A new many-beam dynamical theory for plan-view high-resolution transmission electron microscopy images of multilayer systems without the limitation of a superlattice cell is proposed. Simulations using this method revealed that characteristic moiré-like lattice fringes are formed due to the relative shift of the crystal-lattice planes.

A complete X-ray polarization-switch effect of silicon crystals at the exact multiple-beam diffraction geometry is reported. It will be very helpful for designing novel crystal-based polarizers to achieve a 90° polarization rotation of incident X-rays.

Takagi–Taupin dynamical X-ray diffraction simulations of cylindrically bent Laue crystals show that, in specific diffraction geometries, the focusing behaviour of such crystals is significantly influenced by dynamical effects, causing the foci of different energies to deviate from the predictions of the `magic condition' derived from geometric optics theory.

By considering the scattering distributed throughout space, there is an intensity enhancement at the Bragg angle even when the Bragg condition is not satisfied. This leads to an alternative explanation for the diffraction from powders and small crystals.

The dynamical theory for perfect crystals in the Laue case is reformulated using the Riemann surface.

A modified version of the statistical dynamical diffraction theory has been applied to a set of model SiGe/Si thin-film samples in order to define the capabilities of this approach for returning structural information from defective semiconductor heterostructures.

A kinematic type of expression is derived for the dynamical diffracted-beam amplitudes and its validity is illustrated for thin films of GaAs and Au.

Symmetries in the intensity distributions of convergent-beam electron diffraction (CBED) patterns are governed not only by the atomic structure of the unit cell but by the morphology of the diffracting specimen as a whole. A simple interpretation based on structural tilt projections and the multislice scattering theory may prove useful in extracting morphological information embedded in the presence or absence of CBED pattern symmetries for a wide range of applications, from 4D scanning transmission electron microscopy to bonding electron density studies in nano-structured materials.

An algorithm for calculating the 2θ diffraction profiles is developed based on the dynamical theory of X-ray diffraction for multi-beam cases. The connection between the 2θ-scanned profiles and the excitation of modes is revealed.

Dynamical calculations are given for the X-ray back diffraction (1240) in a monolithic two-plate silicon cavity at photon energy 14.4388 keV, at which 24 beams are simultaneously excited.