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Search query: GaAs 200
70 articles match your search "GaAs 200"Results 1 to 10, sorted by relevance:
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A Bonse–Hart camera using a Bragg reflection with a small crystallographic structure factor will enable one to access correspondingly low Q values in small-angle diffraction. This is demonstrated for a neutron double-crystal diffractometer using GaAs 200 reflections, resulting in an increase in Q resolution by a factor of 6.1 as compared with a standard Si 220 setup.
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X-ray ptychography was optimized at energies of 17 and 33.6 keV at the ESRF using Kirkpatrick–Baez mirrors.
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Non-centrosymmetry effects and polarity determination in III–V
semiconductors using CBED are discussed. It is shown that with carefully chosen diffraction conditions strong non-centrosymmetry effects may be observed in GaAs as well as in InP. The effects and their interpretation are discussed by means of the Bloch-wave theory and dynamical many-beam calculations.
![s logo](https://journals.iucr.org/logos/jicons/s_36x36.png)
High-resolution X-ray diffraction experiments based on synchrotron radiation are used to measure the values of lateral coherence length, vertical coherence length, tilt and micro-strain of GaAs epilayers grown on Si substrate using the conventional Williamson–Hall analysis. Such information could not be obtained on laboratory-based high-resolution X-ray diffraction systems.
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Structural transformations in the low-temperature grown GaAs with superlattices of Sb and P δ-layers
Structural transformations in superlattices of Sb and P δ-layers upon annealing were studied in low-temperature grown GaAs. The combination of Sb and P δ-layers appears to be an effective tool for spatial patterning of arsenic nanoinclusions and prevention of the defect formation in the GaAs matrix.
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The bending radii and strain of individual nanowires are determined using X-ray diffraction with a nano-focused beam and a dedicated diffraction theory for strongly bent crystals. Electron microscopy investigations corroborate the results.
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This study introduces an optimized indirect X-ray microscope capable of achieving micrometre pixel size and megahertz acquisition speed, leveraging enhanced sensitivity in the near-ultraviolet spectrum and single-crystal fast-decay scintillators. This development enables high-resolution imaging for dynamic phenomena, exemplified by experiments with pulsed wire explosion and superheated near-nozzle gasoline injection.
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Arrival timing diagnostics between a soft X-ray free-electron laser and synchronized optical laser pulses were performed at SACLA BL1.
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The direction of energy flow for Bloch waves during X-ray dynamical diffraction in perfect crystals is investigated.
![s logo](https://journals.iucr.org/logos/jicons/s_36x36.png)
Arrival timing diagnostics between soft X-ray free-electron laser and synchronized optical laser pulses were performed at SACLA BL1.