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A method for precise measurement of diffraction angles of single crystals using a Soller slit is described, which needs only a single diffracting position of the sample. The method can be applied to imperfect crystals, to samples with arbitrary shape as well as to measurements integrating over a larger area. The instrument and the measuring procedure are described. A survey of systematic errors is given and the errors that are specific for the method are briefly discussed. As an example, the results of measurements on silicon with a standard deviation of 3 p.p.m. are communicated.
