | 0.000 |
N3 | 0.0343 (12) | 0.081 (2) | 0.0182 (9) | 0.000 | 0.0036 (9) | 0.000 |
N4 | 0.0319 (13) | 0.068 (2) | 0.0370 (13) | 0.000 | 0.0090 (11) | 0.000 |
Zr—F3 | 1.9610 (16) | C—N3 | 1.328 (4) |
Zr—F4 | 1.9665 (16) | N1—H1A | 0.95 (6) |
Zr—F1 | 2.0984 (15) | N1—H1B | 0.80 (6) |
Zr—F2i | 2.1348 (14) | N2—H2A | 0.83 (5) |
Zr—F1i | 2.1539 (15) | N2—H2B | 0.85 (6) |
Zr—F2 | 2.1856 (14) | N3—N4 | 1.399 (4) |
C—N1 | 1.309 (4) | N3—H3 | 0.81 (6) |
C—N2 | 1.325 (4) | N4—H4 | 0.84 (3) |
F3—Zr—F4 | 93.98 (4) | Zr—F1—Zriii | 114.89 (6) |
F4—Zr—F4ii | 171.65 (8) | Zriii—F2—Zr | 112.11 (6) |
F3—Zr—F1 | 78.64 (6) | N1—C—N2 | 121.5 (3) |
F4—Zr—F1 | 92.00 (4) | N1—C—N3 | 119.6 (3) |
F3—Zr—F2i | 77.68 (6) | N2—C—N3 | 119.0 (3) |
F4—Zr—F2i | 89.63 (4) | C—N1—H1A | 122 (3) |
F1—Zr—F2i | 156.32 (6) | C—N1—H1B | 117 (4) |
F3—Zr—F1i | 144.15 (6) | H1A—N1—H1B | 122 (5) |
F4—Zr—F1i | 86.04 (4) | C—N2—H2A | 118 (4) |
F1—Zr—F1i | 137.21 (4) | C—N2—H2B | 116 (4) |
F2i—Zr—F1i | 66.47 (6) | H2A—N2—H2B | 126 (5) |
F3—Zr—F2 | 145.16 (6) | C—N3—N4 | 119.7 (3) |
F4—Zr—F2 | 87.44 (4) | C—N3—H3 | 117 (4) |
F1—Zr—F2 | 66.52 (5) | N4—N3—H3 | 124 (4) |
F2i—Zr—F2 | 137.16 (4) | N3—N4—H4 | 111 (3) |
F1i—Zr—F2 | 70.68 (6) |
Symmetry codes: (i) x−1/2, y, −z+1/2; (ii) x, −y+1/2, z; (iii) x+1/2, y, −z+1/2. |
CH7N4+·F5Zr− | F(000) = 504 |
Mr = 261.33 | Dx = 2.370 Mg m−3 Dm = 2.305 (5) Mg m−3 Dm measured by pycnometric |
Orthorhombic, Pnma | Cu Kα radiation, λ = 1.5418 Å |
Hall symbol: -P 2ac 2n | Cell parameters from 24 reflections |
a = 6.6404 (6) Å | θ = 32.7–44.2° |
b = 6.8981 (5) Å | µ = 12.88 mm−1 |
c = 15.9872 (9) Å | T = 200 K |
V = 732.31 (9) Å3 | Blocky, colorless |
Z = 4 | 0.13 × 0.11 × 0.06 mm |
Nonius MACH3 diffractometer | 751 reflections with I > 2σ(I) |
Radiation source: rotating-anode | Rint = 0.036 |
Graphite monochromator | θmax = 69.9°, θmin = 5.5° |
ω–2θ scans | h = −8→8 |
Absorption correction: analytical ABSPSI, (Alcock and Marks, 1994) | k = −1→8 |
Tmin = 0.22, Tmax = 0.48 | l = −19→19 |
3283 measured reflections | 5 standard reflections every 60 min |
757 independent reflections | intensity decay: 15. |
Refinement on F2 | Secondary atom site location: difference Fourier map |
Least-squares matrix: full | Hydrogen site location: inferred from neighbouring sites |
R[F2 > 2σ(F2)] = 0.019 | All H-atom parameters refined |
