The first crystal structure of the RBM39-UHM–U2AF65-ULM complex has been determined at 2.2 Å resolution. Comparison to other UHM–ULM complexes reveals both common and unique interactions.

This work provides detailed crystal structure data for V₃O₇·H₂O. Furthermore, it gives insight into Mo-substituted V₃O₇·H₂O.

The 1.6 Å resolution crystal structure of the RNA-recognition motif of D. melanogaster tRNA (uracil-5-)-methyltransferase homolog A is reported.

Following the recent demonstration of the sensitivity of grazing-incidence X-ray fluorescence to the lateral structure of periodic nano-patterned devices, a computational scheme for the simulation of experimental data is presented. This can be used for the element-selective analysis of 3D atomic distributions in nano-patterned structures.

Grazing-incidence small-angle X-ray scattering (GISAXS) is used to examine crystalline and locally quasicrystalline 2D photonic structures produced by nanoimprint lithography for photovoltaic applications. Using a hierarchical theoretical description, lattice distortions are quantified from the GISAXS measurements, showing the differences in reproduction quality between the investigated samples.

The hierarchical organization of bone is a key feature of this important biomineralized tissue. A combination of small- and wide-angle X-ray scattering tensor tomography with diffraction tomography and synchrotron computed tomography demonstrates how mineral properties and the orientational relationship between mineral and nanostructure vary across the tissue.

The transmission of the optical components of the Bernina branch of the Aramis beamline at SwissFEL has been measured with an X-ray gas monitor from DESY and compared with a PSI gas detector upstream of the optical components. The transmission efficiencies of the mirrors and the various other in-beam components were evaluated and compared with theoretical calculations.

A compact gas attenuator for the SwissFEL ATHOS beamline with a custom manifold realized using additive manufacturing is described. First results show that the response is as expected from theoretical calculations.

An innovative double-edge scan wavefront metrology method has been developed which can resolve the problem of high-precision crystal absolute diffraction wavefront measurements. This method can be regarded as a critical feedback mechanism in the processing of next-generation crystals.

An X-ray ionization beam position monitor developed for PAL-XFEL soft X-rays is introduced.