Several procedures for Fourier analysis of single diffraction peaks for microstrains and mosaic sizes are compared. A simple new method works well, especially when the size distribution is broad, and/or when the strains vary in an unusual manner.

A technique for on-line data collection and Fourier analysis of diffraction profiles is described to obtain information on particle size and microstrain from multiple orders of a reflection or from a single peak. Equations are given for errors in these quantities due to counting statistics. Their use in determining these parameters to operator-specified limits reduces the usual time required for data collection.