wR(F2) = 0.046 | w = 1/[σ2(Fo2) + (0.019P)2 + 0.2678P] where P = (Fo2 + 2Fc2)/3 |
S = 1.34 | (Δ/σ)max = 0.036 |
757 reflections | Δρmax = 0.52 e Å−3 |
84 parameters | Δρmin = −0.58 e Å−3 |
0 restraints | Extinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4 |
Primary atom site location: structure-invariant direct methods | Extinction coefficient: 0.00379 (19) |
CH7N4+·F5Zr− | V = 732.31 (9) Å3 |
Mr = 261.33 | Z = 4 |
Orthorhombic, Pnma | Cu Kα radiation |
a = 6.6404 (6) Å | µ = 12.88 mm−1 |
b = 6.8981 (5) Å | T = 200 K |
c = 15.9872 (9) Å | 0.13 × 0.11 × 0.06 mm |
Nonius MACH3 diffractometer | 751 reflections with I > 2σ(I) |
Absorption correction: analytical ABSPSI, (Alcock and Marks, 1994) | Rint = 0.036 |
Tmin = 0.22, Tmax = 0.48 | 5 standard reflections every 60 min |
3283 measured reflections | intensity decay: 15. |
757 independent reflections |
R[F2 > 2σ(F2)] = 0.019 | 0 restraints |
wR(F2) = 0.046 | All H-atom parameters refined |
S = 1.34 | Δρmax = 0.52 e Å−3 |
757 reflections | Δρmin = −0.58 e Å−3 |
84 parameters |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
Zr | 0.06210 (3) | 0.2500 | 0.208242 (13) | 0.01609 (13) | |
F1 | 0.3712 (3) | 0.2500 | 0.18291 (9) | 0.0253 (4) | |
F2 | 0.2482 (2) | 0.2500 | 0.32066 (9) | 0.0246 (4) | |
F3 | 0.0636 (2) | 0.2500 | 0.08555 (11) | 0.0289 (4) | |
F4 | 0.05497 (18) | −0.0341 (2) | 0.21687 (8) | 0.0316 (4) | |
N1 | 0.0015 (5) | 0.2500 | 0.62498 (16) | 0.0334 (6) | |
N2 | 0.2900 (4) | 0.2500 | 0.87881 (18) | 0.0338 (7) | |
N3 | 0.3046 (4) | 0.2500 | 0.55830 (19) | 0.0422 (8) | |
N4 | 0.0115 (5) | 0.2500 | 0.48236 (16) | 0.0310 (6) | |
C | 0.1078 (5) | 0.2500 | 0.55448 (18) | 0.0251 (6) | |
H1 | 0.064 (7) | 0.2500 | 0.669 (4) | 0.064 (17)* | |
H2 | 0.242 (5) | 0.335 (5) | 0.8516 (18) | 0.067 (11)* | |
H3 | 0.368 (8) | 0.2500 | 0.602 (3) | 0.051 (13)* | |
H4 | 0.380 (7) | 0.2500 | 0.514 (3) | 0.048 (12)* | |
H5 | 0.080 (5) | 0.2500 | 0.432 (3) | 0.029 (10)* | |
H6 | −0.111 (6) | 0.2500 | 0.487 (2) | 0.020 (9)* |
U11 | U22 | U33 | U12 | U13 | U23 | |
Zr | 0.00818 (17) | 0.02989 (18) | 0.01020 (17) | 0.000 | −0.00006 (6) | 0.000 |
F1 | 0.0110 (8) | 0.0543 (11) | 0.0106 (8) | 0.000 | 0.0000 (6) | 0.000 |
F2 | 0.0101 (7) | 0.0527 (10) | 0.0110 (7) | 0.000 | 0.0012 (6) | 0.000 |
F3 | 0.0176 (9) | 0.0570 (12) | 0.0122 (8) | 0.000 | −0.0009 (6) | 0.000 |
