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Search query: ultra-small-angle neutron diffraction
148 articles match your search "ultra-small-angle neutron diffraction"Results 1 to 10, sorted by relevance:
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A method is given for converting slit-smeared azimuthally asymmetric data collected on a double-crystal diffractometer for concatenation with the usual pinhole-geometry small-angle neuton scattering data.
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A Bonse–Hart camera using a Bragg reflection with a small crystallographic structure factor will enable one to access correspondingly low Q values in small-angle diffraction. This is demonstrated for a neutron double-crystal diffractometer using GaAs 200 reflections, resulting in an increase in Q resolution by a factor of 6.1 as compared with a standard Si 220 setup.
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The high scattering power of a sample at low angles may lead to significant secondary scattering contributions in the measured small- and ultra-small-angle X-ray scattering patterns. A correction procedure is presented for the removal of the excess intensity and to improve the dynamic range of the measurement.
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Ultra-small-angle neutron scattering (USANS) with the use of perfect silicon crystals provides a resolution of the order of 10−5 Å−1 in reciprocal space, which corresponds to μrad in scattering angles and μm structures in real space. From small-angle scattering by artificial lattices follows a unique test procedure for the related devices and techniques. Corresponding measurements were performed at the USANS facilities of the Atominstitut in Vienna and of the S18 instrument at the ILL. We observed diffraction patterns from samples being periodically structured in one and two dimensions. These measurements take advantage of the extended coherence function of the set-up and the high quality of the manufactured silicon sample lattices. Due to these characteristics up to 50 interference orders were obtained at the S18 instrument. Scattering from two-dimensional periodic structures was observed for different orientations of the sample which shows characteristic diffraction maps in reciprocal space.
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Bridging length scales in hard materials with ultra-small angle X-ray scattering – a critical review
This review examines the use of ultra-small angle X-ray scattering (USAXS), a nondestructive technique for analyzing the multi-scale microstructures of hard materials such as ceramics, metals and composites. It discusses the principles, benefits and challenges of USAXS, along with its potential to advance materials development and optimize manufacturing processes, while also considering future enhancements through multimodal characterization and machine learning.
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The concept, design and performance of the variable-wavelength Bonse–Hart ultra-small-angle neutron scattering diffractometer KOOKABURRA at ANSTO are described.
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The latest developments on instrumentation improvements at the V12 double-crystal and imaging instrument at the Hahn-Meitner Institut are presented. Ways to combine instruments are described and examples of scientific applications from different fields are presented.
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The role of higher-order small-angle neutron scattering effects in ultra-fine-grained pure iron prepared by combining high-pressure torsion with a post-annealing process is investigated.
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Ultra-small-angle X-ray scattering data were obtained from deformed single-crystal aluminium samples. These data are consistent with recent theoretical predictions of scattering from dislocation walls, allowing quantitative microstructural parameters to be extracted.
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A description and the performance of the very small angle neutron scattering diffractometer at the National Institute of Standards and Technology are presented.