search results
results of search on CRYSTALLOGRAPHY JOURNALS ONLINE
1 citation found for Pantelic, R.
Search for Pantelic, R. in the World Directory of Crystallographers
![d logo](https://journals.iucr.org/logos/jicons/d_36x36.png)
Installation of the EIGER X 1M detector onto an electron microscope and system calibration for data collection turns a transmission electron microscope into an electron diffraction instrument. Data can be collected and processed with a throughput that meets the requirements of a modern X-ray facility. The setup described here offers access to single-crystal structure determination from microcrystalline powder when large single crystals cannot be produced.