F4 | 0.0387 (9) | 0.0299 (7) | 0.0262 (7) | 0.0000 (6) | −0.0001 (4) | 0.0004 (5) |
N1 | 0.0226 (13) | 0.0645 (18) | 0.0132 (12) | 0.000 | 0.0011 (12) | 0.000 |
N2 | 0.0233 (15) | 0.0523 (17) | 0.0259 (13) | 0.000 | −0.0065 (12) | 0.000 |
N3 | 0.0233 (14) | 0.085 (2) | 0.0180 (13) | 0.000 | 0.0020 (12) | 0.000 |
N4 | 0.0260 (14) | 0.0525 (16) | 0.0146 (13) | 0.000 | 0.0011 (12) | 0.000 |
C | 0.0266 (14) | 0.0323 (15) | 0.0163 (13) | 0.000 | −0.0011 (12) | 0.000 |
Zr—F3 | 1.9615 (18) | N1—C | 1.330 (4) |
Zr—F4 | 1.9649 (15) | N1—N2v | 1.406 (4) |
Zr—F4i | 1.9649 (15) | N1—H1 | 0.81 (6) |
Zr—F1 | 2.0921 (17) | N2—N1vi | 1.406 (4) |
Zr—F2ii | 2.1350 (16) | N2—H2 | 0.80 (3) |
Zr—F1iii | 2.1530 (16) | N3—C | 1.308 (4) |
Zr—F2 | 2.1812 (15) | N3—H3 | 0.81 (5) |
Zr—Zriv | 3.5786 (3) | N3—H4 | 0.86 (5) |
Zr—Zrii | 3.5786 (3) | N4—C | 1.318 (4) |
F1—Zriv | 2.1530 (16) | N4—H5 | 0.92 (4) |
F2—Zriv | 2.1350 (16) | N4—H6 | 0.81 (4) |
F3—Zr—F4 | 94.03 (4) | F1iii—Zr—Zriv | 104.16 (4) |
F3—Zr—F4i | 94.03 (4) | F2—Zr—Zriv | 33.58 (4) |
F4—Zr—F4i | 171.49 (7) | F3—Zr—Zrii | 112.20 (4) |
F3—Zr—F1 | 78.54 (6) | F4—Zr—Zrii | 87.22 (4) |
F4—Zr—F1 | 92.13 (4) | F4i—Zr—Zrii | 87.22 (4) |
F4i—Zr—F1 | 92.13 (4) | F1—Zr—Zrii | 169.25 (4) |
F3—Zr—F2ii | 77.79 (6) | F2ii—Zr—Zrii | 34.41 (4) |
F4—Zr—F2ii | 89.52 (4) | F1iii—Zr—Zrii | 32.02 (4) |
F4i—Zr—F2ii | 89.52 (4) | F2—Zr—Zrii | 102.60 (4) |
F1—Zr—F2ii | 156.34 (6) | Zriv—Zr—Zrii | 136.185 (13) |
F3—Zr—F1iii | 144.22 (6) | Zr—F1—Zriv | 114.91 (7) |
F4—Zr—F1iii | 85.93 (4) | Zriv—F2—Zr | 112.01 (6) |
F4i—Zr—F1iii | 85.93 (4) | C—N1—N2v | 119.6 (3) |
F1—Zr—F1iii | 137.23 (5) | C—N1—H1 | 117 (4) |
F2ii—Zr—F1iii | 66.43 (6) | N2v—N1—H1 | 123 (4) |
F3—Zr—F2 | 145.19 (6) | N1vi—N2—H2 | 112 (3) |
F4—Zr—F2 | 87.47 (4) | C—N3—H3 | 124 (3) |
F4i—Zr—F2 | 87.47 (4) | C—N3—H4 | 123 (3) |
F1—Zr—F2 | 66.65 (6) | H3—N3—H4 | 113 (4) |
F2ii—Zr—F2 | 137.01 (5) | C—N4—H5 | 121 (2) |
F1iii—Zr—F2 | 70.58 (6) | C—N4—H6 | 114 (2) |
F3—Zr—Zriv | 111.61 (4) | H5—N4—H6 | 125 (3) |
F4—Zr—Zriv | 89.78 (4) | N3—C—N4 | 121.7 (3) |
F4i—Zr—Zriv | 89.78 (4) | N3—C—N1 | 119.4 (3) |
F1—Zr—Zriv | 33.07 (4) | N4—C—N1 | 118.9 (3) |
F2ii—Zr—Zriv | 170.59 (4) |
Symmetry codes: (i) x, −y+1/2, z; (ii) x−1/2, −y+1/2, −z+1/2; (iii) x−1/2, y, −z+1/2; (iv) x+1/2, −y+1/2, −z+1/2; (v) x−1/2, −y+1/2, −z+3/2; (vi) x+1/2, −y+1/2, −z+3/2. |
