A novel method for transmission intensity measurement and scattering intensity normalization is developed. This method enables true synchronization of scattering and transmission signal measurements, and separation of the transmission intensity of fundamental radiation from the attenuated direct beam.

An inclined geometry method has been applied to a Laue geometry setup for X-ray analyser-based phase-contrast imaging through rotation of the detector and object about the optical axis allowing this traditionally 1-D phase-sensitive phase-contrast method to possess 2-D phase sensitivity. Tomographic datasets were acquired over 360° of a multi-material phantom to reconstruct the real and imaginary parts of the refractive index of the phantom.

The first X-ray Extended Range Technique (XERT)-like experiment at the Australian Synchrotron measured 496 energies from 8.51 keV to 11.59 keV for zinc metal to 0.023–0.036% accuracy. Systematics are quantified.

A compact gas attenuator for the SwissFEL ATHOS beamline with a custom manifold realized using additive manufacturing is described. First results show that the response is as expected from theoretical calculations.

High-accuracy measurement of attenuation coefficients and XAFS to 0.13% for ZnSe using the X-ray extended range technique, at 561 energies from 6.8 keV to 15 keV, determining bond lengths and possible dynamic motion.

X-ray diffraction tensor tomography is used to map clay mineral orientation and high-density inclusions in a sample of Pierre shale.

A theoretical concept for the sin²ψ-based analysis of residual stress depth gradients providing high lateral resolution is presented. Simulations for very small gauge volumes are presented for the energy-dispersive case of diffraction.

The dynamical theory of X-ray Laue diffraction in flat and wedge sectioned multilayers is considered. Recurrence relations are obtained that describe Laue diffraction in structures that are inhomogeneous in depth.

The strain profile inside very low lattice-mismatched HgCdTe/CdZnTe multilayer stacks used in complex dual-band IR detector was successfully measured with the required strain resolution of 10⁻⁵. Combined with chemical-sensitive techniques, this approach allows correlation of lattice-mismatch, interface compositional gradient and strain while isolating specific layer contributions.

The study of multilayer stacks (e.g. thin-film solar cells) by X-ray fluorescence requires a thorough account of the depth-dependent attenuation of incident and excident X-ray beam intensity, as well as spatial thickness variations to achieve an accurate interpretation of the data. A procedure is presented that allows for the assessment of stoichiometric composition variations in high spatial resolution imaging by correcting for multiple effects.