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Search query: lamellar arrays
16 articles match your search "lamellar arrays"Results 1 to 10, sorted by relevance:
research papers
Full pattern analyses of small-angle X-ray and neutron scattering data with both discrete reflections and central diffuse scattering are presented. Data with both equatorial streaks and two- and four-point reflections can be fitted in elliptical coordinates with relatively few parameters.
research papers
Samll-angle X-ray scattering of thin films with oriented two-dimensional cylindrical hexagonal mesostructures is evaluated.
research papers
Following the recent demonstration of the sensitivity of grazing-incidence X-ray fluorescence to the lateral structure of periodic nano-patterned devices, a computational scheme for the simulation of experimental data is presented. This can be used for the element-selective analysis of 3D atomic distributions in nano-patterned structures.
research papers
The 3D X-ray standing wave (XSW) technique is a new method for characterization of the 3D atomic profiles of planar periodic nanostructures, like nanometre-sized gratings or pillar arrays. The laboratory 3D XSW analysis of TiN gratings with nanometre-sized pitches is demonstrated here.
research papers
Medium-range atomic ordering in Cu2Se appears right after the phase transition and is sustained over a wide temperature range as observed using in situ TEM investigations.
abstracts
beamlines
The optical design and performance of the BioSAXS beamline at the Taiwan Photon Source are reported
research papers
A computational method for obtaining the time-dependent intermediate scattering function of supported membrane stacks is presented.
research papers
The article describes recent upgrades of the polarized neutron reflectometer D17 at the Institut Laue–Langevin, Grenoble, France, and presents recent examples of scientific studies enabled with the new options.
computer programs
A software package is described for grazing-incidence wide-angle X-ray scattering geared towards weakly ordered materials, with functionality including scattering intensity normalization/uncertainty estimation, scattering pattern indexing and refractive shift correction.