CH7N4+·F5Zr− | F(000) = 504 |
Mr = 261.33 | Dx = 2.348 Mg m−3 Dm = 2.305 (5) Mg m−3 Dm measured by pycnometric |
Orthorhombic, Pnma | Mo Kα radiation, λ = 0.71065 Å |
Hall symbol: -P 2ac 2n | Cell parameters from 25 reflections |
a = 6.6485 (4) Å | θ = 20.1–23.9° |
b = 6.9340 (4) Å | µ = 1.53 mm−1 |
c = 16.0344 (4) Å | T = 283 K |
V = 739.20 (6) Å3 | Blocky, colorless |
Z = 4 | 0.27 × 0.11 × 0.09 mm |
Nonius MACH3 diffractometer | Rint = 0.010 |
Radiation source: fine-focus sealed tube | θmax = 30.0°, θmin = 2.5° |
Graphite monochromator | h = −1→9 |
ω–2θ scans | k = −1→9 |
3001 measured reflections | l = −22→22 |
1159 independent reflections | 5 standard reflections every 60 min |
1076 reflections with I > 2σ(I) | intensity decay: 1.8% |
Refinement on F2 | Hydrogen site location: inferred from neighbouring sites |
Least-squares matrix: full | H atoms treated by a mixture of independent and constrained refinement |
wR(F2) = 0.041 | w = 1/[σ2(Fo2) + (0.0087P)2 + 0.149P] where P = (Fo2 + 2Fc2)/3 |
S = 1.20 | (Δ/σ)max = 0.011 |
1159 reflections | Δρmax = 0.40 e Å−3 |
79 parameters | Δρmin = −0.29 e Å−3 |
0 restraints | Extinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4 |
Primary atom site location: structure-invariant direct methods | Extinction coefficient: 0.0073 (5) |
Secondary atom site location: difference Fourier map |
CH7N4+·F5Zr− | V = 739.20 (6) Å3 |
Mr = 261.33 | Z = 4 |
Orthorhombic, Pnma | Mo Kα radiation |
a = 6.6485 (4) Å | µ = 1.53 mm−1 |
b = 6.9340 (4) Å | T = 283 K |
c = 16.0344 (4) Å | 0.27 × 0.11 × 0.09 mm |
Nonius MACH3 diffractometer | Rint = 0.010 |
3001 measured reflections | 5 standard reflections every 60 min |
1159 independent reflections | intensity decay: 1.8% |
1076 reflections with I > 2σ(I) |
wR(F2) = 0.041 | 0 restraints |
S = 1.20 | H atoms treated by a mixture of independent and constrained refinement |
1159 reflections | Δρmax = 0.40 e Å−3 |
79 parameters | Δρmin = −0.29 e Å−3 |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
Zr | 0.06087 (2) | 0.2500 | 0.208348 (8) | 0.02069 (7) | |
F1 | 0.37020 (15) | 0.2500 | 0.18304 (6) | 0.0328 (3) | |
F2 | 0.24709 (15) | 0.2500 | 0.32051 (5) | 0.0313 (2) | |
F3 | 0.06197 (14) | 0.2500 | 0.08617 (6) | 0.0381 (3) | |
F4 | 0.05457 (13) | 0.53240 (15) | 0.21687 (5) | 0.0400 (2) | |
C | 0.1072 (3) | 0.2500 | 0.55408 (10) | 0.0317 (3) | |
