Single-shot damage of an 200 nm-thick Au thin film is experimentally studied with a UV FEL of 121.6 nm wavelength and 2 ps pulse length. The characterized, as well as visually observed, phenomena are analyzed with multiple theoretical approaches.

The damage threshold fluences of silicon (Si) and boron carbide (B₄C)-coated Si at 1 keV and 9 mrad grazing incident angle are compared. Results show that B₄C has a damage threshold approximately twice that of Si, highlighting the advantages of using B₄C coatings for enhanced durability.

The study of the dynamics of radiation-sensitive soft-matter suspensions is demonstrated by means of sequential-shot X-ray photon correlation spectroscopy below the radiation-damage threshold at the SACLA free-electron laser.

An experimental study of the durability of extreme UV optical coatings to a large number of free-electron laser pulses is reported.

The damage threshold of diffraction gratings and X-ray coatings have been studied using X-ray FEL radiation.

The impact of X-ray irradiation on the high-pressure phase-transition behaviour of coordination polymers is highlighted with four example studies.

Structural analysis of the apo form of the human MICU1–MICU2 heterodimer suggests how the heterodimer sets a higher Ca²⁺ threshold than the MICU1 homodimer. This provides a framework for understanding the gatekeeping role of the MICU1–MICU2 heterodimer.

Continuous sample translation is evaluated as a tool to reduce X-ray damage in X-ray photon correlation spectroscopy studies of protein diffusion.

Using X-ray diffraction of rat optic nerves ex vivo, the nanometer-scale changes in the structure of nerve myelin in direct relation to the degree of force applied were followed. Although the nerve myelin appears to return to its original structure at lesser loads, it was confirmed that a permanent change in structure occurs between 15 and 20 g (2.7 and 3.5 psi) average load.

The critical dose for chemical modification and the onset of negative mode (cross-linking) dose of PMMA were measured for 300 eV soft X-ray exposure. A method to determine detector efficiency was developed based on the onset of negative mode dose.