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In this work, the linear polarization of synchrotron radiation is explored as a tuning key for the strength of the simultaneously diffracted X-ray waves in crystals. The relative strength of the waves has been defined by the reflectivities of the Bragg reflections involved in each multiple-diffraction case and it has limited the applicability of the multiple-diffraction phenomenon. With a proper choice of the wavelength and the polarization direction of the incident synchrotron radiation, it is demonstrated how the intensity ratios of the simultaneously diffracted beams can be drastically changed.

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