N1 | 0.0017 (3) | 0.2500 | 0.62458 (10) | 0.0433 (5) | |
H1 | 0.065 (5) | 0.2500 | 0.670 (2) | 0.065* | |
N2 | 0.2918 (3) | 0.2500 | 0.87913 (11) | 0.0451 (4) | |
H2 | 0.243 (3) | 0.341 (3) | 0.8524 (11) | 0.068* | |
N3 | 0.3045 (3) | 0.2500 | 0.55818 (12) | 0.0560 (6) | |
H3 | 0.370 (5) | 0.2500 | 0.6024 (18) | 0.053 (4)* | |
H4 | 0.386 (4) | 0.2500 | 0.5156 (18) | 0.053 (4)* | |
N4 | 0.0121 (3) | 0.2500 | 0.48250 (10) | 0.0405 (4) | |
H5 | 0.082 (4) | 0.2500 | 0.4339 (19) | 0.053 (4)* | |
H6 | −0.103 (4) | 0.2500 | 0.4856 (18) | 0.053 (4)* |
U11 | U22 | U33 | U12 | U13 | U23 | |
Zr | 0.01134 (9) | 0.03592 (10) | 0.01482 (9) | 0.000 | −0.00024 (4) | 0.000 |
F1 | 0.0131 (4) | 0.0690 (8) | 0.0163 (4) | 0.000 | 0.0007 (3) | 0.000 |
F2 | 0.0130 (4) | 0.0643 (7) | 0.0166 (4) | 0.000 | 0.0013 (3) | 0.000 |
F3 | 0.0233 (5) | 0.0737 (9) | 0.0173 (4) | 0.000 | −0.0012 (3) | 0.000 |
F4 | 0.0462 (6) | 0.0379 (5) | 0.0360 (4) | 0.0005 (4) | −0.0010 (3) | −0.0001 (3) |
C | 0.0338 (8) | 0.0412 (9) | 0.0201 (7) | 0.000 | 0.0020 (7) | 0.000 |
N1 | 0.0319 (8) | 0.0799 (14) | 0.0181 (6) | 0.000 | 0.0020 (7) | 0.000 |
N2 | 0.0334 (9) | 0.0660 (12) | 0.0359 (8) | 0.000 | −0.0085 (7) | 0.000 |
N3 | 0.0301 (8) | 0.1093 (19) | 0.0287 (8) | 0.000 | 0.0024 (7) | 0.000 |
N4 | 0.0380 (8) | 0.0641 (12) | 0.0195 (6) | 0.000 | −0.0002 (7) | 0.000 |
Zr—F3 | 1.9590 (10) | C—N3 | 1.313 (3) |
Zr—F4 | 1.9634 (10) | C—N1 | 1.330 (2) |
Zr—F1 | 2.0962 (10) | N1—N2iii | 1.397 (3) |
Zr—F2i | 2.1369 (10) | N1—H1 | 0.84 (3) |
Zr—F1i | 2.1541 (9) | N2—H2 | 0.831 (19) |
Zr—F2 | 2.1834 (9) | N3—H3 | 0.83 (3) |
Zr—Zri | 3.5826 (2) | N3—H4 | 0.87 (3) |
F1—Zrii | 2.1540 (9) | N4—H5 | 0.91 (3) |
F2—Zrii | 2.1368 (10) | N4—H6 | 0.76 (3) |
C—N4 | 1.310 (2) | ||
F3—Zr—F4 | 94.00 (2) | F3—Zr—Zri | 112.10 (3) |
F4—Zr—F4iv | 171.65 (5) | F4—Zr—Zri | 87.38 (3) |
F3—Zr—F1 | 78.62 (4) | F1—Zr—Zri | 169.27 (3) |
F4—Zr—F1 | 91.97 (3) | F2i—Zr—Zri | 34.40 (2) |
F3—Zr—F2i | 77.71 (4) | F1i—Zr—Zri | 32.06 (3) |
F4—Zr—F2i | 89.67 (3) | F2—Zr—Zri | 102.66 (3) |
F1—Zr—F2i | 156.33 (4) | Zrii—Zr—Zri | 136.221 (8) |
F3—Zr—F1i | 144.16 (4) | Zr—F1—Zrii | 114.89 (4) |
F4—Zr—F1i | 86.05 (2) | Zrii—F2—Zr | 112.04 (4) |
F1—Zr—F1i | 137.21 (3) | N4—C—N3 | 121.72 (18) |
F2i—Zr—F1i | 66.46 (4) | N4—C—N1 | 119.32 (19) |
F3—Zr—F2 | 145.24 (4) | N3—C—N1 | 118.96 (18) |
F4—Zr—F2 | 87.41 (2) | C—N1—N2iii | 119.39 (17) |
F1—Zr—F2 | 66.62 (4) | C—N1—H1 | 118 (2) |
F2i—Zr—F2 | 137.05 (3) | N2iii—N1—H1 | 122 (2) |
F1i—Zr—F2 | 70.60 (4) | N1v—N2—H2 | 111.6 (16) |
F3—Zr—Zrii | 111.68 (3) | C—N3—H3 | 124 (2) |
F4—Zr—Zrii | 89.65 (3) | C—N3—H4 | 125.6 (19) |
F1—Zr—Zrii | 33.05 (2) | H3—N3—H4 | 110 (3) |
F2i—Zr—Zrii | 170.62 (2) | C—N4—H5 | 120.2 (18) |
F1i—Zr—Zrii | 104.16 (3) | C—N4—H6 | 115 (2) |
F2—Zr—Zrii | 33.57 (2) | H5—N4—H6 | 125 (3) |
Symmetry codes: (i) x−1/2, y, −z+1/2; (ii) x+1/2, y, −z+1/2; (iii) x−1/2, y, −z+3/2; (iv) x, −y+1/2, z; (v) x+1/2, y, −z+3/2. |
Experimental details
(1) | (2) | (3) | |
Crystal data | |||
Chemical formula | CH7N4+·F5Zr− | CH7N4+·F5Zr− | CH7N4+·F5Zr− |
Mr | 261.33 | 261.33 | 261.33 |
Crystal system, space group | Orthorhombic, Pnma | Orthorhombic, Pnma | Orthorhombic, Pnma |
Temperature (K) | 295 | 200 | 283 |
a, b, c (Å) | 6.6524 (5), 6.9466 (4), 16.0497 (9) | 6.6404 (6), 6.8981 (5), 15.9872 (9) | 6.6485 (4), 6.9340 (4), 16.0344 (4) |
V (Å3) | 741.68 (8) | 732.31 (9) | 739.20 (6) |
Z | 4 | 4 | 4 |
Radiation type | Mo Kα | Cu Kα | Mo Kα |
µ (mm−1) | 1.52 | 12.88 | 1.53 |
Crystal size (mm) | 0.36 × 0.28 × 0.22 | 0.13 × 0.11 × 0.06 | 0.27 × 0.11 × 0.09 |
Data collection | |||
Diffractometer | Siemens P4 diffractometer | Nonius MACH3 diffractometer | Nonius MACH3 diffractometer |
Absorption correction | ψ scan XEMP (Siemens, 1993) | Analytical ABSPSI, (Alcock and Marks, 1994) | – |
Tmin, Tmax | 0.621, 0.716 | 0.22, 0.48 | – |
No. of measured, independent and observed [I > 2σ(I)] reflections | 2318, 1731, 1600 | 3283, 757, 751 | 3001, 1159, 1076 |
Rint | 0.030 | 0.036 | 0.010 |
(sin θ/λ)max (Å−1) | 0.807 | 0.609 | 0.703 |
Refinement | |||
R[F2 > 2σ(F2)], wR(F2), S | 0.028, 0.076, 1.22 | 0.019, 0.046, 1.34 | ?, 0.041, 1.20 |
No. of reflections | 1731 | 757 | 1159 |
No. of parameters | 79 | 84 | 79 |
H-atom treatment | H atoms treated by a mixture of independent and constrained refinement | All H-atom parameters refined | H atoms treated by a mixture of independent and constrained refinement |
Δρmax, Δρmin (e Å−3) | 1.06, −0.54 | 0.52, −0.58 | 0.40, −0.29 |
Computer programs: Siemens (1993) XSCANS, CAD-4 EXPRESS (Enraf-Nonius, 1989), XCAD4 (Harms, 1996), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEP-III (Burnett and Johnson, 1996).